Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
Download results in JSON format
| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-220317 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_8A_n20A |
CR revised to R5-221774 |
Nokia, Nokia Shanghai Bell | 38.905 17.3.0 CR#533 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
revised | [WTS] [JSN] |
| R5-220318 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_20A_n7A |
CR revised to R5-221775 |
Nokia, Nokia Shanghai Bell | 38.905 17.3.0 CR#534 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
revised | [WTS] [JSN] |
| R5-220319 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_28A_n5A |
CR revised to R5-221776 |
Nokia, Nokia Shanghai Bell | 38.905 17.3.0 CR#535 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
revised | [WTS] [JSN] |
| R5-220320 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_40A_n79A |
CR revised to R5-221777 |
Nokia, Nokia Shanghai Bell | 38.905 17.3.0 CR#536 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
revised | [WTS] [JSN] |
| R5-220321 | Adding Reference sensitivity Test point analysis for Rel-16 inter-band EN-DC FR1 two band combinations | CR | Nokia, Nokia Shanghai Bell | 38.905 17.3.0 CR#537 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
agreed | [WTS] [JSN] |
| R5-220357 | Introduction of reference sensitivity test point analysis for CA_n5A-n7 | CR | Ericsson | 38.905 17.3.0 CR#538 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
withdrawn | [WTS] [JSN] |
| R5-220358 | Introduction of reference sensitivity test point analysis for CA_n5A-n78A |
CR revised to R5-221621 |
Ericsson | 38.905 17.3.0 CR#539 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
revised | [WTS] [JSN] |
| R5-220359 | Introduction of reference sensitivity test point analysis for CA_n7A-n78A | CR | Ericsson | 38.905 17.3.0 CR#540 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
withdrawn | [WTS] [JSN] |
| R5-220377 | Introduction of reference sensitivity test point analysis for DC_1A-n7A | CR | Ericsson | 38.905 17.3.0 CR#545 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
agreed | [WTS] [JSN] |
| R5-220378 | Introduction of reference sensitivity test point analysis for DC_28A_n7A | CR | Ericsson | 38.905 17.3.0 CR#546 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
agreed | [WTS] [JSN] |
| R5-220379 | Introduction of reference sensitivity test point analysis for DC_1A_n5A | CR | Ericsson | 38.905 17.3.0 CR#547 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
agreed | [WTS] [JSN] |
| R5-220381 | Introduction of reference sensitivity test point analysis for DC_3A_n5A | CR | Ericsson | 38.905 17.3.0 CR#548 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
agreed | [WTS] [JSN] |
| R5-220383 | Introduction of reference sensitivity test point analysis for DC_7A-n5A | CR | Ericsson | 38.905 17.3.0 CR#549 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
agreed | [WTS] [JSN] |
| R5-220385 | Introduction of reference sensitivity test point analysis for DC_7A_n28A | CR | Ericsson | 38.905 17.3.0 CR#550 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
agreed | [WTS] [JSN] |
| R5-220386 | Introduction of reference sensitivity test point analysis for DC_7A_n78A |
CR revised to R5-221778 |
Ericsson | 38.905 17.3.0 CR#551 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
revised | [WTS] [JSN] |
| R5-220388 | Introduction of reference sensitivity test point analysis for DC_7A_n5A-n78A | CR | Ericsson | 38.905 17.3.0 CR#552 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
agreed | [WTS] [JSN] |
| R5-220389 | Introduction of reference sensitivity test point analysis for DC_28A_n7A-n78A | CR | Ericsson | 38.905 17.3.0 CR#553 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
agreed | [WTS] [JSN] |
| R5-221115 | Updating TP analysis for FR1 AMPR for CA_n41A-n79A testing | CR | Huawei, Hisilicon | 38.905 17.3.0 CR#562 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
agreed | [WTS] [JSN] |
| R5-221179 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_1A_n5A |
CR revised to R5-221779 |
Ericsson | 38.905 17.3.0 CR#567 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
revised | [WTS] [JSN] |
| R5-221180 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_1A_n7A |
CR revised to R5-221780 |
Ericsson | 38.905 17.3.0 CR#568 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
revised | [WTS] [JSN] |
| R5-221181 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_3A_n5A |
CR revised to R5-221781 |
Ericsson | 38.905 17.3.0 CR#569 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
revised | [WTS] [JSN] |
| R5-221182 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_7A_n5A |
CR revised to R5-221782 |
Ericsson | 38.905 17.3.0 CR#570 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
revised | [WTS] [JSN] |
| R5-221183 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_28A_n7A |
CR revised to R5-221783 |
Ericsson, Qualcomm | 38.905 17.3.0 CR#571 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
revised | [WTS] [JSN] |
| R5-221327 | TP analysis for ref sensitivity for DC_2A_n66A | CR | Qualcomm Korea | 38.905 17.3.0 CR#577 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
agreed | [WTS] [JSN] |
| R5-221602 | Correction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_8A_n3A | CR | Nokia, Nokia Shanghai Bell | 38.905 17.3.0 CR#580 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
agreed | [WTS] [JSN] |
| R5-221603 | Correction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_20A_n3A | CR | Nokia, Nokia Shanghai Bell | 38.905 17.3.0 CR#581 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
agreed | [WTS] [JSN] |
| R5-221621 | Introduction of reference sensitivity test point analysis for CA_n5A-n78A |
CR revision of R5-220358 |
Ericsson | 38.905 17.3.0 CR#5391 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
withdrawn | [WTS] [JSN] |
| R5-221631 | Update of spurious emission TP analysis for DC_3A_n41A | CR | Anritsu | 38.905 17.3.0 CR#583 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
agreed | [WTS] [JSN] |
| R5-221632 | Update of spurious emission TP analysis for DC_8A_n41A | CR | Anritsu | 38.905 17.3.0 CR#584 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
agreed | [WTS] [JSN] |
| R5-221633 | Update of spurious emission TP analysis for DC_25A_n41A | CR | Anritsu | 38.905 17.3.0 CR#585 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
agreed | [WTS] [JSN] |
| R5-221635 | Update of spurious emission TP analysis for DC_39A_n41A | CR | Anritsu | 38.905 17.3.0 CR#586 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
agreed | [WTS] [JSN] |
| R5-221636 | Update of spurious emission TP analysis for DC_40A_n41A | CR | Anritsu | 38.905 17.3.0 CR#587 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
agreed | [WTS] [JSN] |
| R5-221774 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_8A_n20A |
CR revision of R5-220317 |
Nokia, Nokia Shanghai Bell | 38.905 17.3.0 CR#5331 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
agreed | [WTS] [JSN] |
| R5-221775 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_20A_n7A |
CR revision of R5-220318 |
Nokia, Nokia Shanghai Bell | 38.905 17.3.0 CR#5341 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
agreed | [WTS] [JSN] |
| R5-221776 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_28A_n5A |
CR revision of R5-220319 |
Nokia, Nokia Shanghai Bell | 38.905 17.3.0 CR#5351 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
agreed | [WTS] [JSN] |
| R5-221777 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_40A_n79A |
CR revision of R5-220320 |
Nokia, Nokia Shanghai Bell | 38.905 17.3.0 CR#5361 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
agreed | [WTS] [JSN] |
| R5-221778 | Introduction of reference sensitivity test point analysis for DC_7A_n78A |
CR revision of R5-220386 |
Ericsson | 38.905 17.3.0 CR#5511 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
agreed | [WTS] [JSN] |
| R5-221779 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_1A_n5A |
CR revision of R5-221179 |
Ericsson | 38.905 17.3.0 CR#5671 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
agreed | [WTS] [JSN] |
| R5-221780 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_1A_n7A |
CR revision of R5-221180 |
Ericsson | 38.905 17.3.0 CR#5681 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
agreed | [WTS] [JSN] |
| R5-221781 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_3A_n5A |
CR revision of R5-221181 |
Ericsson | 38.905 17.3.0 CR#5691 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
agreed | [WTS] [JSN] |
| R5-221782 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_7A_n5A |
CR revision of R5-221182 |
Ericsson | 38.905 17.3.0 CR#5701 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
agreed | [WTS] [JSN] |
| R5-221783 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_28A_n7A |
CR revision of R5-221183 |
Ericsson, Qualcomm | 38.905 17.3.0 CR#5711 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-94-e AI: 5.3.4. |
agreed | [WTS] [JSN] |
42 documents (0.33580708503723 seconds)