Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".

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tdoc Title Type / Revs Source Spec / CR S/WID Release Meeting Status Links
R5-224157 Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_3A_n8A CR

revised to R5-225711

Nokia, Nokia Shanghai Bell 38.905 17.5.0 CR#630 catF NR_CADC_NR_LTE_DC_R16-UEConTest Rel-17 R5-96-e

AI: 5.3.3.

revised [WTS] [JSN]
R5-224158 Introduction of reference sensitivity test point analysis for DC_3A-7A-20A_n8A CR Nokia, Nokia Shanghai Bell 38.905 17.5.0 CR#631 catF NR_CADC_NR_LTE_DC_R16-UEConTest Rel-17 R5-96-e

AI: 5.3.3.

agreed [WTS] [JSN]
R5-224360 Update TP analysis for Rel-16 CA_n2A_n77A CR

revised to R5-225712

Verizon Switzerland AG, Ericsson, Qualcomm, Apple 38.905 17.5.0 CR#635 catF NR_CADC_NR_LTE_DC_R16-UEConTest Rel-17 R5-96-e

AI: 5.3.3.

revised [WTS] [JSN]
R5-224361 Update TP analysis for Rel-16 CA_n5A_n77A CR

revised to R5-225713

Verizon Switzerland AG, Ericsson, Qualcomm, Apple 38.905 17.5.0 CR#636 catF NR_CADC_NR_LTE_DC_R16-UEConTest Rel-17 R5-96-e

AI: 5.3.3.

revised [WTS] [JSN]
R5-224362 Update TP analysis for Rel-16 CA_n66A_n77A CR

revised to R5-225714

Verizon Switzerland AG, Ericsson, Qualcomm, Apple 38.905 17.5.0 CR#637 catF NR_CADC_NR_LTE_DC_R16-UEConTest Rel-17 R5-96-e

AI: 5.3.3.

revised [WTS] [JSN]
R5-224364 TP analysis for ref sensitivity for Rel-16 NR CA combos CR

revised to R5-225715

Verizon Switzerland AG, Ericsson, Qualcomm, Apple 38.905 17.5.0 CR#638 catF NR_CADC_NR_LTE_DC_R16-UEConTest Rel-17 R5-96-e

AI: 5.3.3.

revised [WTS] [JSN]
R5-224887 Update Spurious emission TP R16 DC_5A_n2A CR

revised to R5-225716

Qualcomm Austria RFFE GmbH 38.905 17.5.0 CR#650 catF NR_CADC_NR_LTE_DC_R16-UEConTest Rel-17 R5-96-e

AI: 5.3.3.

revised [WTS] [JSN]
R5-224940 Introduction of reference sensitivity test point analysis for DC_2A-66A_n41A CR ZTE Corporation 38.905 17.5.0 CR#659 catF NR_CADC_NR_LTE_DC_R16-UEConTest Rel-17 R5-96-e

AI: 5.3.3.

agreed [WTS] [JSN]
R5-224944 Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_2A_n41A CR ZTE Corporation 38.905 17.5.0 CR#660 catF NR_CADC_NR_LTE_DC_R16-UEConTest Rel-17 R5-96-e

AI: 5.3.3.

agreed [WTS] [JSN]
R5-224945 Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_7A_n3A CR ZTE Corporation 38.905 17.5.0 CR#661 catF NR_CADC_NR_LTE_DC_R16-UEConTest Rel-17 R5-96-e

AI: 5.3.3.

agreed [WTS] [JSN]
R5-224947 Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_8A_n41A CR ZTE Corporation 38.905 17.5.0 CR#662 catF NR_CADC_NR_LTE_DC_R16-UEConTest Rel-17 R5-96-e

AI: 5.3.3.

agreed [WTS] [JSN]
R5-224948 Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_13A_n2A CR ZTE Corporation 38.905 17.5.0 CR#663 catF NR_CADC_NR_LTE_DC_R16-UEConTest Rel-17 R5-96-e

AI: 5.3.3.

agreed [WTS] [JSN]
R5-224949 Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_20A_n1A CR ZTE Corporation 38.905 17.5.0 CR#664 catF NR_CADC_NR_LTE_DC_R16-UEConTest Rel-17 R5-96-e

AI: 5.3.3.

agreed [WTS] [JSN]
R5-224951 Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_48A_n5A CR ZTE Corporation 38.905 17.5.0 CR#665 catF NR_CADC_NR_LTE_DC_R16-UEConTest Rel-17 R5-96-e

AI: 5.3.3.

agreed [WTS] [JSN]
R5-224953 Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_48A_n66A CR ZTE Corporation 38.905 17.5.0 CR#666 catF NR_CADC_NR_LTE_DC_R16-UEConTest Rel-17 R5-96-e

AI: 5.3.3.

agreed [WTS] [JSN]
R5-224955 Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_66A_n41A CR ZTE Corporation 38.905 17.5.0 CR#667 catF NR_CADC_NR_LTE_DC_R16-UEConTest Rel-17 R5-96-e

AI: 5.3.3.

agreed [WTS] [JSN]
R5-224959 Editorial corrections to spurious emission test cases for DC_8A_n3A, DC_8A_n20A and DC_20A_n3A CR ZTE Corporation 38.905 17.5.0 CR#668 catF NR_CADC_NR_LTE_DC_R16-UEConTest Rel-17 R5-96-e

AI: 5.3.3.

agreed [WTS] [JSN]
R5-225108 Editorial correction for DC_1A_n5A CR ROHDE & SCHWARZ 38.905 17.5.0 CR#673 catF NR_CADC_NR_LTE_DC_R16-UEConTest Rel-17 R5-96-e

AI: 5.3.3.

agreed [WTS] [JSN]
R5-225711 Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_3A_n8A CR

revision of R5-224157

Nokia, Nokia Shanghai Bell 38.905 17.5.0 CR#6301 catF NR_CADC_NR_LTE_DC_R16-UEConTest Rel-17 R5-96-e

AI: 5.3.3.

agreed [WTS] [JSN]
R5-225712 Update TP analysis for Rel-16 CA_n2A_n77A CR

revision of R5-224360

Verizon Switzerland AG, Ericsson, Qualcomm, Apple 38.905 17.5.0 CR#6351 catF NR_CADC_NR_LTE_DC_R16-UEConTest Rel-17 R5-96-e

AI: 5.3.3.

agreed [WTS] [JSN]
R5-225713 Update TP analysis for Rel-16 CA_n5A_n77A CR

revision of R5-224361

Verizon Switzerland AG, Ericsson, Qualcomm, Apple 38.905 17.5.0 CR#6361 catF NR_CADC_NR_LTE_DC_R16-UEConTest Rel-17 R5-96-e

AI: 5.3.3.

agreed [WTS] [JSN]
R5-225714 Update TP analysis for Rel-16 CA_n66A_n77A CR

revision of R5-224362

Verizon Switzerland AG, Ericsson, Qualcomm, Apple 38.905 17.5.0 CR#6371 catF NR_CADC_NR_LTE_DC_R16-UEConTest Rel-17 R5-96-e

AI: 5.3.3.

agreed [WTS] [JSN]
R5-225715 TP analysis for ref sensitivity for Rel-16 NR CA combos CR

revision of R5-224364

Verizon Switzerland AG, Ericsson, Qualcomm, Apple 38.905 17.5.0 CR#6381 catF NR_CADC_NR_LTE_DC_R16-UEConTest Rel-17 R5-96-e

AI: 5.3.3.

agreed [WTS] [JSN]
R5-225716 Update Spurious emission TP R16 DC_5A_n2A CR

revision of R5-224887

Qualcomm Austria RFFE GmbH 38.905 17.5.0 CR#6501 catF NR_CADC_NR_LTE_DC_R16-UEConTest Rel-17 R5-96-e

AI: 5.3.3.

agreed [WTS] [JSN]

24 documents (0.34265208244324 seconds)