Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-222291 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_1A_n8A |
CR revised to R5-223682 |
Nokia, Nokia Shanghai Bell | 38.905 17.4.0 CR#591 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-95-e AI: 5.3.3. |
revised | [WTS] [JSN] |
| R5-222292 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_7A_n8A |
CR revised to R5-223683 |
Nokia, Nokia Shanghai Bell | 38.905 17.4.0 CR#592 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-95-e AI: 5.3.3. |
revised | [WTS] [JSN] |
| R5-222293 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_8A_n28A |
CR revised to R5-223684 |
Nokia, Nokia Shanghai Bell | 38.905 17.4.0 CR#593 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-95-e AI: 5.3.3. |
revised | [WTS] [JSN] |
| R5-222294 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_20A_n8A |
CR revised to R5-223685 |
Nokia, Nokia Shanghai Bell | 38.905 17.4.0 CR#594 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-95-e AI: 5.3.3. |
revised | [WTS] [JSN] |
| R5-222295 | Introduction of reference sensitivity test point analysis for DC_1A-20A_n8A |
CR revised to R5-223686 |
Nokia, Nokia Shanghai Bell | 38.905 17.4.0 CR#595 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-95-e AI: 5.3.3. |
revised | [WTS] [JSN] |
| R5-222296 | Introduction of reference sensitivity test point analysis for DC_1A-28A_n5A |
CR revised to R5-223687 |
Nokia, Nokia Shanghai Bell | 38.905 17.4.0 CR#596 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-95-e AI: 5.3.3. |
revised | [WTS] [JSN] |
| R5-222297 | Introduction of reference sensitivity test point analysis for DC_3A-7A_n5A |
CR revised to R5-223688 |
Nokia, Nokia Shanghai Bell | 38.905 17.4.0 CR#597 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-95-e AI: 5.3.3. |
revised | [WTS] [JSN] |
| R5-222298 | Introduction of reference sensitivity test point analysis for DC_3A-8A_n28A |
CR revised to R5-223689 |
Nokia, Nokia Shanghai Bell | 38.905 17.4.0 CR#598 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-95-e AI: 5.3.3. |
revised | [WTS] [JSN] |
| R5-222299 | Introduction of reference sensitivity test point analysis for DC_7A-8A_n3A |
CR revised to R5-223690 |
Nokia, Nokia Shanghai Bell | 38.905 17.4.0 CR#599 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-95-e AI: 5.3.3. |
revised | [WTS] [JSN] |
| R5-222300 | Introduction of reference sensitivity test point analysis for DC_7A-20A_n8A |
CR revised to R5-223691 |
Nokia, Nokia Shanghai Bell | 38.905 17.4.0 CR#600 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-95-e AI: 5.3.3. |
revised | [WTS] [JSN] |
| R5-222301 | Introduction of reference sensitivity test point analysis for DC_7A-28A_n5A |
CR revised to R5-223692 |
Nokia, Nokia Shanghai Bell | 38.905 17.4.0 CR#601 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-95-e AI: 5.3.3. |
revised | [WTS] [JSN] |
| R5-222476 | Addtion of refsence sensitivity test point analysis for FR1 EN-DC | CR | KDDI Corporation | 38.905 17.4.0 CR#605 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-95-e AI: 5.3.3. |
withdrawn | [WTS] [JSN] |
| R5-222734 | Update TpAnalysisSpur_DC_14A_n2A | CR | Qualcomm Israel Ltd. | 38.905 17.4.0 CR#615 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-95-e AI: 5.3.3. |
agreed | [WTS] [JSN] |
| R5-222735 | Update TpAnalysisSpur_DC_14A_n66A | CR | Qualcomm Israel Ltd. | 38.905 17.4.0 CR#616 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-95-e AI: 5.3.3. |
agreed | [WTS] [JSN] |
| R5-223050 | Update of test points analysis per CA configuration Table | CR | China Unicom | 38.905 17.4.0 CR#626 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-95-e AI: 5.3.3. |
agreed | [WTS] [JSN] |
| R5-223682 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_1A_n8A |
CR revision of R5-222291 |
Nokia, Nokia Shanghai Bell | 38.905 17.4.0 CR#5911 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-95-e AI: 5.3.3. |
agreed | [WTS] [JSN] |
| R5-223683 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_7A_n8A |
CR revision of R5-222292 |
Nokia, Nokia Shanghai Bell | 38.905 17.4.0 CR#5921 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-95-e AI: 5.3.3. |
agreed | [WTS] [JSN] |
| R5-223684 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_8A_n28A |
CR revision of R5-222293 |
Nokia, Nokia Shanghai Bell | 38.905 17.4.0 CR#5931 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-95-e AI: 5.3.3. |
agreed | [WTS] [JSN] |
| R5-223685 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_20A_n8A |
CR revision of R5-222294 |
Nokia, Nokia Shanghai Bell | 38.905 17.4.0 CR#5941 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-95-e AI: 5.3.3. |
agreed | [WTS] [JSN] |
| R5-223686 | Introduction of reference sensitivity test point analysis for DC_1A-20A_n8A |
CR revision of R5-222295 |
Nokia, Nokia Shanghai Bell | 38.905 17.4.0 CR#5951 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-95-e AI: 5.3.3. |
agreed | [WTS] [JSN] |
| R5-223687 | Introduction of reference sensitivity test point analysis for DC_1A-28A_n5A |
CR revision of R5-222296 |
Nokia, Nokia Shanghai Bell | 38.905 17.4.0 CR#5961 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-95-e AI: 5.3.3. |
agreed | [WTS] [JSN] |
| R5-223688 | Introduction of reference sensitivity test point analysis for DC_3A-7A_n5A |
CR revision of R5-222297 |
Nokia, Nokia Shanghai Bell | 38.905 17.4.0 CR#5971 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-95-e AI: 5.3.3. |
agreed | [WTS] [JSN] |
| R5-223689 | Introduction of reference sensitivity test point analysis for DC_3A-8A_n28A |
CR revision of R5-222298 |
Nokia, Nokia Shanghai Bell | 38.905 17.4.0 CR#5981 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-95-e AI: 5.3.3. |
agreed | [WTS] [JSN] |
| R5-223690 | Introduction of reference sensitivity test point analysis for DC_7A-8A_n3A |
CR revision of R5-222299 |
Nokia, Nokia Shanghai Bell | 38.905 17.4.0 CR#5991 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-95-e AI: 5.3.3. |
agreed | [WTS] [JSN] |
| R5-223691 | Introduction of reference sensitivity test point analysis for DC_7A-20A_n8A |
CR revision of R5-222300 |
Nokia, Nokia Shanghai Bell | 38.905 17.4.0 CR#6001 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-95-e AI: 5.3.3. |
agreed | [WTS] [JSN] |
| R5-223692 | Introduction of reference sensitivity test point analysis for DC_7A-28A_n5A |
CR revision of R5-222301 |
Nokia, Nokia Shanghai Bell | 38.905 17.4.0 CR#6011 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-95-e AI: 5.3.3. |
agreed | [WTS] [JSN] |
26 documents (0.34650993347168 seconds)