Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-260181 | Addition of test frequencies for CA_n100A-n101A and DC_n100A-n101A |
CR revised to R5-261404 |
Nokia | 38.508-1 19.2.0 CR#3688 catF | NR_CADC_NR_LTE_DC_R19-UEConTest | Rel-19 |
R5-110 AI: 5.3.24.1.1 |
revised | [WTS] [JSN] |
| R5-260606 | Simplifications on test frequency table for more than 3 bands inter-band CA configurations |
CR revised to R5-261405 |
ZTE Corporation | 38.508-1 19.2.0 CR#3722 catF | NR_CADC_NR_LTE_DC_R19-UEConTest | Rel-19 |
R5-110 AI: 5.3.24.1.1 |
revised | [WTS] [JSN] |
| R5-260607 | Simplifications on test frequency table for more than 4 bands inter-band EN-DC configurations within FR1 |
CR revised to R5-261406 |
ZTE Corporation | 38.508-1 19.2.0 CR#3723 catF | NR_CADC_NR_LTE_DC_R19-UEConTest | Rel-19 |
R5-110 AI: 5.3.24.1.1 |
revised | [WTS] [JSN] |
| R5-260608 | Simplifications on test frequency table for more than 3 bands inter-band EN-DC configurations including FR2 |
CR revised to R5-261407 |
ZTE Corporation | 38.508-1 19.2.0 CR#3724 catF | NR_CADC_NR_LTE_DC_R19-UEConTest | Rel-19 |
R5-110 AI: 5.3.24.1.1 |
revised | [WTS] [JSN] |
| R5-261008 | Adding test frequency for R19 configuration |
CR revised to R5-261408 |
Huawei, HiSilicon | 38.508-1 19.2.0 CR#3752 catF | NR_CADC_NR_LTE_DC_R19-UEConTest | Rel-19 |
R5-110 AI: 5.3.24.1.1 |
revised | [WTS] [JSN] |
| R5-261257 | Addition of test frequencies for CA_n100A-n101A and DC_n100A-n101A |
CR revision of R5-261404 |
Nokia | 38.508-1 19.2.0 CR#36882 catF | NR_CADC_NR_LTE_DC_R19-UEConTest | Rel-19 |
R5-110 AI: 5.3.24.1.1 |
agreed | [WTS] [JSN] |
| R5-261404 | Addition of test frequencies for CA_n100A-n101A and DC_n100A-n101A |
CR revision of R5-260181 revised to R5-261257 |
Nokia | 38.508-1 19.2.0 CR#36881 catF | NR_CADC_NR_LTE_DC_R19-UEConTest | Rel-19 |
R5-110 AI: 5.3.24.1.1 |
revised | [WTS] [JSN] |
| R5-261405 | Simplifications on test frequency table for more than 3 bands inter-band CA configurations |
CR revision of R5-260606 |
ZTE Corporation | 38.508-1 19.2.0 CR#37221 catF | NR_CADC_NR_LTE_DC_R19-UEConTest | Rel-19 |
R5-110 AI: 5.3.24.1.1 |
agreed | [WTS] [JSN] |
| R5-261406 | Simplifications on test frequency table for more than 4 bands inter-band EN-DC configurations within FR1 |
CR revision of R5-260607 |
ZTE Corporation | 38.508-1 19.2.0 CR#37231 catF | NR_CADC_NR_LTE_DC_R19-UEConTest | Rel-19 |
R5-110 AI: 5.3.24.1.1 |
agreed | [WTS] [JSN] |
| R5-261407 | Simplifications on test frequency table for more than 3 bands inter-band EN-DC configurations including FR2 |
CR revision of R5-260608 |
ZTE Corporation | 38.508-1 19.2.0 CR#37241 catF | NR_CADC_NR_LTE_DC_R19-UEConTest | Rel-19 |
R5-110 AI: 5.3.24.1.1 |
agreed | [WTS] [JSN] |
| R5-261408 | Adding test frequency for R19 configuration |
CR revision of R5-261008 |
Huawei, HiSilicon | 38.508-1 19.2.0 CR#37521 catF | NR_CADC_NR_LTE_DC_R19-UEConTest | Rel-19 |
R5-110 AI: 5.3.24.1.1 |
agreed | [WTS] [JSN] |
11 documents (0.41789603233337 seconds)