Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-200284 | Test tolerance update measurement tests Annex F | CR | ROHDE & SCHWARZ | 38.533 16.2.0 CR#495 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.9.6 |
agreed | [WTS] [JSN] |
| R5-200305 | Test Tolerance and Measurement Uncertainty in Annex F for L1-RSRP measurement test cases |
CR revised to R5-201044 |
Ericsson | 38.533 16.2.0 CR#496 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.9.6 |
revised | [WTS] [JSN] |
| R5-200306 | Reference SSB configuration correction | CR | Ericsson | 38.533 16.2.0 CR#497 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.9.6 |
agreed | [WTS] [JSN] |
| R5-200307 | Correction of Cell configuration mapping table for SA FR2 RRM | CR | Ericsson | 38.533 16.2.0 CR#498 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.9.6 |
agreed | [WTS] [JSN] |
| R5-200427 | Correction to the simulated cell for cell-reselection test cases | CR | Anritsu | 38.533 16.2.0 CR#514 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.9.6 |
agreed | [WTS] [JSN] |
| R5-200429 | Update of maximum test system uncertainty for FR1 RRM Test |
CR revised to R5-201058 |
Anritsu | 38.533 16.2.0 CR#516 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.9.6 |
revised | [WTS] [JSN] |
| R5-200476 | Update of FR1 Test Tolerance in Annex F |
CR revised to R5-201169 |
Huawei, HiSilicon | 38.533 16.2.0 CR#521 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.9.6 |
revised | [WTS] [JSN] |
| R5-200562 | Addition of RRM Cell configuration mapping table for EN-DC FR1 Test Case 4.5.4.1 | CR | Samsung R&D Institute UK | 38.533 16.2.0 CR#523 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.9.6 |
not treated | [WTS] [JSN] |
| R5-200564 | Correction to Statistical testing of delay and UE measurement performance in RRM tests | CR | Samsung R&D Institute UK | 38.533 16.2.0 CR#524 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.9.6 |
agreed | [WTS] [JSN] |
| R5-200565 | Addition of RRC message content exceptions for UE UL Carrier Reconfiguration Delay | CR | Samsung R&D Institute UK | 38.533 16.2.0 CR#525 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.9.6 |
not treated | [WTS] [JSN] |
| R5-200606 | Cell mapping update measurement tests Annex E | CR | ROHDE & SCHWARZ | 38.533 16.2.0 CR#526 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.9.6 |
agreed | [WTS] [JSN] |
| R5-200610 | Correct message contents measurement tests | CR | ROHDE & SCHWARZ | 38.533 16.2.0 CR#530 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.9.6 |
agreed | [WTS] [JSN] |
| R5-200743 | Update to test applicability per permitted test method |
CR revised to R5-200916 |
Anritsu | 38.533 16.2.0 CR#538 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.9.6 |
revised | [WTS] [JSN] |
| R5-200818 | Correction to cell mapping Annex E | CR | Huawei, HiSilicon | 38.533 16.2.0 CR#543 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.9.6 |
agreed | [WTS] [JSN] |
| R5-200858 | Corrections to Table H.3.1-8 | CR | MediaTek Inc. | 38.533 16.2.0 CR#569 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.9.6 |
agreed | [WTS] [JSN] |
| R5-200916 | Update to test applicability per permitted test method |
CR revision of R5-200743 |
Anritsu | 38.533 16.2.0 CR#5381 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.9.6 |
agreed | [WTS] [JSN] |
| R5-201044 | Test Tolerance and Measurement Uncertainty in Annex F for L1-RSRP measurement test cases |
CR revision of R5-200305 |
Ericsson | 38.533 16.2.0 CR#4961 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.9.6 |
agreed | [WTS] [JSN] |
| R5-201058 | Update of maximum test system uncertainty for FR1 RRM Test |
CR revision of R5-200429 |
Anritsu | 38.533 16.2.0 CR#5161 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.9.6 |
agreed | [WTS] [JSN] |
| R5-201169 | Update of FR1 Test Tolerance in Annex F |
CR revision of R5-200476 |
Huawei, HiSilicon | 38.533 16.2.0 CR#5211 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.9.6 |
agreed | [WTS] [JSN] |
19 documents (0.34971785545349 seconds)