Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-203245 | Update TC 6.7.4.1.1 with TT results and message contents |
CR revised to R5-204880 |
ROHDE & SCHWARZ | 38.533 16.4.0 CR#754 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
revised | [WTS] [JSN] |
| R5-203246 | Update TC 6.7.4.1.2 with TT results and message contents |
CR revised to R5-204778 |
ROHDE & SCHWARZ | 38.533 16.4.0 CR#755 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
revised | [WTS] [JSN] |
| R5-203247 | Update TC 6.7.4.2.1 with TT results and message contents |
CR revised to R5-204881 |
ROHDE & SCHWARZ | 38.533 16.4.0 CR#756 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
revised | [WTS] [JSN] |
| R5-203248 | Update TC 6.7.4.2.2 with TT results and message contents |
CR revised to R5-204779 |
ROHDE & SCHWARZ | 38.533 16.4.0 CR#757 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
revised | [WTS] [JSN] |
| R5-203264 | Correction to the test procedure of NR SA event triggered tests |
CR revised to R5-204780 |
ROHDE & SCHWARZ | 38.533 16.4.0 CR#762 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
revised | [WTS] [JSN] |
| R5-203265 | Correction to the test procedure of NR SA event triggered tests inter-freq |
CR revised to R5-204781 |
ROHDE & SCHWARZ | 38.533 16.4.0 CR#763 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
revised | [WTS] [JSN] |
| R5-203266 | Correction to the test procedure of NR SA event triggered tests inter-RAT |
CR revised to R5-204782 |
ROHDE & SCHWARZ | 38.533 16.4.0 CR#764 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
revised | [WTS] [JSN] |
| R5-203267 | [EDITORIAL] Fix formatting issues throwing DOCX conversion errors in TS 38.533 | CR | ROHDE & SCHWARZ | 38.533 16.4.0 CR#765 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-203269 | Correction of test applicability for NR SA event-triggered tests | CR | ROHDE & SCHWARZ | 38.533 16.4.0 CR#767 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-203272 | Remove IE includeBeamMeasurements from 6.6.1.5 and 6.6.1.6 | CR | ROHDE & SCHWARZ | 38.533 16.4.0 CR#770 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-203299 | Corrected test description in non-DRX test case 6.5.1.2 | CR | Keysight Technologies UK Ltd | 38.533 16.4.0 CR#773 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-203300 | Correction of comment for monitoringSymbolsWithinSlot | CR | Keysight Technologies UK Ltd | 38.533 16.4.0 CR#774 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-203302 | Gap Pattern Id correction in section 6.6.2 to align to core spec 38.133 |
CR revised to R5-204882 |
Keysight Technologies UK Ltd, Qualcomm Incorporated | 38.533 16.4.0 CR#776 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
revised | [WTS] [JSN] |
| R5-203303 | PUSCH allocation correction in test case 6.4.3.1 | CR | Keysight Technologies UK Ltd | 38.533 16.4.0 CR#777 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-203307 | Update extreme conditions limits in TC 6.7.1.2.1 | CR | ROHDE & SCHWARZ | 38.533 16.4.0 CR#780 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-203317 | Removing SearchSpaceId and ControlResourceSetId modification | CR | Keysight Technologies UK Ltd | 38.533 16.4.0 CR#786 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-203318 | Test Procedure correction in test case 6.5.1.3 for definition of Point C |
CR revised to R5-204883 |
Keysight Technologies UK Ltd | 38.533 16.4.0 CR#787 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
revised | [WTS] [JSN] |
| R5-203733 | Set ss-sinr request to false for NR SA RRM measurement accuracy tests | CR | ROHDE & SCHWARZ | 38.533 16.4.0 CR#791 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-203820 | Correction of RRM Test Case 6.1.1.1 |
CR revised to R5-204733 |
MediaTek Inc. | 38.533 16.4.0 CR#793 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
revised | [WTS] [JSN] |
| R5-203837 | Update of FR1 Test Tolerance in 6.3.2.1.3 RRC re-establishment without serving cell timing | CR | Huawei, HiSilicon | 38.533 16.4.0 CR#803 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-203838 | Addition of 6.5.2.0 minimum requirement for interruptions during measurements on NR SCC | CR | Huawei, HiSilicon | 38.533 16.4.0 CR#804 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-203839 | Update of 6.5.2.1 interruptions during measurements on deactivated NR SCC | CR | Huawei, HiSilicon, CAICT | 38.533 16.4.0 CR#805 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-203840 | Addition of new Test Case 6.5.3.1 SCell activation and deactivation for 160ms cycle | CR | Huawei, HiSilicon, CAICT | 38.533 16.4.0 CR#806 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-203841 | Addition of new Test Case 6.5.3.2 SCell activation and deactivation for 320ms cycle | CR | Huawei, HiSilicon, CAICT | 38.533 16.4.0 CR#807 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-203842 | Addition of new Test Case 6.5.3.3 SCell activation and deactivation of unknown SCell | CR | Huawei, HiSilicon, CAICT | 38.533 16.4.0 CR#808 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-203843 | Update of FR1 Test Tolerance in 6.5.5.1 SSB based BFR in non-DRX |
CR revised to R5-204992 |
Huawei, HiSilicon | 38.533 16.4.0 CR#809 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
revised | [WTS] [JSN] |
| R5-203844 | Update of FR1 Test Tolerance in 6.5.5.2 SSB based BFR in DRX |
CR revised to R5-204993 |
Huawei, HiSilicon | 38.533 16.4.0 CR#810 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
revised | [WTS] [JSN] |
| R5-203845 | Update of FR1 Test Tolerance in 6.5.5.3 CSI-RS based BFR in non-DRX |
CR revised to R5-204994 |
Huawei, HiSilicon | 38.533 16.4.0 CR#811 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
revised | [WTS] [JSN] |
| R5-203846 | Update of FR1 Test Tolerance in 6.5.5.4 CSI-RS based BFR in DRX |
CR revised to R5-204995 |
Huawei, HiSilicon | 38.533 16.4.0 CR#812 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
revised | [WTS] [JSN] |
| R5-203847 | Update of 6.5.6.1.0 minimum requirement for DCI-based BWP switch | CR | Huawei, HiSilicon | 38.533 16.4.0 CR#813 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-203848 | Update of FR1 Test Tolerance in 6.5.6.1.1 DCI-based BWP switch with SCell |
CR revised to R5-204996 |
Huawei, HiSilicon | 38.533 16.4.0 CR#814 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
revised | [WTS] [JSN] |
| R5-203849 | Addition of new Test Case 6.5.6.1.2 DCI-based BWP switch with FR1 Test Tolerance |
CR revised to R5-204997 |
Huawei, HiSilicon | 38.533 16.4.0 CR#815 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
revised | [WTS] [JSN] |
| R5-203850 | Update of 6.5.6.2.0 minimum requirement for RRC-based BWP switch | CR | Huawei, HiSilicon | 38.533 16.4.0 CR#816 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-203851 | Update of FR1 Test Tolerance in 6.5.6.2.1 RRC-based BWP switch |
CR revised to R5-204998 |
Huawei, HiSilicon | 38.533 16.4.0 CR#817 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
revised | [WTS] [JSN] |
| R5-203852 | Update of test parameters in 6.3.1.4 inter-RAT handover |
CR revised to R5-204999 |
Huawei, HiSilicon | 38.533 16.4.0 CR#818 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
revised | [WTS] [JSN] |
| R5-203853 | Correction to FR1 intra-frequency measurement with gap test cases | CR | Huawei, HiSilicon | 38.533 16.4.0 CR#819 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-203895 | Correction of RRM Test Case 6.1.1.2 |
CR revised to R5-204734 |
MediaTek Inc. | 38.533 16.4.0 CR#824 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
revised | [WTS] [JSN] |
| R5-204071 | Correction on event-triggered reporting with gap in DRX and DRX configuration settings for NR serving cell | CR | Anritsu | 38.533 16.4.0 CR#832 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-204076 | Correction to NR SA FR1 E-UTRA RRC connection release with redirection | CR | Anritsu | 38.533 16.4.0 CR#837 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-204733 | Correction of RRM Test Case 6.1.1.1 |
CR revision of R5-203820 |
MediaTek Inc. | 38.533 16.4.0 CR#7931 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-204734 | Correction of RRM Test Case 6.1.1.2 |
CR revision of R5-203895 |
MediaTek Inc. | 38.533 16.4.0 CR#8241 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-204778 | Update TC 6.7.4.1.2 with TT results and message contents |
CR revision of R5-203246 |
ROHDE & SCHWARZ | 38.533 16.4.0 CR#7551 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-204779 | Update TC 6.7.4.2.2 with TT results and message contents |
CR revision of R5-203248 |
ROHDE & SCHWARZ | 38.533 16.4.0 CR#7571 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-204780 | Correction to the test procedure of NR SA event triggered tests |
CR revision of R5-203264 |
ROHDE & SCHWARZ | 38.533 16.4.0 CR#7621 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-204781 | Correction to the test procedure of NR SA event triggered tests inter-freq |
CR revision of R5-203265 |
ROHDE & SCHWARZ | 38.533 16.4.0 CR#7631 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-204782 | Correction to the test procedure of NR SA event triggered tests inter-RAT |
CR revision of R5-203266 |
ROHDE & SCHWARZ | 38.533 16.4.0 CR#7641 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-204880 | Update TC 6.7.4.1.1 with TT results and message contents |
CR revision of R5-203245 |
ROHDE & SCHWARZ | 38.533 16.4.0 CR#7541 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-204881 | Update TC 6.7.4.2.1 with TT results and message contents |
CR revision of R5-203247 |
ROHDE & SCHWARZ | 38.533 16.4.0 CR#7561 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-204882 | Gap Pattern Id correction in section 6.6.2 to align to core spec 38.133 |
CR revision of R5-203302 |
Keysight Technologies UK Ltd, Qualcomm Incorporated | 38.533 16.4.0 CR#7761 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-204883 | Test Procedure correction in test case 6.5.1.3 for definition of Point C |
CR revision of R5-203318 |
Keysight Technologies UK Ltd | 38.533 16.4.0 CR#7871 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-204992 | Update of FR1 Test Tolerance in 6.5.5.1 SSB based BFR in non-DRX |
CR revision of R5-203843 |
Huawei, HiSilicon | 38.533 16.4.0 CR#8091 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-204993 | Update of FR1 Test Tolerance in 6.5.5.2 SSB based BFR in DRX |
CR revision of R5-203844 |
Huawei, HiSilicon | 38.533 16.4.0 CR#8101 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-204994 | Update of FR1 Test Tolerance in 6.5.5.3 CSI-RS based BFR in non-DRX |
CR revision of R5-203845 |
Huawei, HiSilicon | 38.533 16.4.0 CR#8111 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-204995 | Update of FR1 Test Tolerance in 6.5.5.4 CSI-RS based BFR in DRX |
CR revision of R5-203846 |
Huawei, HiSilicon | 38.533 16.4.0 CR#8121 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-204996 | Update of FR1 Test Tolerance in 6.5.6.1.1 DCI-based BWP switch with SCell |
CR revision of R5-203848 |
Huawei, HiSilicon | 38.533 16.4.0 CR#8141 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-204997 | Addition of new Test Case 6.5.6.1.2 DCI-based BWP switch with FR1 Test Tolerance |
CR revision of R5-203849 |
Huawei, HiSilicon | 38.533 16.4.0 CR#8151 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-204998 | Update of FR1 Test Tolerance in 6.5.6.2.1 RRC-based BWP switch |
CR revision of R5-203851 |
Huawei, HiSilicon | 38.533 16.4.0 CR#8171 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
| R5-204999 | Update of test parameters in 6.3.1.4 inter-RAT handover |
CR revision of R5-203852 |
Huawei, HiSilicon | 38.533 16.4.0 CR#8181 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.9.3 |
agreed | [WTS] [JSN] |
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