Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-210117 | Editorial addition of editors notes in 6.3B.8.1.4, 6.3B.8.2.4 and 6.3B.8.3.4 |
CR revised to R5-211870 |
CMCC, Qualcomm, Bureau Veritas, Ericsson, R&S, Huawei, CAICT, Apple | 38.521-3 16.6.0 CR#843 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
revised | [WTS] [JSN] |
| R5-210298 | Spectrum emissions mask for intra-band non-contiguous EN-DC Test Definition |
CR revised to R5-211694 |
Keysight Technologies UK Ltd | 38.521-3 16.6.0 CR#844 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
revised | [WTS] [JSN] |
| R5-210301 | Completion of OBW intra-band non-contiguous test 6.5B.1.2 | CR | Keysight Technologies UK Ltd | 38.521-3 16.6.0 CR#847 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-210302 | Addition of new test case 6.5B.1.4D OBW for inter-band EN-DC FR2 UL MIMO | CR | Keysight Technologies UK Ltd | 38.521-3 16.6.0 CR#848 catB | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-210303 | ACLR for intra-band non-contiguous EN-DC Test Definition |
CR revised to R5-211695 |
Keysight Technologies UK Ltd | 38.521-3 16.6.0 CR#849 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
revised | [WTS] [JSN] |
| R5-210386 | Update Test description of 6.5B.1.1 |
CR revised to R5-211696 |
Guangdong OPPO Mobile Telecom. | 38.521-3 16.6.0 CR#856 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
revised | [WTS] [JSN] |
| R5-210387 | Correction to EN-DC OoB emissions | CR | ROHDE & SCHWARZ | 38.521-3 16.6.0 CR#857 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-210415 | Addition of new test case 6.4B.2.4.3_1.1 In-band Emissions for inter-band EN-DC including FR2 with 3 CCs | CR | LG Electronics | 38.521-3 16.6.0 CR#858 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-210416 | Addition of new test case 6.4B.2.4.3_1.2 In-band Emissions for inter-band EN-DC including FR2 with 4 CCs | CR | LG Electronics | 38.521-3 16.6.0 CR#859 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-210417 | Addition of new test case 6.4B.2.4.3_1.3 In-band Emissions for inter-band EN-DC including FR2 with 5 CCs | CR | LG Electronics | 38.521-3 16.6.0 CR#860 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-210497 | Correction of test frequencies for NR band n28 30MHz test channel bandwidth of 6.2B.1.3 | CR | CAICT | 38.521-3 16.6.0 CR#861 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-210498 | Addition of editor note to the incomplete test cases | CR | CAICT | 38.521-3 16.6.0 CR#862 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-210499 | Correction of test applicability of 6.5B.5.3 | CR | CAICT | 38.521-3 16.6.0 CR#863 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-210500 | Correction of test configuration tables in section 6 | CR | CAICT | 38.521-3 16.6.0 CR#864 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-210545 | EN-DC FR2 UL CA Frequency error test cases update |
CR revised to R5-211697 |
Keysight Technologies UK Ltd | 38.521-3 16.6.0 CR#871 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
revised | [WTS] [JSN] |
| R5-210618 | CR for 38.521-3: Update Editors Notes in Power Control tests | CR | Apple Portugal | 38.521-3 16.6.0 CR#873 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
withdrawn | [WTS] [JSN] |
| R5-210725 | Omitting of NSA Rx cases with UL-MIMO on TDD bands | CR | Huawei, HiSilicon | 38.521-3 16.6.0 CR#874 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-210736 | Correcting EN-DC A-MPR test requirements for non-overlapping test points |
CR revised to R5-211871 |
Huawei, HiSilicon | 38.521-3 16.6.0 CR#875 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
revised | [WTS] [JSN] |
| R5-210737 | Correction of test requirements for EN-DC configured output power |
CR revised to R5-211698 |
Huawei, HiSilicon, Anritsu | 38.521-3 16.6.0 CR#876 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
revised | [WTS] [JSN] |
| R5-210909 | Editorial correction to test case 6.2B.4.1.3 | CR | Huawei, Hisilicon | 38.521-3 16.6.0 CR#882 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-210944 | Removing Editor note in 6.2B.4 configured transmitted power for EN-DC within FR1 | CR | Huawei, HiSilicon | 38.521-3 16.6.0 CR#884 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
withdrawn | [WTS] [JSN] |
| R5-210947 | Removing the reconfiguration of TDD-config across EN-DC Tx test cases | CR | Huawei, HiSilicon | 38.521-3 16.6.0 CR#885 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
withdrawn | [WTS] [JSN] |
| R5-210951 | Correction to the TDM pattern configuration for EN-DC Tx test cases |
CR revised to R5-211872 |
Huawei, HiSilicon | 38.521-3 16.6.0 CR#886 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
revised | [WTS] [JSN] |
| R5-210987 | Update for 6.5B.3.3.2 Spurious emission band UE co-existence |
CR revised to R5-211852 |
Qualcomm Korea | 38.521-3 16.6.0 CR#888 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
revised | [WTS] [JSN] |
| R5-211053 | Introduction of Rel-15 EN-DC configuration DC_8A_n77A to spurious emission test case 6.5B.3.3.2 |
CR revised to R5-211699 |
Ericsson | 38.521-3 16.6.0 CR#906 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
revised | [WTS] [JSN] |
| R5-211054 | Introduction of Rel-15 EN-DC configuration DC_11A_n77A to spurious emission test case 6.5B.3.3.2 |
CR revised to R5-211700 |
Ericsson | 38.521-3 16.6.0 CR#907 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
revised | [WTS] [JSN] |
| R5-211055 | Introduction of Rel-15 EN-DC configuration DC_11A_n78A to spurious emission test case 6.5B.3.3.2 |
CR revised to R5-211701 |
Ericsson | 38.521-3 16.6.0 CR#908 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
revised | [WTS] [JSN] |
| R5-211056 | Introduction of Rel-15 EN-DC configuration DC_11A_n79A to spurious emission test case 6.5B.3.3.2 |
CR revised to R5-211702 |
Ericsson | 38.521-3 16.6.0 CR#909 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
revised | [WTS] [JSN] |
| R5-211057 | Introduction of Rel-15 EN-DC configuration DC_25A_n41A to spurious emission test case 6.5B.3.3.2 |
CR revised to R5-211703 |
Ericsson | 38.521-3 16.6.0 CR#910 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
revised | [WTS] [JSN] |
| R5-211058 | Introduction of Rel-15 EN-DC configuration DC_26A_n41A to spurious emission test case 6.5B.3.3.2 |
CR revised to R5-211704 |
Ericsson | 38.521-3 16.6.0 CR#911 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
revised | [WTS] [JSN] |
| R5-211059 | Introduction of Rel-15 EN-DC configuration DC_26A_n77A to spurious emission test case 6.5B.3.3.2 |
CR revised to R5-211705 |
Ericsson | 38.521-3 16.6.0 CR#912 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
revised | [WTS] [JSN] |
| R5-211060 | Introduction of Rel-15 EN-DC configuration DC_26A_n78A to spurious emission test case 6.5B.3.3.2 |
CR revised to R5-211706 |
Ericsson | 38.521-3 16.6.0 CR#913 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
revised | [WTS] [JSN] |
| R5-211061 | Introduction of Rel-15 EN-DC configuration DC_26A_n79A to spurious emission test case 6.5B.3.3.2 |
CR revised to R5-211707 |
Ericsson | 38.521-3 16.6.0 CR#914 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
revised | [WTS] [JSN] |
| R5-211062 | Introduction of Rel-15 EN-DC configuration DC_41A_n77A to spurious emission test case 6.5B.3.3.2 |
CR revised to R5-211708 |
Ericsson | 38.521-3 16.6.0 CR#915 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
revised | [WTS] [JSN] |
| R5-211063 | Introduction of Rel-15 EN-DC configuration DC_41A_n78A to spurious emission test case 6.5B.3.3.2 |
CR revised to R5-211709 |
Ericsson | 38.521-3 16.6.0 CR#916 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
revised | [WTS] [JSN] |
| R5-211099 | Correction to editors note about number of E-UTRA carriers | CR | Anritsu | 38.521-3 16.6.0 CR#917 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-211100 | Correction to MOP and MPR test procedures for PC2 in TC 6.2B.1.3 and 6.2B.2.1 |
CR revised to R5-211873 |
Anritsu | 38.521-3 16.6.0 CR#918 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
revised | [WTS] [JSN] |
| R5-211111 | Corrections to subclauses in 38.521-3 with appropriate subclause level and heading styles | CR | ZTE Corporation | 38.521-3 16.6.0 CR#921 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-211694 | Spectrum emissions mask for intra-band non-contiguous EN-DC Test Definition |
CR revision of R5-210298 |
Keysight Technologies UK Ltd | 38.521-3 16.6.0 CR#8441 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-211695 | ACLR for intra-band non-contiguous EN-DC Test Definition |
CR revision of R5-210303 |
Keysight Technologies UK Ltd | 38.521-3 16.6.0 CR#8491 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-211696 | Update Test description of 6.5B.1.1 |
CR revision of R5-210386 |
Guangdong OPPO Mobile Telecom. | 38.521-3 16.6.0 CR#8561 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-211697 | EN-DC FR2 UL CA Frequency error test cases update |
CR revision of R5-210545 |
Keysight Technologies UK Ltd | 38.521-3 16.6.0 CR#8711 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-211698 | Correction of test requirements for EN-DC configured output power |
CR revision of R5-210737 |
Huawei, HiSilicon, Anritsu | 38.521-3 16.6.0 CR#8761 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-211699 | Introduction of Rel-15 EN-DC configuration DC_8A_n77A to spurious emission test case 6.5B.3.3.2 |
CR revision of R5-211053 |
Ericsson | 38.521-3 16.6.0 CR#9061 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-211700 | Introduction of Rel-15 EN-DC configuration DC_11A_n77A to spurious emission test case 6.5B.3.3.2 |
CR revision of R5-211054 |
Ericsson | 38.521-3 16.6.0 CR#9071 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-211701 | Introduction of Rel-15 EN-DC configuration DC_11A_n78A to spurious emission test case 6.5B.3.3.2 |
CR revision of R5-211055 |
Ericsson | 38.521-3 16.6.0 CR#9081 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-211702 | Introduction of Rel-15 EN-DC configuration DC_11A_n79A to spurious emission test case 6.5B.3.3.2 |
CR revision of R5-211056 |
Ericsson | 38.521-3 16.6.0 CR#9091 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-211703 | Introduction of Rel-15 EN-DC configuration DC_25A_n41A to spurious emission test case 6.5B.3.3.2 |
CR revision of R5-211057 |
Ericsson | 38.521-3 16.6.0 CR#9101 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-211704 | Introduction of Rel-15 EN-DC configuration DC_26A_n41A to spurious emission test case 6.5B.3.3.2 |
CR revision of R5-211058 |
Ericsson | 38.521-3 16.6.0 CR#9111 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-211705 | Introduction of Rel-15 EN-DC configuration DC_26A_n77A to spurious emission test case 6.5B.3.3.2 |
CR revision of R5-211059 |
Ericsson | 38.521-3 16.6.0 CR#9121 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-211706 | Introduction of Rel-15 EN-DC configuration DC_26A_n78A to spurious emission test case 6.5B.3.3.2 |
CR revision of R5-211060 |
Ericsson | 38.521-3 16.6.0 CR#9131 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-211707 | Introduction of Rel-15 EN-DC configuration DC_26A_n79A to spurious emission test case 6.5B.3.3.2 |
CR revision of R5-211061 |
Ericsson | 38.521-3 16.6.0 CR#9141 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-211708 | Introduction of Rel-15 EN-DC configuration DC_41A_n77A to spurious emission test case 6.5B.3.3.2 |
CR revision of R5-211062 |
Ericsson | 38.521-3 16.6.0 CR#9151 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-211709 | Introduction of Rel-15 EN-DC configuration DC_41A_n78A to spurious emission test case 6.5B.3.3.2 |
CR revision of R5-211063 |
Ericsson | 38.521-3 16.6.0 CR#9161 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-211852 | Update for 6.5B.3.3.2 Spurious emission band UE co-existence |
CR revision of R5-210987 |
Qualcomm Korea | 38.521-3 16.6.0 CR#8881 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-211870 | Editorial addition of editors notes in 6.3B.8.1.4, 6.3B.8.2.4 and 6.3B.8.3.4 |
CR revision of R5-210117 |
CMCC, Qualcomm, Bureau Veritas, Ericsson, R&S, Huawei, CAICT, Apple | 38.521-3 16.6.0 CR#8431 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-211871 | Correcting EN-DC A-MPR test requirements for non-overlapping test points |
CR revision of R5-210736 |
Huawei, HiSilicon | 38.521-3 16.6.0 CR#8751 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-211872 | Correction to the TDM pattern configuration for EN-DC Tx test cases |
CR revision of R5-210951 |
Huawei, HiSilicon | 38.521-3 16.6.0 CR#8861 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
| R5-211873 | Correction to MOP and MPR test procedures for PC2 in TC 6.2B.1.3 and 6.2B.2.1 |
CR revision of R5-211100 |
Anritsu | 38.521-3 16.6.0 CR#9181 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.6.1 |
agreed | [WTS] [JSN] |
59 documents (0.35186409950256 seconds)