Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-203293 | FR2 ACLR MBW correction according to RAN4 | CR | Keysight Technologies UK Ltd | 38.521-2 16.4.0 CR#374 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
withdrawn | [WTS] [JSN] |
| R5-203516 | Update of test procedure for Minimum output power for CA in FR2 | CR | TTA | 38.521-2 16.4.0 CR#377 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
withdrawn | [WTS] [JSN] |
| R5-203517 | Update of test procedure for Error vector magnitude for CA in FR2 | CR | TTA | 38.521-2 16.4.0 CR#378 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
withdrawn | [WTS] [JSN] |
| R5-203581 | Beam correspondence - SRS configuration corrections in section 6.6.1 |
CR revised to R5-204857 |
Keysight Technologies UK Ltd | 38.521-2 16.4.0 CR#380 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
revised | [WTS] [JSN] |
| R5-203718 | Correction to test configuration for Carrier leakage for CA |
CR revised to R5-204713 |
LG Electronics | 38.521-2 16.4.0 CR#382 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
revised | [WTS] [JSN] |
| R5-203720 | Correction to TC 6.4A.2.3.1 In-band emissions for 2UL CA |
CR revised to R5-204714 |
LG Electronics | 38.521-2 16.4.0 CR#383 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
revised | [WTS] [JSN] |
| R5-203722 | Correction to test cases 6.4A.2.3.x In-band emissions for 3 to 6 UL CA |
CR revised to R5-204715 |
LG Electronics | 38.521-2 16.4.0 CR#384 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
revised | [WTS] [JSN] |
| R5-203724 | Introduction of New TC 6.4A.2.3.6 In-band emissions for 7UL CA |
CR revised to R5-204716 |
LG Electronics | 38.521-2 16.4.0 CR#385 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
revised | [WTS] [JSN] |
| R5-203727 | Introduction of New TC 6.4A.2.3.7 In-band emissions for 8UL CA |
CR revised to R5-204717 |
LG Electronics | 38.521-2 16.4.0 CR#386 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
revised | [WTS] [JSN] |
| R5-203765 | Core spec alignment for measurement BW in 6.5.2.3, ACLR | CR | Ericsson | 38.521-2 16.4.0 CR#387 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
withdrawn | [WTS] [JSN] |
| R5-203766 | Updates to test case 6.3.4.3, relative power tolerance |
CR revised to R5-204914 |
Ericsson | 38.521-2 16.4.0 CR#388 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
revised | [WTS] [JSN] |
| R5-203874 | Correction of test procedure of ACLR and SEM for SA FR2 | CR | CAICT | 38.521-2 16.4.0 CR#391 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
withdrawn | [WTS] [JSN] |
| R5-203968 | Miscellaneous corrections due to core spec alignment |
CR revised to R5-204763 |
Huawei, HiSilicon, Rohde & Schwarz, Keysight, Ericsson | 38.521-2 16.4.0 CR#393 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
revised | [WTS] [JSN] |
| R5-203969 | Updating beam correspondance capability | CR | Huawei, HiSilicon | 38.521-2 16.4.0 CR#394 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
agreed | [WTS] [JSN] |
| R5-204025 | CR to 38.521-2 to update Absolute Power Tolerance for CA on the order of test steps |
CR revised to R5-204858 |
Samsung R&D Institute UK | 38.521-2 16.4.0 CR#397 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
revised | [WTS] [JSN] |
| R5-204030 | CR to 38.521-2 to update Transmit OFF Power |
CR revised to R5-204915 |
Samsung R&D Institute UK | 38.521-2 16.4.0 CR#398 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
revised | [WTS] [JSN] |
| R5-204031 | CR to TS 38.521-2: Correction to time mask requirements |
CR revised to R5-204916 |
Samsung R&D Institute UK | 38.521-2 16.4.0 CR#399 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
revised | [WTS] [JSN] |
| R5-204044 | CR to TS 38.521-2: Correction to MB relaxation minimum requirements |
CR revised to R5-204859 |
Samsung R&D Institute UK | 38.521-2 16.4.0 CR#401 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
revised | [WTS] [JSN] |
| R5-204055 | Clean up complete status for FR2 SA test cases |
CR revised to R5-204917 |
Anritsu | 38.521-2 16.4.0 CR#402 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
revised | [WTS] [JSN] |
| R5-204057 | Update to UE maximum output power for CA |
CR revised to R5-204918 |
Anritsu | 38.521-2 16.4.0 CR#404 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
revised | [WTS] [JSN] |
| R5-204185 | CR to 38.521-2 to adjust the test step sequences |
CR revised to R5-204860 |
Keysight Technologies UK Ltd | 38.521-2 16.4.0 CR#406 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
revised | [WTS] [JSN] |
| R5-204188 | CR to 38.521-2 to allow vendor declarations related to beam peak searches |
CR revised to R5-204861 |
Keysight Technologies UK Ltd | 38.521-2 16.4.0 CR#407 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
revised | [WTS] [JSN] |
| R5-204193 | CR to 38.521-2 on QoQZ Verification Clarification |
CR revised to R5-204862 |
Keysight Technologies UK Ltd | 38.521-2 16.4.0 CR#408 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
revised | [WTS] [JSN] |
| R5-204247 | FR2 Minimum output power measurement period definition |
CR revised to R5-204919 |
Keysight Technologies UK Ltd | 38.521-2 16.4.0 CR#410 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
revised | [WTS] [JSN] |
| R5-204255 | FR2 Minimum output power MU updates |
CR revised to R5-204863 |
Keysight Technologies UK Ltd | 38.521-2 16.4.0 CR#411 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
revised | [WTS] [JSN] |
| R5-204264 | Editorial correction of ACLR CA test cases | CR | ROHDE & SCHWARZ | 38.521-2 16.4.0 CR#412 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
agreed | [WTS] [JSN] |
| R5-204266 | Update of FR2 OBW test case | CR | ROHDE & SCHWARZ | 38.521-2 16.4.0 CR#414 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
agreed | [WTS] [JSN] |
| R5-204267 | Update of Tx signal quality test cases |
CR revised to R5-204764 |
ROHDE & SCHWARZ | 38.521-2 16.4.0 CR#415 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
revised | [WTS] [JSN] |
| R5-204278 | FR2 EIRP OFF power MU updates |
CR revised to R5-204864 |
Keysight Technologies UK Ltd | 38.521-2 16.4.0 CR#417 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
revised | [WTS] [JSN] |
| R5-204713 | Correction to test configuration for Carrier leakage for CA |
CR revision of R5-203718 |
LG Electronics | 38.521-2 16.4.0 CR#3821 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
agreed | [WTS] [JSN] |
| R5-204714 | Correction to TC 6.4A.2.3.1 In-band emissions for 2UL CA |
CR revision of R5-203720 |
LG Electronics | 38.521-2 16.4.0 CR#3831 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
agreed | [WTS] [JSN] |
| R5-204715 | Correction to test cases 6.4A.2.3.x In-band emissions for 3 to 6 UL CA |
CR revision of R5-203722 |
LG Electronics | 38.521-2 16.4.0 CR#3841 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
agreed | [WTS] [JSN] |
| R5-204716 | Introduction of New TC 6.4A.2.3.6 In-band emissions for 7UL CA |
CR revision of R5-203724 |
LG Electronics | 38.521-2 16.4.0 CR#3851 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
agreed | [WTS] [JSN] |
| R5-204717 | Introduction of New TC 6.4A.2.3.7 In-band emissions for 8UL CA |
CR revision of R5-203727 |
LG Electronics | 38.521-2 16.4.0 CR#3861 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
agreed | [WTS] [JSN] |
| R5-204763 | Miscellaneous corrections due to core spec alignment |
CR revision of R5-203968 |
Huawei, HiSilicon, Rohde & Schwarz, Keysight, Ericsson | 38.521-2 16.4.0 CR#3931 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
agreed | [WTS] [JSN] |
| R5-204764 | Update of Tx signal quality test cases |
CR revision of R5-204267 |
ROHDE & SCHWARZ | 38.521-2 16.4.0 CR#4151 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
agreed | [WTS] [JSN] |
| R5-204857 | Beam correspondence - SRS configuration corrections in section 6.6.1 |
CR revision of R5-203581 |
Keysight Technologies UK Ltd | 38.521-2 16.4.0 CR#3801 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
agreed | [WTS] [JSN] |
| R5-204858 | CR to 38.521-2 to update Absolute Power Tolerance for CA on the order of test steps |
CR revision of R5-204025 |
Samsung R&D Institute UK | 38.521-2 16.4.0 CR#3971 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
agreed | [WTS] [JSN] |
| R5-204859 | CR to TS 38.521-2: Correction to MB relaxation minimum requirements |
CR revision of R5-204044 |
Samsung R&D Institute UK | 38.521-2 16.4.0 CR#4011 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
agreed | [WTS] [JSN] |
| R5-204860 | CR to 38.521-2 to adjust the test step sequences |
CR revision of R5-204185 |
Keysight Technologies UK Ltd | 38.521-2 16.4.0 CR#4061 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
agreed | [WTS] [JSN] |
| R5-204861 | CR to 38.521-2 to allow vendor declarations related to beam peak searches |
CR revision of R5-204188 |
Keysight Technologies UK Ltd | 38.521-2 16.4.0 CR#4071 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
agreed | [WTS] [JSN] |
| R5-204862 | CR to 38.521-2 on QoQZ Verification Clarification |
CR revision of R5-204193 |
Keysight Technologies UK Ltd | 38.521-2 16.4.0 CR#4081 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
agreed | [WTS] [JSN] |
| R5-204863 | FR2 Minimum output power MU updates |
CR revision of R5-204255 |
Keysight Technologies UK Ltd | 38.521-2 16.4.0 CR#4111 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
agreed | [WTS] [JSN] |
| R5-204864 | FR2 EIRP OFF power MU updates |
CR revision of R5-204278 |
Keysight Technologies UK Ltd | 38.521-2 16.4.0 CR#4171 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
agreed | [WTS] [JSN] |
| R5-204914 | Updates to test case 6.3.4.3, relative power tolerance |
CR revision of R5-203766 |
Ericsson | 38.521-2 16.4.0 CR#3881 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
agreed | [WTS] [JSN] |
| R5-204915 | CR to 38.521-2 to update Transmit OFF Power |
CR revision of R5-204030 |
Samsung R&D Institute UK | 38.521-2 16.4.0 CR#3981 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
agreed | [WTS] [JSN] |
| R5-204916 | CR to TS 38.521-2: Correction to time mask requirements |
CR revision of R5-204031 |
Samsung R&D Institute UK | 38.521-2 16.4.0 CR#3991 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
agreed | [WTS] [JSN] |
| R5-204917 | Clean up complete status for FR2 SA test cases |
CR revision of R5-204055 |
Anritsu | 38.521-2 16.4.0 CR#4021 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
agreed | [WTS] [JSN] |
| R5-204918 | Update to UE maximum output power for CA |
CR revision of R5-204057 |
Anritsu | 38.521-2 16.4.0 CR#4041 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
agreed | [WTS] [JSN] |
| R5-204919 | FR2 Minimum output power measurement period definition |
CR revision of R5-204247 |
Keysight Technologies UK Ltd | 38.521-2 16.4.0 CR#4101 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.5.1 |
agreed | [WTS] [JSN] |
50 documents (0.33329510688782 seconds)