Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-210023 | Clean up editors note | CR | Anritsu | 38.521-1 16.6.0 CR#1105 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
withdrawn | [WTS] [JSN] |
| R5-210291 | Message exceptions definition in test case 6.2.2 | CR | Keysight Technologies UK Ltd | 38.521-1 16.6.0 CR#1109 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
agreed | [WTS] [JSN] |
| R5-210292 | Clarifications for ON/OFF time mask for UL MIMO test case |
CR revised to R5-211676 |
Keysight Technologies UK Ltd | 38.521-1 16.6.0 CR#1110 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
revised | [WTS] [JSN] |
| R5-210485 | Correction of test purpose for 6.3.2 and 6.3D.2 | CR | CAICT | 38.521-1 16.6.0 CR#1125 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
agreed | [WTS] [JSN] |
| R5-210486 | Correction of test frequencies for NR band n28 30MHz test channel bandwidth of CA SUL and UL MIMO test cases in section 6 |
CR revised to R5-211677 |
CAICT | 38.521-1 16.6.0 CR#1126 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
revised | [WTS] [JSN] |
| R5-210723 | Omitting of FR1 Rx cases with UL-MIMO on TDD bands | CR | Huawei, HiSilicon | 38.521-1 16.6.0 CR#1133 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
agreed | [WTS] [JSN] |
| R5-210793 | Update of the test configuration for carrier leakage for SUL | CR | Huawei, HiSilicon | 38.521-1 16.6.0 CR#1142 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
agreed | [WTS] [JSN] |
| R5-210899 | Removal of the highest SCS from test configuration for Tx spurious emissions for CA | CR | Huawei, Hisilicon | 38.521-1 16.6.0 CR#1146 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
agreed | [WTS] [JSN] |
| R5-210906 | Updating A-SEM for MIMO testing for NS_04 | CR | Huawei, Hisilicon | 38.521-1 16.6.0 CR#1150 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
agreed | [WTS] [JSN] |
| R5-210907 | Updating AMPR for MIMO test case for NS_35 |
CR revised to R5-211678 |
Huawei, Hisilicon | 38.521-1 16.6.0 CR#1151 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
revised | [WTS] [JSN] |
| R5-210908 | Updating test applicability of test case 6.5D.2.4.2-UTRA ACLR for UL MIMO | CR | Huawei, Hisilicon | 38.521-1 16.6.0 CR#1152 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
agreed | [WTS] [JSN] |
| R5-210910 | Correction to RB allocation start for test case 6.3D.4.2 |
CR revised to R5-211679 |
Huawei, Hisilicon, Ericsson | 38.521-1 16.6.0 CR#1153 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
revised | [WTS] [JSN] |
| R5-210911 | Correction to test configuration table Test IDs for test case 6.5D.3.3 | CR | Huawei, Hisilicon | 38.521-1 16.6.0 CR#1154 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
agreed | [WTS] [JSN] |
| R5-210988 | Change of RB allocation start in test case 6.3D.4.2 | CR | Ericsson | 38.521-1 16.6.0 CR#1173 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
withdrawn | [WTS] [JSN] |
| R5-210995 | Update for 6.5.3.2 Spurious emission for UE co-existence_R15 | CR | Qualcomm Korea | 38.521-1 16.6.0 CR#1175 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
agreed | [WTS] [JSN] |
| R5-211002 | Correction to TC6.4.2.5 EVM equalizer spectrum flatness for Pi2 BPSK | CR | Bureau Veritas | 38.521-3 16.6.0 CR#891 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
withdrawn | [WTS] [JSN] |
| R5-211024 | Update of Tx test procedure for PC2 UE on FDD bands due to maxUplinkDutyCycle |
CR revised to R5-211608 |
Huawei, HiSilicon, Bureau Veritas | 38.521-1 16.6.0 CR#1179 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
revised | [WTS] [JSN] |
| R5-211042 | Spurious emissions for UE co-existence update to core specs |
CR revised to R5-211613 |
Keysight Technologies UK Ltd | 38.521-1 16.6.0 CR#1184 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
revised | [WTS] [JSN] |
| R5-211051 | Introduction of additional Rel-15 EN-DC inter-band configurations to EN-DC MOP test case 6.2B.1.3 | CR | Ericsson | 38.521-3 16.6.0 CR#904 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
withdrawn | [WTS] [JSN] |
| R5-211052 | Introduction of dTIB,c for inter-band EN-DC Rel-15 EN-DC inter-band configurations | CR | Ericsson | 38.521-3 16.6.0 CR#905 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
withdrawn | [WTS] [JSN] |
| R5-211092 | Test ID separation to powerBoostPiBPSK 1 and 0 in Table 6.5.2.2.4.1-1 | CR | Anritsu | 38.521-1 16.6.0 CR#1186 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
agreed | [WTS] [JSN] |
| R5-211109 | Corrections to subclauses in 38.521-1 with appropriate subclause level and heading styles | CR | ZTE Corporation | 38.521-1 16.6.0 CR#1187 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
agreed | [WTS] [JSN] |
| R5-211113 | Corrections to reference figures for transmission bandwidth in FR1 | CR | ZTE Corporation | 38.521-1 16.6.0 CR#1188 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
agreed | [WTS] [JSN] |
| R5-211129 | Introduction of dRIB,c for inter-band EN-DC Rel-15 EN-DC inter-band configurations | CR | Ericsson | 38.521-3 16.6.0 CR#923 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
withdrawn | [WTS] [JSN] |
| R5-211176 | Reference to measurement BW corrected in 6.5D.4 TX intermodulation test case | CR | Keysight Technologies UK Ltd | 38.521-1 16.6.0 CR#1191 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
agreed | [WTS] [JSN] |
| R5-211281 | Correction to TC6.4.2.5 EVM equalizer spectrum flatness for Pi2 BPSK | CR | Bureau Veritas | 38.521-1 16.6.0 CR#1196 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
withdrawn | [WTS] [JSN] |
| R5-211608 | Update of Tx test procedure for PC2 UE on FDD bands due to maxUplinkDutyCycle |
CR revision of R5-211024 |
Huawei, HiSilicon, Bureau Veritas | 38.521-1 16.6.0 CR#11791 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
withdrawn | [WTS] [JSN] |
| R5-211613 | Spurious emissions for UE co-existence update to core specs |
CR revision of R5-211042 |
Keysight Technologies UK Ltd | 38.521-1 16.6.0 CR#11841 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
agreed | [WTS] [JSN] |
| R5-211676 | Clarifications for ON/OFF time mask for UL MIMO test case |
CR revision of R5-210292 |
Keysight Technologies UK Ltd | 38.521-1 16.6.0 CR#11101 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
agreed | [WTS] [JSN] |
| R5-211677 | Correction of test frequencies for NR band n28 30MHz test channel bandwidth of CA SUL and UL MIMO test cases in section 6 |
CR revision of R5-210486 |
CAICT | 38.521-1 16.6.0 CR#11261 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
agreed | [WTS] [JSN] |
| R5-211678 | Updating AMPR for MIMO test case for NS_35 |
CR revision of R5-210907 |
Huawei, Hisilicon | 38.521-1 16.6.0 CR#11511 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
agreed | [WTS] [JSN] |
| R5-211679 | Correction to RB allocation start for test case 6.3D.4.2 |
CR revision of R5-210910 |
Huawei, Hisilicon, Ericsson | 38.521-1 16.6.0 CR#11531 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-90-e AI: 5.3.2.4.1 |
agreed | [WTS] [JSN] |
32 documents (0.33516502380371 seconds)