Please enter the search related information in the fields below. Partial information works, e.g. "SP-21
" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501
" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP
" gives the same results as "3gpp
".
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tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
---|---|---|---|---|---|---|---|---|---|
R5-237048 | Updating Configured output power for intra-band non-contiguous CA |
CR revised to R5-237902 |
Huawei, HiSilicon | 38.521-1 18.0.0 CR#2559 catF | NR_RF_FR1-UEConTest | Rel-18 |
R5-101 AI: 5.3.2.3.1 |
revised | [WTS] [JSN] |
R5-237050 | Updating AMPR for MIMO for band n39 |
CR revised to R5-237650 |
Huawei, HiSilicon | 38.521-1 18.0.0 CR#2560 catF | NR_RF_FR1-UEConTest | Rel-18 |
R5-101 AI: 5.3.2.3.1 |
revised | [WTS] [JSN] |
R5-237051 | Updating minimum output power for UL non-contiguous CA |
CR revised to R5-237903 |
Huawei, HiSilicon | 38.521-1 18.0.0 CR#2561 catF | NR_RF_FR1-UEConTest | Rel-18 |
R5-101 AI: 5.3.2.3.1 |
revised | [WTS] [JSN] |
R5-237053 | Updating Frequency error for CA test case for intra-band UL CA |
CR revised to R5-237631 |
Huawei, HiSilicon | 38.521-1 18.0.0 CR#2562 catF | NR_RF_FR1-UEConTest | Rel-18 |
R5-101 AI: 5.3.2.3.1 |
revised | [WTS] [JSN] |
R5-237055 | Updating Spurious emission testing for intra-band non-contiguous CA |
CR revised to R5-237904 |
Huawei, HiSilicon | 38.521-1 18.0.0 CR#2563 catF | NR_RF_FR1-UEConTest | Rel-18 |
R5-101 AI: 5.3.2.3.1 |
revised | [WTS] [JSN] |
R5-237057 | Updating additional spurious emissions for MIMO for n39 | CR | Huawei, HiSilicon | 38.521-1 18.0.0 CR#2564 catF | NR_RF_FR1-UEConTest | Rel-18 |
R5-101 AI: 5.3.2.3.1 |
agreed | [WTS] [JSN] |
R5-237058 | Updating Transmit intermodulation testing for intra-band UL CA |
CR revised to R5-237632 |
Huawei, HiSilicon | 38.521-1 18.0.0 CR#2565 catF | NR_RF_FR1-UEConTest | Rel-18 |
R5-101 AI: 5.3.2.3.1 |
revised | [WTS] [JSN] |
R5-237060 | Updating EVM testing for intra-band UL CA |
CR revised to R5-237905 |
Huawei, HiSilicon | 38.521-1 18.0.0 CR#2566 catF | NR_RF_FR1-UEConTest | Rel-18 |
R5-101 AI: 5.3.2.3.1 |
revised | [WTS] [JSN] |
R5-237062 | Updating carrier leakage testing for intra-band UL CA |
CR revised to R5-237906 |
Huawei, HiSilicon | 38.521-1 18.0.0 CR#2567 catF | NR_RF_FR1-UEConTest | Rel-18 |
R5-101 AI: 5.3.2.3.1 |
revised | [WTS] [JSN] |
R5-237064 | Updating In-band emissions for intra-band UL CA | CR | Huawei, HiSilicon | 38.521-1 18.0.0 CR#2568 catF | NR_RF_FR1-UEConTest | Rel-18 |
R5-101 AI: 5.3.2.3.1 |
agreed | [WTS] [JSN] |
R5-237631 | Updating Frequency error for CA test case for intra-band UL CA |
CR revision of R5-237053 |
Huawei, HiSilicon | 38.521-1 18.0.0 CR#25621 catF | NR_RF_FR1-UEConTest | Rel-18 |
R5-101 AI: 5.3.2.3.1 |
agreed | [WTS] [JSN] |
R5-237632 | Updating Transmit intermodulation testing for intra-band UL CA |
CR revision of R5-237058 |
Huawei, HiSilicon | 38.521-1 18.0.0 CR#25651 catF | NR_RF_FR1-UEConTest | Rel-18 |
R5-101 AI: 5.3.2.3.1 |
agreed | [WTS] [JSN] |
R5-237650 | Updating AMPR for MIMO for band n39 |
CR revision of R5-237050 |
Huawei, HiSilicon | 38.521-1 18.0.0 CR#25601 catF | NR_RF_FR1-UEConTest | Rel-18 |
R5-101 AI: 5.3.2.3.1 |
agreed | [WTS] [JSN] |
R5-237902 | Updating Configured output power for intra-band non-contiguous CA |
CR revision of R5-237048 |
Huawei, HiSilicon | 38.521-1 18.0.0 CR#25591 catF | NR_RF_FR1-UEConTest | Rel-18 |
R5-101 AI: 5.3.2.3.1 |
agreed | [WTS] [JSN] |
R5-237903 | Updating minimum output power for UL non-contiguous CA |
CR revision of R5-237051 |
Huawei, HiSilicon | 38.521-1 18.0.0 CR#25611 catF | NR_RF_FR1-UEConTest | Rel-18 |
R5-101 AI: 5.3.2.3.1 |
agreed | [WTS] [JSN] |
R5-237904 | Updating Spurious emission testing for intra-band non-contiguous CA |
CR revision of R5-237055 |
Huawei, HiSilicon | 38.521-1 18.0.0 CR#25631 catF | NR_RF_FR1-UEConTest | Rel-18 |
R5-101 AI: 5.3.2.3.1 |
agreed | [WTS] [JSN] |
R5-237905 | Updating EVM testing for intra-band UL CA |
CR revision of R5-237060 |
Huawei, HiSilicon | 38.521-1 18.0.0 CR#25661 catF | NR_RF_FR1-UEConTest | Rel-18 |
R5-101 AI: 5.3.2.3.1 |
agreed | [WTS] [JSN] |
R5-237906 | Updating carrier leakage testing for intra-band UL CA |
CR revision of R5-237062 |
Huawei, HiSilicon | 38.521-1 18.0.0 CR#25671 catF | NR_RF_FR1-UEConTest | Rel-18 |
R5-101 AI: 5.3.2.3.1 |
agreed | [WTS] [JSN] |
18 documents (0.29675316810608 seconds)