Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-200020 | IFF DFF Hybrid setup for FR2 RRM 2AoA Test |
discussion revised to R5-201154 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-200035 | Discussion on how to update Clause 4.1 in TS 38521-1-2-3-4 |
discussion revised to R5-200919 |
CMCC, Huawei, Hisilicon, Telecom Italia, China Unicom, CAICT | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.17 |
revised | [WTS] [JSN] | |
| R5-200046 | Discussion on how to update TS 38.522 |
discussion revised to R5-201017 |
CMCC, Bureau Veritas, Huawei, Hisilicon, China Unicom, CAICT, TEJET, SRTC, Sporton | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.17 |
revised | [WTS] [JSN] | |
| R5-200116 | On testability issue for FR2 |
discussion revised to R5-201034 |
NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.17 |
revised | [WTS] [JSN] | |
| R5-200117 | Review on test point for FR1 TRx | discussion | NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.17 |
withdrawn | [WTS] [JSN] | |
| R5-200159 | FR2 RRM MU and choice of test cases to evaluate |
discussion revised to R5-201155 |
ANRITSU LTD | Rel-15 |
R5-ah-34837 AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-200160 | FR2 TT analysis for 38.533 5.7.1.1+7.7.1.1 Intra-freq SS-RSRP | discussion | ANRITSU LTD |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | |||
| R5-200161 | FR2 TT analysis for 38.533 5.7.1.2+7.7.1.2 Inter-freq SS-RSRP | discussion | ANRITSU LTD |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | |||
| R5-200316 | On AP#85.28: n259 MU Estimate | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-200317 | On Beam Peak Searches for different test configurations | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
withdrawn | [WTS] [JSN] | ||
| R5-200318 | CDF/PDF Scaling Factor | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-200321 | NR FR2 Demodulation MU Table |
discussion revised to R5-201156 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-200323 | End-to-End System Simulations for Min. Isolation Requirements |
discussion revised to R5-201157 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-200324 | On PC1 MUs | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
withdrawn | [WTS] [JSN] | ||
| R5-200325 | On NR FR2 Demodulation MUs | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
withdrawn | [WTS] [JSN] | ||
| R5-200326 | Quality of Quiet Zone MU and XPD MU for Spurious Emissions |
discussion revised to R5-200998 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-200327 | On the MU Element “Uncertainty of an absolute gain of the calibration antenna” for Spurious Emissions | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-200328 | On XPD Verification | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-200330 | On RRM MUs including AP#85.22 |
discussion revised to R5-201053 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-200392 | Discussion on MU and TT of FR1 CA Rx test cases | discussion | Huawei, HiSilicon | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
| R5-200394 | Discussion on FR1 MOP testing for PC2 UE | discussion | Huawei, HiSilicon, CMCC | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
| R5-200395 | Discussion on handling of HP-UE requirements in FR1 |
discussion revised to R5-201181 |
Huawei, HiSilicon, CMCC | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.17 |
revised | [WTS] [JSN] | |
| R5-200398 | On ACLR test metric for FR2 | discussion | Huawei, HiSilicon | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
| R5-200478 | Discussion on FR1 UL CA power calculation for TC transmit on off time mask |
discussion revised to R5-200920 |
China Unicom | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.17 |
revised | [WTS] [JSN] | |
| R5-200556 | Discussion on FR2 absolute power control TP3 | discussion | Samsung R&D Institute UK | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-200560 | Discussion on OFF Power for the SRS time mask with UL MIMO test case | discussion | Samsung R&D Institute UK | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
not treated | [WTS] [JSN] | ||
| R5-200695 | Discussion on uplink power control window size |
discussion revised to R5-201188 |
Qualcomm Korea | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.17 |
revised | [WTS] [JSN] | |
| R5-200734 | Noise impact for FR2 TRx test cases |
discussion revised to R5-201163 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-200735 | Quality of Quiet Zone for spurious emission | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-200736 | Measurement uncertainty for n259 | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-200737 | Proposal of MU elements for FR2 spurious emission |
discussion revised to R5-201164 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-200738 | On FR2 ACLR MUs | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-200739 | On FR2 OBW MU | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-200741 | Treatment FR2 RRM MU for different test setups | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-200745 | On FR2 OFF Power MU | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-200746 | On FR2 Rx Spurious MU | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-200777 | Discussion Paper to clarify test config aspects for EN-DC tests with greater than two E-UTRA+NR carriers |
discussion revised to R5-201199 |
Qualcomm communications-France | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.17 |
revised | [WTS] [JSN] | |
| R5-200811 | On RRM test cases list to start FR2 MU analysis | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-200816 | Estimate of Measurement Uncertainty for n259 | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-200868 | On the SNR for FR2 TRx test cases | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-200869 | On the MU of FR2 OBW | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-200873 | FR2 Spurious MU: Noise Impact | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-200874 | On FR2 OBW MU | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-200875 | FR2 Spurious MU: Network Analyzer Uncertainty | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
withdrawn | [WTS] [JSN] | ||
| R5-200876 | FR2 Spurious MU: RF power measurement MU | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-200878 | On FR2 Transmission OFF power MU |
discussion revised to R5-201091 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-200879 | On FR2 ACLR MU | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
withdrawn | [WTS] [JSN] | ||
| R5-200919 | Discussion on how to update Clause 4.1 in TS 38521-1-2-3-4 |
discussion revision of R5-200035 |
CMCC, Huawei, Hisilicon, Telecom Italia, China Unicom, CAICT | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
| R5-200920 | Discussion on FR1 UL CA power calculation for TC transmit on off time mask |
discussion revision of R5-200478 |
China Unicom | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
| R5-200998 | Quality of Quiet Zone MU and XPD MU for Spurious Emissions |
discussion revision of R5-200326 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-201017 | Discussion on how to update TS 38.522 |
discussion revision of R5-200046 |
CMCC, Bureau Veritas, Huawei, Hisilicon, China Unicom, CAICT, TEJET, SRTC, Sporton | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
| R5-201034 | On testability issue for FR2 |
discussion revision of R5-200116 |
NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
| R5-201053 | On RRM MUs including AP#85.22 |
discussion revision of R5-200330 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-201091 | On FR2 Transmission OFF power MU |
discussion revision of R5-200878 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-201154 | IFF DFF Hybrid setup for FR2 RRM 2AoA Test |
discussion revision of R5-200020 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-201155 | FR2 RRM MU and choice of test cases to evaluate |
discussion revision of R5-200159 |
ANRITSU LTD | Rel-15 |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-201156 | NR FR2 Demodulation MU Table |
discussion revision of R5-200321 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-201157 | End-to-End System Simulations for Min. Isolation Requirements |
discussion revision of R5-200323 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-201163 | Noise impact for FR2 TRx test cases |
discussion revision of R5-200734 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-201164 | Proposal of MU elements for FR2 spurious emission |
discussion revision of R5-200737 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-201181 | Discussion on handling of HP-UE requirements in FR1 |
discussion revision of R5-200395 |
Huawei, HiSilicon, CMCC | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
| R5-201188 | Discussion on uplink power control window size |
discussion revision of R5-200695 |
Qualcomm Korea | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
| R5-201199 | Discussion Paper to clarify test config aspects for EN-DC tests with greater than two E-UTRA+NR carriers |
discussion revision of R5-200777 |
Qualcomm communications-France | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.17 |
noted | [WTS] [JSN] |
63 documents (0.34335899353027 seconds)