Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-214202 | On the achievable SNR for demod test cases | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-214323 | Discussion on FR1 ON/OFF time mask test procedure | discussion | Ericsson | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-214326 | Discussion on TT and relaxation in FR2 test cases with testability issue |
discussion revised to R5-215826 |
Ericsson | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-214850 | Removal of EN-DC Receiver Spurious Emission test with multiple CCs | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-214851 | On absolute UL Power MU for FR2 RRM |
discussion revised to R5-215824 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-214852 | On the testable SNR for FR2 demodulation tests | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-214939 | Discussion on FR2 beam peak search | discussion | Rohde & Schwarz | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-214940 | Discussion on FR2 DL CA test procedure |
discussion revised to R5-215819 |
Rohde & Schwarz | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-215197 | Discussion on AMPR edge RB allocation for NS | discussion | Apple Italia S.R.L. | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
| R5-215215 | Discussion on WF for FR2 MU |
discussion revised to R5-215825 |
Guangdong OPPO Mobile Telecom. | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-215226 | Discussion on test method for NR intra-band CA within FR1 |
discussion revised to R5-215818 |
Guangdong OPPO Mobile Telecom. |
R5-92-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | |||
| R5-215319 | On MU of FR2 power control test cases | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-215321 | Testability analysis and test point optimization for FR2 absolute power tolerance and aggregate power tolerance | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-215324 | Dynamic range issue and its solution in ON OFF time mask | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-215328 | On MU and TT for FR2 EVM | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-215409 | FR2 RRM test cases: Known Issue List | discussion | Ericsson | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-215410 | FR2 RRM test cases: Known Issue List - after RAN5_92e | discussion | Ericsson | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-215476 | On the MU of Tx Modulation Quality test cases | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-215479 | On the MU of FR2 OBW | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-215480 | On FR2 ON/OFF Time Mask | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-215481 | On the SNR of FR2 TRx test cases for PC1 | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-215485 | On the relative power measurement MU | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-215515 | Discussion on coherent UL-MIMO measurement |
discussion revised to R5-215820 |
Huawei, HiSilicon | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-92-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | |
| R5-215523 | 5GS_NR_LTE-UEConTest Work plan extension request | discussion | Keysight technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-215527 | Occupied bandwidth for Intra-Band Contiguous EN-DC measurement uncertainty | discussion | Keysight technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-215531 | Out-of-band emissions for FR2 UL MIMO initial conditions | discussion | Keysight technologies UK Ltd, Sporton | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-215533 | Out-of-band emissions for FR2 UL MIMO Measurement uncertainties and test tolerances | discussion | Keysight technologies UK Ltd, Sporton | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-215555 | Clarification text on LCS Sub-Test Cases | discussion | Apple Gesellschaft | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-92-e AI: 5.3.2.17 |
withdrawn | [WTS] [JSN] | |
| R5-215560 | Discussion on handling ETC for FR2 RF CA test case scenarios | discussion | Apple Gesellschaft | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
| R5-215565 | Discussion of test applicability for different NS values |
discussion revised to R5-216083 |
Qualcomm Austria RFFE GmbH | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | |
| R5-215580 | On Declaration of Antenna Aperture for DFF based RRM systems | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-215607 | On FR2 RLM testability issues |
discussion revised to R5-215827 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
| R5-215608 | On max testable SNR for Demod testing | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
withdrawn | [WTS] [JSN] | ||
| R5-215615 | Clarification text on LCS Sub-Test Cases | discussion | Apple Gesellschaft | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-92-e AI: 5.3.2.17 |
withdrawn | [WTS] [JSN] | |
| R5-215627 | Beam correspondence Measurement Uncertainties | discussion | Keysight technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
withdrawn | [WTS] [JSN] | ||
| R5-215632 | Views on handling Scell Drop in FR2 RF CA tests | discussion | Apple Portugal | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
| R5-215660 | Discussion on MU for Demod SDR test case |
discussion revised to R5-215828 |
Qualcomm Korea | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-92-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | |
| R5-215661 | Discussion on max testable SNR for Demod scenarios |
discussion revised to R5-215829 |
Qualcomm Korea | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-92-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | |
| R5-215818 | Discussion on test method for NR intra-band CA within FR1 |
discussion revision of R5-215226 |
Guangdong OPPO Mobile Telecom. |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | |||
| R5-215819 | Discussion on FR2 DL CA test procedure |
discussion revision of R5-214940 |
Rohde & Schwarz | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-215820 | Discussion on coherent UL-MIMO measurement |
discussion revision of R5-215515 |
Huawei, HiSilicon | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
| R5-215824 | On absolute UL Power MU for FR2 RRM |
discussion revision of R5-214851 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-215825 | Discussion on WF for FR2 MU |
discussion revision of R5-215215 |
Guangdong OPPO Mobile Telecom. | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-215826 | Discussion on TT and relaxation in FR2 test cases with testability issue |
discussion revision of R5-214326 |
Ericsson | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-215827 | On FR2 RLM testability issues |
discussion revision of R5-215607 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
| R5-215828 | Discussion on MU for Demod SDR test case |
discussion revision of R5-215660 |
Qualcomm Korea | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
| R5-215829 | Discussion on max testable SNR for Demod scenarios |
discussion revision of R5-215661 |
Qualcomm Korea | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
| R5-216083 | Discussion of test applicability for different NS values |
discussion revision of R5-215565 |
Qualcomm Austria RFFE GmbH | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.17 |
noted | [WTS] [JSN] |
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