Please enter the search related information in the fields below. Partial information works, e.g. "SP-21
" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501
" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP
" gives the same results as "3gpp
".
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tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
---|---|---|---|---|---|---|---|---|---|
R5-203310 | Quality of the Quiet Zone measurement results for enhanced IFF |
discussion revised to R5-204737 |
ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
R5-203311 | Uncertainty assessment DL AWGN absolute power for enhanced IFF |
discussion revised to R5-204742 |
ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
R5-203312 | MTSU DL AWGN absolute power for RRM | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
R5-203321 | FR2 RRM test cases: dB range in Spherical coverage | discussion | ANRITSU LTD |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | |||
R5-203322 | Test Tolerance review process for FR2 RRM Test cases |
discussion revised to R5-204848 |
ANRITSU LTD |
R5-88-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | |||
R5-203485 | On ACS FR2 Measurement Uncertainty definition |
discussion revised to R5-204743 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | |
R5-203489 | On IBB FR2 Measurement Uncertainty definition |
discussion revised to R5-204744 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | |
R5-203669 | FR2 Demod MU due to finite test time |
discussion revised to R5-204738 |
Qualcomm Korea | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
R5-203686 | Discussion about proposals in LS R4-2005205 |
discussion revised to R5-204721 |
Huawei, Hisilicon | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | |
R5-203819 | Discussion on PCC prioritization for FR1 and FR2 UL CA testing | discussion | Qualcomm Inc, Verizon Inc. | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
R5-203868 | Discussion on Scope, Purpose and drafting guideline for 38.522 |
discussion revised to R5-204951 |
CAICT | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | |
R5-203972 | Discussion on QZ size | discussion | Huawei, HiSilicon | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
withdrawn | [WTS] [JSN] | ||
R5-204022 | Discussion on FR2 absolute power control MU | discussion | Samsung R&D Institute UK | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
R5-204027 | Discussion on remaining parameters for FR2 EIRP Tx OFF power MU | discussion | Samsung R&D Institute UK | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
R5-204042 | Discussion on multi-band relaxation framework requirement enhancement | discussion | Samsung R&D Institute UK | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
R5-204081 | On AWGN and signal flatness uncertainty for FR2 Performance tests | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
R5-204082 | On FR2 DL absolute level uncertainty for DFF. |
discussion revised to R5-204745 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
R5-204083 | On gNB emulator fading model impairments for FR2 Performance tests | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
R5-204084 | On FR2 ACS and IBB Test Implementation and MU | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
R5-204085 | On FR2 OBW MU |
discussion revised to R5-204849 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
R5-204086 | Noise impact for FR2 test case where MPR applies |
discussion revised to R5-204746 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
R5-204087 | On MU for FR2 MPR Test | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
R5-204088 | On frequency flatness uncertainty for FR2 RRM and Performance tests | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
withdrawn | [WTS] [JSN] | ||
R5-204089 | On gNB emulator SNR uncertainty for FR2 | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
R5-204090 | Proposal of MUs for FR2 spurious emission UE co-existence | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
R5-204136 | Review on FR1 TRx test point analysis for Extreme Condition |
discussion revised to R5-204952 |
DOCOMO Communications Lab. | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | |
R5-204186 | On Beam Peak Searches for different test configurations | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
R5-204189 | Preliminary QoQZ and EIRP MU results for ETC testing |
discussion revised to R5-204739 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
R5-204191 | On Larger Quiet Zone Sizes |
discussion revised to R5-204747 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
R5-204192 | QoQZ Verification Clarification | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
R5-204194 | On Re-Positioning Concept for RRM 2 AoA QoQZ Validation and DFF QoQZ MU | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
R5-204200 | Discussion on size of Quiet Zone above 30cm | discussion | ROHDE & SCHWARZ | Rel-16 |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
R5-204213 | Discussion on RAN5 impact of updated Multi-Band Relaxation requirements | discussion | Ericsson | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
R5-204214 | Discussion on EN-DC reference sensitivity test case structure |
discussion revised to R5-204953 |
Ericsson | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
R5-204253 | On FR2 Minimum Output Power relaxation and measurement uncertainty |
discussion revised to R5-204740 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
R5-204260 | Discussion on DC_41C_n41A and DC_41D_n41A |
discussion revised to R5-204846 |
ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
R5-204269 | On gNB emulator fading model impairments | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
R5-204270 | On the MU of FR2 OBW | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
R5-204271 | On the AWGN flatness and signal flatness |
discussion revised to R5-204748 |
ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
R5-204274 | On the SNR for FR2 TRx test cases | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
withdrawn | [WTS] [JSN] | ||
R5-204277 | On FR2 EIRP OFF Power relaxation and measurement uncertainty | discussion | Keysight Technologies UK Ltd, Samsung | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
R5-204282 | PC1 Assumptions for CDF Curve for MOP EIRP Spherical Coverage | discussion | Qualcomm Incorporated | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
R5-204293 | On Spurious measurement uncertainty |
discussion revised to R5-204749 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
R5-204294 | On OBW measurement uncertainty |
discussion revised to R5-204850 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
R5-204721 | Discussion about proposals in LS R4-2005205 |
discussion revision of R5-203686 |
Huawei, Hisilicon | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
R5-204729 | WF on SA 2Tx and NSA PC2 |
discussion revised to R5-204954 |
Huawei, Hisilicon | Rel-16 |
R5-88-e AI: 5.3.2.17 |
revised | [WTS] [JSN] | ||
R5-204737 | Quality of the Quiet Zone measurement results for enhanced IFF |
discussion revision of R5-203310 |
ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
R5-204738 | FR2 Demod MU due to finite test time |
discussion revision of R5-203669 |
Qualcomm Korea | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
R5-204739 | Preliminary QoQZ and EIRP MU results for ETC testing |
discussion revision of R5-204189 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
R5-204740 | On FR2 Minimum Output Power relaxation and measurement uncertainty |
discussion revision of R5-204253 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
R5-204741 | On FR2 EIRP OFF Power relaxation and measurement uncertainty | discussion | Keysight Technologies UK Ltd, Samsung | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
R5-204742 | Uncertainty assessment DL AWGN absolute power for enhanced IFF |
discussion revision of R5-203311 |
ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
R5-204743 | On ACS FR2 Measurement Uncertainty definition |
discussion revision of R5-203485 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
R5-204744 | On IBB FR2 Measurement Uncertainty definition |
discussion revision of R5-203489 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
R5-204745 | On FR2 DL absolute level uncertainty for DFF. |
discussion revision of R5-204082 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
R5-204746 | Noise impact for FR2 test case where MPR applies |
discussion revision of R5-204086 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
R5-204747 | On Larger Quiet Zone Sizes |
discussion revision of R5-204191 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
R5-204748 | On the AWGN flatness and signal flatness |
discussion revision of R5-204271 |
ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
R5-204749 | On Spurious measurement uncertainty |
discussion revision of R5-204293 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
R5-204846 | Discussion on DC_41C_n41A and DC_41D_n41A |
discussion revision of R5-204260 |
ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
R5-204848 | Test Tolerance review process for FR2 RRM Test cases |
discussion revision of R5-203322 |
ANRITSU LTD |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | |||
R5-204849 | On FR2 OBW MU |
discussion revision of R5-204085 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
R5-204850 | On OBW measurement uncertainty |
discussion revision of R5-204294 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
R5-204951 | Discussion on Scope, Purpose and drafting guideline for 38.522 |
discussion revision of R5-203868 |
CAICT | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
R5-204952 | Review on FR1 TRx test point analysis for Extreme Condition |
discussion revision of R5-204136 |
DOCOMO Communications Lab. | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | |
R5-204953 | Discussion on EN-DC reference sensitivity test case structure |
discussion revision of R5-204214 |
Ericsson | 5GS_NR_LTE-UEConTest |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] | ||
R5-204954 | WF on SA 2Tx and NSA PC2 |
discussion revision of R5-204729 |
Huawei, Hisilicon | Rel-16 |
R5-88-e AI: 5.3.2.17 |
noted | [WTS] [JSN] |
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