Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-201456 | Discussion on Test Point analysis for NR FR2 Frequency Error CA test cases | discussion | NTT DOCOMO INC. | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
withdrawn | [WTS] [JSN] | |
| R5-201457 | Test Point analysis for FR2 Frequency Error for CA |
CR revised to R5-202918 |
NTT DOCOMO INC. | 38.905 16.3.0 CR#239 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-201566 | Test Point analysis for FR2 Spectrum Emission Mask for CA | CR | NTT DOCOMO INC. | 38.905 16.3.0 CR#240 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
withdrawn | [WTS] [JSN] |
| R5-201567 | Test Point analysis for FR2 Adjacent channel leakage ratio for CA | CR | NTT DOCOMO INC. | 38.905 16.3.0 CR#241 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
withdrawn | [WTS] [JSN] |
| R5-201746 | Addition of Number of test points for FR1 in SUL test cases | CR | Huawei,Hisilicon | 38.905 16.3.0 CR#242 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-201747 | Addition of TP analysis for FR1 A-MPR for CA | CR | Huawei,Hisilicon | 38.905 16.3.0 CR#243 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-201767 | Test points analysis for NS_40 A_MPR FR1 test case | CR | Ericsson | 38.905 16.3.0 CR#247 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-201769 | Test points analysis for NS_41 A_MPR FR1 test case |
CR revised to R5-202755 |
Ericsson | 38.905 16.3.0 CR#248 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-201771 | Test points analysis for NS_42 A_MPR FR1 test case |
CR revised to R5-202756 |
Ericsson | 38.905 16.3.0 CR#249 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-201856 | Updating TP of MOP for intra-band contiguous EN-DC |
CR revised to R5-202952 |
Huawei, HiSilicon | 38.905 16.3.0 CR#251 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-201857 | Updating TP of MOP for intra-band non-contiguous EN-DC |
CR revised to R5-202953 |
Huawei, HiSilicon | 38.905 16.3.0 CR#252 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-201871 | Update of test points analysis in UE co-existence for inter-band EN-DC | CR | Huawei,Hisilicon | 38.905 16.3.0 CR#253 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-201872 | Update of Test Point Analysis for UE Co-existence for DC_5A-n66A | CR | Huawei,Hisilicon | 38.905 16.3.0 CR#254 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-201873 | Update of Test Point Analysis for UE Co-existence for DC_5A-n78A | CR | Huawei,Hisilicon | 38.905 16.3.0 CR#255 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-201874 | Update of Test Point Analysis for UE Co-existence for DC_66A-n5A | CR | Huawei,Hisilicon | 38.905 16.3.0 CR#256 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-201875 | Update of Test Point Analysis for UE Co-existence for DC_66A-n78A | CR | Huawei,Hisilicon | 38.905 16.3.0 CR#257 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-201929 | Cleanup in 38.905 | CR | Ericsson | 38.905 16.3.0 CR#258 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-201930 | Combined TP analysis for MPR, NR ACLR and SEM FR1 test cases |
CR revised to R5-202954 |
Ericsson, Keysight Technologies, Huawei, CAICT | 38.905 16.3.0 CR#259 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-201931 | Combined TP analysis for MPR, ACLR and SEM intra-band contiguous EN-DC test cases | CR | Ericsson, Keysight Technologies | 38.905 16.3.0 CR#260 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-202029 | Introduction of test point analysis for 2CCs EN-DC TCs in FR1 in 7.6B Blocking characteristics for DC and 7.7B Spurious response for DC | CR | CAICT | 38.905 16.3.0 CR#261 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-202111 | NS_24 TP analysis to TR 38.905 | CR | Dish Network | 38.905 16.3.0 CR#262 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-202376 | Updated TP analysis for 7.3A Reference sensitivity for CA |
CR revised to R5-202955 |
Ericsson, WE Certification, DISH | 38.905 16.3.0 CR#263 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-202432 | TP_analysis_6.5.3.3_TX_Additional_SpurEmission_NS_05 |
CR revised to R5-202757 |
QUALCOMM Europe Inc. - Italy | 38.905 16.3.0 CR#264 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-202433 | TP_analysis_6.5.3.3_TX_Additional_SpurEmission_NS_05 |
CR revised to R5-202523 |
QUALCOMM Europe Inc. - Italy | 38.905 16.3.0 CR#265 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-202523 | TP_analysis_6.5.3.3_TX_Additional_SpurEmission_NS_05 |
CR revision of R5-202433 |
QUALCOMM Europe Inc. - Italy | 38.905 16.3.0 CR#2651 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
withdrawn | [WTS] [JSN] |
| R5-202524 | TP_analysis_6.5.3.3_TX_Additional_SpurEmission_NS_43 | CR | QUALCOMM Europe Inc. - Italy | 38.905 16.3.0 CR#267 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-202755 | Test points analysis for NS_41 A_MPR FR1 test case |
CR revision of R5-201769 |
Ericsson | 38.905 16.3.0 CR#2481 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-202756 | Test points analysis for NS_42 A_MPR FR1 test case |
CR revision of R5-201771 |
Ericsson | 38.905 16.3.0 CR#2491 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-202757 | TP_analysis_6.5.3.3_TX_Additional_SpurEmission_NS_05 |
CR revision of R5-202432 |
QUALCOMM Europe Inc. - Italy | 38.905 16.3.0 CR#2641 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-202918 | Test Point analysis for FR2 Frequency Error for CA |
CR revision of R5-201457 |
NTT DOCOMO INC. | 38.905 16.3.0 CR#2391 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-202952 | Updating TP of MOP for intra-band contiguous EN-DC |
CR revision of R5-201856 |
Huawei, HiSilicon | 38.905 16.3.0 CR#2511 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-202953 | Updating TP of MOP for intra-band non-contiguous EN-DC |
CR revision of R5-201857 |
Huawei, HiSilicon | 38.905 16.3.0 CR#2521 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-202954 | Combined TP analysis for MPR, NR ACLR and SEM FR1 test cases |
CR revision of R5-201930 |
Ericsson, Keysight Technologies, Huawei, CAICT | 38.905 16.3.0 CR#2591 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-202955 | Updated TP analysis for 7.3A Reference sensitivity for CA |
CR revision of R5-202376 |
Ericsson, WE Certification, DISH | 38.905 16.3.0 CR#2631 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
34 documents (0.34271311759949 seconds)