Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-214244 | Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_1A_n28A |
CR revised to R5-216014 |
Ericsson, Orange | 38.905 17.1.0 CR#430 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-214245 | Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_1A_n77A | CR | Ericsson | 38.905 17.1.0 CR#431 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214246 | Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_1A_n79A | CR | Ericsson | 38.905 17.1.0 CR#432 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214247 | Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_3A_n28A | CR | Ericsson, Orange | 38.905 17.1.0 CR#433 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214248 | Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_3A_n77A | CR | Ericsson | 38.905 17.1.0 CR#434 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214249 | Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_7A_n28A | CR | Ericsson, Orange | 38.905 17.1.0 CR#435 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214250 | Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_19A_n77A | CR | Ericsson | 38.905 17.1.0 CR#436 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214251 | Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_19A_n78A | CR | Ericsson | 38.905 17.1.0 CR#437 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214252 | Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_19A_n79A | CR | Ericsson | 38.905 17.1.0 CR#438 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214253 | Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_20A_n28A | CR | Ericsson, Orange | 38.905 17.1.0 CR#439 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214254 | Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_20A_n78A |
CR revised to R5-215919 |
Ericsson, Huawei, HiSilicon | 38.905 17.1.0 CR#440 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-214255 | Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_21A_n77A | CR | Ericsson | 38.905 17.1.0 CR#441 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214256 | Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_21A_n78A | CR | Ericsson | 38.905 17.1.0 CR#442 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214257 | Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_21A_n79A | CR | Ericsson | 38.905 17.1.0 CR#443 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214258 | Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_28A_n77A | CR | Ericsson | 38.905 17.1.0 CR#444 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214259 | Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_28A_n78A | CR | Ericsson | 38.905 17.1.0 CR#445 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
withdrawn | [WTS] [JSN] |
| R5-214260 | Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_28A_n79A | CR | Ericsson | 38.905 17.1.0 CR#446 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214261 | Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_42A_n77A | CR | Ericsson | 38.905 17.1.0 CR#447 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214262 | Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_1A_n78A | CR | Ericsson | 38.905 17.1.0 CR#448 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214263 | Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_3A_n79A | CR | Ericsson | 38.905 17.1.0 CR#449 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214264 | Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_5A_n66A | CR | Ericsson | 38.905 17.1.0 CR#450 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214265 | Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_5A_n78A | CR | Ericsson | 38.905 17.1.0 CR#451 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214266 | Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_7A_n78A | CR | Ericsson, Orange | 38.905 17.1.0 CR#452 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214267 | Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n77A | CR | Ericsson | 38.905 17.1.0 CR#453 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214268 | Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n78A | CR | Ericsson | 38.905 17.1.0 CR#454 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214269 | Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n79A | CR | Ericsson | 38.905 17.1.0 CR#455 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214270 | Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_25A_n41A |
CR revised to R5-215920 |
Ericsson | 38.905 17.1.0 CR#456 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-214271 | Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n77A | CR | Ericsson | 38.905 17.1.0 CR#457 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214272 | Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n78A | CR | Ericsson | 38.905 17.1.0 CR#458 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214273 | Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_39A_n79A | CR | Ericsson | 38.905 17.1.0 CR#459 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214274 | Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_41A_n77A | CR | Ericsson | 38.905 17.1.0 CR#460 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214275 | Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_41A_n78A | CR | Ericsson | 38.905 17.1.0 CR#461 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214276 | Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_41A_n79A | CR | Ericsson | 38.905 17.1.0 CR#462 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214277 | Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_66A_n5A | CR | Ericsson | 38.905 17.1.0 CR#463 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214278 | Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_66A_n78A | CR | Ericsson | 38.905 17.1.0 CR#464 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214385 | Introduction of NR FR2 Test Points For Aggregate power tolerance for CA | CR | 3in | 38.905 17.1.0 CR#467 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214907 | Introduction of test point analysis for FR2 Time alignment error for UL MIMO test case | CR | TTA | 38.905 17.1.0 CR#469 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-215059 | Addition of TP analysis for spurious emissions for DC_20A_n78A | CR | Huawei, HiSilicon | 38.905 17.1.0 CR#470 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
withdrawn | [WTS] [JSN] |
| R5-215060 | Addition of TP analysis for spurious emissions for DC_28A_n78A |
CR revised to R5-215921 |
Huawei, HiSilicon, Ericsson | 38.905 17.1.0 CR#471 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-215064 | Addition of TP for REFSENS for inter-band EN-DC 2CC and 3CC combos |
CR revised to R5-216056 |
Huawei, HiSilicon | 38.905 17.1.0 CR#472 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-215164 | Addition of test points analysis for NS_06 power class 1 test cases | CR | Ericsson | 38.905 17.1.0 CR#475 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-215229 | Correction to TP analysis for in-band emission for intra-band contiguous EN-DC | CR | Huawei, HiSilicon | 38.905 17.1.0 CR#483 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-215236 | Addition of reference sensitivity TP analysis for DC_1A_n28A-n78A | CR | Huawei, HiSilicon | 38.905 17.1.0 CR#484 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-215237 | Addition of reference sensitivity TP analysis for DC_1A-3A_n28A | CR | Huawei, HiSilicon | 38.905 17.1.0 CR#485 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-215238 | Addition of reference sensitivity TP analysis for DC_1A-7A_n28A | CR | Huawei, HiSilicon | 38.905 17.1.0 CR#486 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-215239 | Addition of reference sensitivity TP analysis for DC_3A-7A_n28A | CR | Huawei, HiSilicon | 38.905 17.1.0 CR#487 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-215258 | Correction to TP analysis for reference sensitivity per EN-DC configuration |
CR revised to R5-216057 |
Huawei, HiSilicon | 38.905 17.1.0 CR#488 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-215259 | Correction to Annex D Principles for test point selection for EN-DC reference sensitivity test cases |
CR revised to R5-216058 |
Huawei, HiSilicon | 38.905 17.1.0 CR#489 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-215289 | Updating Test point analysis for DC_3A_n28A-n78A |
CR revised to R5-216059 |
Huawei, Hisilicon | 38.905 17.1.0 CR#490 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-215291 | Updating Test point analysis for DC_7A_n28A-n78A |
CR revised to R5-216060 |
Huawei, Hisilicon | 38.905 17.1.0 CR#491 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-215293 | Updating Test point analysis for DC_3A-20A_n28A | CR | Huawei, Hisilicon | 38.905 17.1.0 CR#492 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-215295 | Updating Test point analysis for DC_7A-20A_n28A |
CR revised to R5-216061 |
Huawei, Hisilicon | 38.905 17.1.0 CR#493 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-215327 | TP analysis for FR2 General ON OFF time mask | CR | Anritsu | 38.905 17.1.0 CR#498 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-215336 | Correction to TP analysis for FR1 A-SPR with NS_17 | CR | Anritsu | 38.905 17.1.0 CR#499 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-215536 | Defining TP analysis for MPR, SEM and ACLR for FR2 UL MIMO |
CR revised to R5-216062 |
Keysight technologies UK Ltd, Sporton | 38.905 17.1.0 CR#501 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-215547 | Update_TP_analysis for Rel_15_DC_2A_n71A | CR | Qualcomm Austria RFFE GmbH | 38.905 17.1.0 CR#504 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-215550 | Update_TP_analysis for Rel_15_DC_66A_n71A | CR | Qualcomm Austria RFFE GmbH | 38.905 17.1.0 CR#505 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-215569 | TP analysis for DC_48A_n66A | CR | Qualcomm Austria RFFE GmbH | 38.521-3 17.1.0 CR#1172 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
withdrawn | [WTS] [JSN] |
| R5-215919 | Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_20A_n78A |
CR revision of R5-214254 |
Ericsson, Huawei, HiSilicon | 38.905 17.1.0 CR#4401 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-215920 | Update of spurious emission TP analysis for Rel-15 EN-DC configuration DC_25A_n41A |
CR revision of R5-214270 |
Ericsson | 38.905 17.1.0 CR#4561 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-215921 | Addition of TP analysis for spurious emissions for DC_28A_n78A |
CR revision of R5-215060 |
Huawei, HiSilicon, Ericsson | 38.905 17.1.0 CR#4711 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-216014 | Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_1A_n28A |
CR revision of R5-214244 |
Ericsson, Orange | 38.905 17.1.0 CR#4301 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-216056 | Addition of TP for REFSENS for inter-band EN-DC 2CC and 3CC combos |
CR revision of R5-215064 |
Huawei, HiSilicon | 38.905 17.1.0 CR#4721 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-216057 | Correction to TP analysis for reference sensitivity per EN-DC configuration |
CR revision of R5-215258 |
Huawei, HiSilicon | 38.905 17.1.0 CR#4881 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-216058 | Correction to Annex D Principles for test point selection for EN-DC reference sensitivity test cases |
CR revision of R5-215259 |
Huawei, HiSilicon | 38.905 17.1.0 CR#4891 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-216059 | Updating Test point analysis for DC_3A_n28A-n78A |
CR revision of R5-215289 |
Huawei, Hisilicon | 38.905 17.1.0 CR#4901 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-216060 | Updating Test point analysis for DC_7A_n28A-n78A |
CR revision of R5-215291 |
Huawei, Hisilicon | 38.905 17.1.0 CR#4911 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-216061 | Updating Test point analysis for DC_7A-20A_n28A |
CR revision of R5-215295 |
Huawei, Hisilicon | 38.905 17.1.0 CR#4931 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-216062 | Defining TP analysis for MPR, SEM and ACLR for FR2 UL MIMO |
CR revision of R5-215536 |
Keysight technologies UK Ltd, Sporton | 38.905 17.1.0 CR#5011 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-92-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
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