Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-212184 | Update TP analysis for EN-DC 6.5B.3.3.1 | CR | Guangdong OPPO Mobile Telecom. | 38.905 16.7.0 CR#395 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-91-e AI: 5.3.2.16 |
withdrawn | [WTS] [JSN] |
| R5-212518 | Introduction of test point analysis for FR2 CA Error Vector Magnitude test case |
CR revised to R5-213946 |
TTA | 38.905 17.0.0 CR#396 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-212519 | Update of test point analysis for FR2 Occupied Bandwidth for UL MIMO test case | CR | TTA | 38.905 17.0.0 CR#397 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-212524 | Spurious emission TP analysis for Rel-15 EN-DC configuration DC_66A_n71A | CR | QUALCOMM Europe Inc. - Italy | 38.905 17.0.0 CR#400 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-212525 | Spurious emission TP analysis for Rel-15 EN-DC configuration DC_2A_n71A |
CR revised to R5-213947 |
QUALCOMM Europe Inc. - Italy | 38.905 17.0.0 CR#401 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-212623 | Correction of power control in 38.905 |
CR revised to R5-214070 |
Anritsu | 38.905 17.0.0 CR#402 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-212669 | Addition of test points analysis for NS_06 FR1 test cases |
CR revised to R5-213948 |
Ericsson, AT&T | 38.905 17.0.0 CR#403 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-212916 | Addition of TP analysis of A-MPR NS_10 | CR | Huawei, HiSilicon | 38.905 17.0.0 CR#404 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
withdrawn | [WTS] [JSN] |
| R5-213024 | Correction to test points selection for intra-band EN-DC spurious emissions testing | CR | Huawei, HiSilicon | 38.905 17.0.0 CR#411 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-213025 | Correction to test points selection for inter-band EN-DC general spurious emissions testing |
CR revised to R5-214093 |
Huawei, HiSilicon, OPPO | 38.905 17.0.0 CR#412 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-213026 | Correction to test points selection for inter-band EN-DC co-existence spurious emissions testing |
CR revised to R5-213949 |
Huawei, HiSilicon | 38.905 17.0.0 CR#413 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-213031 | Update of TP analysis for general spurious emissions for DC_3A_n7A |
CR revised to R5-213950 |
Huawei, HiSilicon | 38.905 17.0.0 CR#414 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-213032 | Update of TP analysis for general spurious emissions for DC_3A_n78A |
CR revised to R5-213951 |
Huawei, HiSilicon | 38.905 17.0.0 CR#415 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-213033 | Update of TP analysis for general spurious emissions for DC_8A_n77A |
CR revised to R5-213952 |
Huawei, HiSilicon | 38.905 17.0.0 CR#416 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-213034 | Update of TP analysis for general spurious emissions for DC_12A_n66A |
CR revised to R5-213953 |
Huawei, HiSilicon | 38.905 17.0.0 CR#417 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-213035 | Update of TP analysis for general spurious emissions for DC_26A_n41A |
CR revised to R5-213954 |
Huawei, HiSilicon | 38.905 17.0.0 CR#418 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-213036 | Update of TP analysis for general spurious emissions for DC_26A_n79A |
CR revised to R5-213955 |
Huawei, HiSilicon | 38.905 17.0.0 CR#419 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-213037 | Update of TP analysis for general spurious emissions for DC_30A_n5A |
CR revised to R5-213956 |
Huawei, HiSilicon | 38.905 17.0.0 CR#420 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-213081 | Update of test point analysis for FR2 MPR SEM and ACLR UL-MIMO test cases |
CR revised to R5-213957 |
Sporton | 38.905 17.0.0 CR#422 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-213086 | TP analysis for DC_11A_n77A |
CR revised to R5-213958 |
Ericsson | 38.905 16.7.0 CR#423 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-91-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-213087 | TP analysis for DC_11A_n78A |
CR revised to R5-213959 |
Ericsson | 38.905 16.7.0 CR#424 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-91-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-213088 | TP analysis for DC_25A_n41A |
CR revised to R5-213960 |
Ericsson | 38.905 16.7.0 CR#425 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-91-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-213089 | TP analysis for DC_42A_n77A |
CR revised to R5-213961 |
Ericsson | 38.905 16.7.0 CR#426 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-91-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-213093 | General TP analysis update for NR CA refsens |
CR revised to R5-213962 |
Ericsson | 38.905 16.7.0 CR#427 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-91-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-213114 | Correction of test coverage clause numbering | CR | Ericsson | 38.905 17.0.0 CR#428 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-213302 | Test Point analysis for FR2 Tx spurious emission CA test case |
CR revised to R5-214071 |
QUALCOMM JAPAN LLC. | 38.905 16.7.0 CR#429 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-91-e AI: 5.3.2.16 |
revised | [WTS] [JSN] |
| R5-213946 | Introduction of test point analysis for FR2 CA Error Vector Magnitude test case |
CR revision of R5-212518 |
TTA | 38.905 17.0.0 CR#3961 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-213947 | Spurious emission TP analysis for Rel-15 EN-DC configuration DC_2A_n71A |
CR revision of R5-212525 |
QUALCOMM Europe Inc. - Italy | 38.905 17.0.0 CR#4011 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-213948 | Addition of test points analysis for NS_06 FR1 test cases |
CR revision of R5-212669 |
Ericsson, AT&T | 38.905 17.0.0 CR#4031 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-213949 | Correction to test points selection for inter-band EN-DC co-existence spurious emissions testing |
CR revision of R5-213026 |
Huawei, HiSilicon | 38.905 17.0.0 CR#4131 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-213950 | Update of TP analysis for general spurious emissions for DC_3A_n7A |
CR revision of R5-213031 |
Huawei, HiSilicon | 38.905 17.0.0 CR#4141 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-213951 | Update of TP analysis for general spurious emissions for DC_3A_n78A |
CR revision of R5-213032 |
Huawei, HiSilicon | 38.905 17.0.0 CR#4151 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-213952 | Update of TP analysis for general spurious emissions for DC_8A_n77A |
CR revision of R5-213033 |
Huawei, HiSilicon | 38.905 17.0.0 CR#4161 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-213953 | Update of TP analysis for general spurious emissions for DC_12A_n66A |
CR revision of R5-213034 |
Huawei, HiSilicon | 38.905 17.0.0 CR#4171 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-213954 | Update of TP analysis for general spurious emissions for DC_26A_n41A |
CR revision of R5-213035 |
Huawei, HiSilicon | 38.905 17.0.0 CR#4181 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-213955 | Update of TP analysis for general spurious emissions for DC_26A_n79A |
CR revision of R5-213036 |
Huawei, HiSilicon | 38.905 17.0.0 CR#4191 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-213956 | Update of TP analysis for general spurious emissions for DC_30A_n5A |
CR revision of R5-213037 |
Huawei, HiSilicon | 38.905 17.0.0 CR#4201 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-213957 | Update of test point analysis for FR2 MPR SEM and ACLR UL-MIMO test cases |
CR revision of R5-213081 |
Sporton | 38.905 17.0.0 CR#4221 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-213958 | TP analysis for DC_11A_n77A |
CR revision of R5-213086 |
Ericsson | 38.905 17.0.0 CR#4231 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-213959 | TP analysis for DC_11A_n78A |
CR revision of R5-213087 |
Ericsson | 38.905 17.0.0 CR#4241 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-213960 | TP analysis for DC_25A_n41A |
CR revision of R5-213088 |
Ericsson | 38.905 17.0.0 CR#4251 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-213961 | TP analysis for DC_42A_n77A |
CR revision of R5-213089 |
Ericsson | 38.905 17.0.0 CR#4261 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-213962 | General TP analysis update for NR CA refsens |
CR revision of R5-213093 |
Ericsson | 38.905 17.0.0 CR#4271 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214070 | Correction of power control in 38.905 |
CR revision of R5-212623 |
Anritsu | 38.905 17.0.0 CR#4021 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214071 | Test Point analysis for FR2 Tx spurious emission CA test case |
CR revision of R5-213302 |
QUALCOMM JAPAN LLC. | 38.905 17.0.0 CR#4291 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
| R5-214093 | Correction to test points selection for inter-band EN-DC general spurious emissions testing |
CR revision of R5-213025 |
Huawei, HiSilicon, OPPO | 38.905 17.0.0 CR#4121 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-91-e AI: 5.3.2.16 |
agreed | [WTS] [JSN] |
46 documents (0.34723806381226 seconds)