Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".

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tdoc Title Type / Revs Source Spec / CR S/WID Release Meeting Status Links
R5-210090 Updated TP analysis for 7.3B Reference sensitivity for EN-DC in FR1 CR

revised to R5-211733

 Nokia, Nokia Shanghai Bell 38.905 16.6.0 CR#340 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-210309 TP analysis for 38.521-3 test case 6.5B.2.2.1 SEM Intra-band non-contiguous CR

revised to R5-211734

 Keysight Technologies UK Ltd 38.905 16.6.0 CR#341 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-210310 TP analysis for 38.521-3 test case 6.5B.2.2.3 ACLR Intra-band non-contiguous CR

revised to R5-211735

 Keysight Technologies UK Ltd 38.905 16.6.0 CR#342 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-210512 Introduction of test point analysis for SA FR2 7.4A Maximum input level for CA CR CAICT 38.905 16.6.0 CR#344 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-210544 Update of test point analysis for FR2 UL CA frequency error test cases CR

revised to R5-211736

 Keysight Technologies UK Ltd 38.905 16.6.0 CR#345 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-210546 Update of test point analysis for FR2 MPR, SEM and ACLR test cases CR

revised to R5-211893

 Keysight Technologies UK Ltd, Ericsson, CAICT 38.905 16.6.0 CR#346 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-210900 Updating TP analysis for Spurious Emissions for CA in FR1 CR Huawei, Hisilicon 38.905 16.6.0 CR#354 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-210901 Updating test point analysis for FR1 REFSENS for CA test case CR

revised to R5-211606

 Huawei, Hisilicon 38.905 16.6.0 CR#355 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-210905 Updating TP analysis for FR1 REFSENS for SUL testing CR Huawei, Hisilicon 38.905 16.6.0 CR#356 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-210941 Addition of reference sensitivity test point analyses for FR1 NR CA and EN-DC CR

revised to R5-211894

 Ericsson, Huawei, Hisilicon 38.905 16.6.0 CR#359 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-210942 Moving of principles for reference sensitivity test point selection from attachments to annexes CR

revised to R5-211895

 Ericsson 38.905 16.6.0 CR#360 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-211064 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_8A_n77A CR

revised to R5-211737

 Ericsson 38.905 16.6.0 CR#369 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-211065 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n77A CR

revised to R5-211738

 Ericsson 38.905 16.6.0 CR#370 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-211066 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n78A CR

revised to R5-211739

 Ericsson 38.905 16.6.0 CR#371 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-211067 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n79A CR

revised to R5-211740

 Ericsson 38.905 16.6.0 CR#372 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-211068 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_25A_n41A CR

revised to R5-211741

 Ericsson 38.905 16.6.0 CR#373 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-211069 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n41A CR

revised to R5-211742

 Ericsson 38.905 16.6.0 CR#374 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-211070 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n77A CR

revised to R5-211743

 Ericsson 38.905 16.6.0 CR#375 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-211071 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n78A CR

revised to R5-211744

 Ericsson 38.905 16.6.0 CR#376 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-211072 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n79A CR

revised to R5-211745

 Ericsson 38.905 16.6.0 CR#377 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-211073 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_41A_n77A CR

revised to R5-211746

 Ericsson 38.905 16.6.0 CR#378 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-211074 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_41A_n78A CR

revised to R5-211747

 Ericsson 38.905 16.6.0 CR#379 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-211136 TP analysis update for EN_DC refsens CR

revised to R5-211896

 Ericsson 38.905 16.6.0 CR#381 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-211140 TP analysis for DC_8A_n77A CR

revised to R5-211897

 Ericsson 38.905 16.6.0 CR#382 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-211142 TP analysis for DC_11A_n79A CR

revised to R5-211898

 Ericsson 38.905 16.6.0 CR#383 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-211144 TP analysis for DC_26A_n41A CR

revised to R5-211899

 Ericsson 38.905 16.6.0 CR#384 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-211146 TP analysis for DC_26A_n77A and DC_26A_n78A CR

revised to R5-211900

 Ericsson 38.905 16.6.0 CR#385 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-211148 TP analysis for DC_26A_n79A CR

revised to R5-211901

 Ericsson 38.905 16.6.0 CR#386 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-211150 TP analysis for DC_41A_n77A and DC_41A_n78A CR

revised to R5-211902

 Ericsson 38.905 16.6.0 CR#387 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-211228 Test Point analysis update for FR2 Tx additional spurious emission test case CR

revised to R5-211748

 Qualcomm Finland RFFE Oy 38.905 16.6.0 CR#388 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-211606 Updating test point analysis for FR1 REFSENS for CA test case CR

revision of R5-210901

 Huawei, Hisilicon 38.905 16.6.0 CR#3551 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 withdrawn [WTS] [JSN]
R5-211733 Updated TP analysis for 7.3B Reference sensitivity for EN-DC in FR1 CR

revision of R5-210090

 Nokia, Nokia Shanghai Bell 38.905 16.6.0 CR#3401 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-211734 TP analysis for 38.521-3 test case 6.5B.2.2.1 SEM Intra-band non-contiguous CR

revision of R5-210309

 Keysight Technologies UK Ltd 38.905 16.6.0 CR#3411 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-211735 TP analysis for 38.521-3 test case 6.5B.2.2.3 ACLR Intra-band non-contiguous CR

revision of R5-210310

 Keysight Technologies UK Ltd 38.905 16.6.0 CR#3421 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-211736 Update of test point analysis for FR2 UL CA frequency error test cases CR

revision of R5-210544

 Keysight Technologies UK Ltd 38.905 16.6.0 CR#3451 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-211737 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_8A_n77A CR

revision of R5-211064

 Ericsson 38.905 16.6.0 CR#3691 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-211738 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n77A CR

revision of R5-211065

 Ericsson 38.905 16.6.0 CR#3701 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-211739 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n78A CR

revision of R5-211066

 Ericsson 38.905 16.6.0 CR#3711 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-211740 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n79A CR

revision of R5-211067

 Ericsson 38.905 16.6.0 CR#3721 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-211741 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_25A_n41A CR

revision of R5-211068

 Ericsson 38.905 16.6.0 CR#3731 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-211742 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n41A CR

revision of R5-211069

 Ericsson 38.905 16.6.0 CR#3741 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-211743 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n77A CR

revision of R5-211070

 Ericsson 38.905 16.6.0 CR#3751 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-211744 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n78A CR

revision of R5-211071

 Ericsson 38.905 16.6.0 CR#3761 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-211745 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n79A CR

revision of R5-211072

 Ericsson 38.905 16.6.0 CR#3771 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-211746 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_41A_n77A CR

revision of R5-211073

 Ericsson 38.905 16.6.0 CR#3781 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-211747 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_41A_n78A CR

revision of R5-211074

 Ericsson 38.905 16.6.0 CR#3791 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-211748 Test Point analysis update for FR2 Tx additional spurious emission test case CR

revision of R5-211228

 Qualcomm Finland RFFE Oy 38.905 16.6.0 CR#3881 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-211893 Update of test point analysis for FR2 MPR, SEM and ACLR test cases CR

revision of R5-210546

 Keysight Technologies UK Ltd, Ericsson, CAICT 38.905 16.6.0 CR#3461 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-211894 Addition of reference sensitivity test point analyses for FR1 NR CA and EN-DC CR

revision of R5-210941

 Ericsson, Huawei, Hisilicon 38.905 16.6.0 CR#3591 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-211895 Moving of principles for reference sensitivity test point selection from attachments to annexes CR

revision of R5-210942

 Ericsson 38.905 16.6.0 CR#3601 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-211896 TP analysis update for EN_DC refsens CR

revision of R5-211136

 Ericsson 38.905 16.6.0 CR#3811 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 withdrawn [WTS] [JSN]
R5-211897 TP analysis for DC_8A_n77A CR

revision of R5-211140

 Ericsson 38.905 16.6.0 CR#3821 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-211898 TP analysis for DC_11A_n79A CR

revision of R5-211142

 Ericsson 38.905 16.6.0 CR#3831 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-211899 TP analysis for DC_26A_n41A CR

revision of R5-211144

 Ericsson 38.905 16.6.0 CR#3841 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-211900 TP analysis for DC_26A_n77A and DC_26A_n78A CR

revision of R5-211146

 Ericsson 38.905 16.6.0 CR#3851 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-211901 TP analysis for DC_26A_n79A CR

revision of R5-211148

 Ericsson 38.905 16.6.0 CR#3861 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-211902 TP analysis for DC_41A_n77A and DC_41A_n78A CR

revision of R5-211150

 Ericsson 38.905 16.6.0 CR#3871 catF 5GS_NR_LTE-UEConTest Rel-16 R5-90-e

AI: 5.3.2.16

 agreed [WTS] [JSN]

57 documents (0.33482313156128 seconds)