Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".

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tdoc Title Type / Revs Source Spec / CR S/WID Release Meeting Status Links
R5-205570 Restructuring of TR 38.905. CR

revised to R5-206873

 Ericsson 38.905 16.5.0 CR#310 catF 5GS_NR_LTE-UEConTest Rel-16 R5-89-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-205572 Combined TP analysis for FR2 test cases MPR, ACLR and SEM CR

revised to R5-206874

 Ericsson 38.905 16.5.0 CR#311 catF 5GS_NR_LTE-UEConTest Rel-16 R5-89-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-205619 Addition of TP Analysis for TC 6.5A.2.1 Spectrum Emission Mask for CA in FR2 CR KTL, NTT DOCOMO INC. 38.905 16.5.0 CR#312 catF 5GS_NR_LTE-UEConTest Rel-16 R5-89-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-205630 Addition of TP Analysis for TC 6.5A.2.2 Adjacent channel leakage ratio for CA in FR2 CR KTL, NTT DOCOMO INC. 38.905 16.5.0 CR#313 catF 5GS_NR_LTE-UEConTest Rel-16 R5-89-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-205780 Addition of test point analysis for DC_2A_n5A in Tx spurious emissions cases CR Huawei, HiSilicon 38.905 16.5.0 CR#318 catF 5GS_NR_LTE-UEConTest Rel-16 R5-89-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-205781 Addition of test point analysis for DC_8A_n78A in Tx spurious emissions cases CR Huawei, HiSilicon 38.905 16.5.0 CR#319 catF 5GS_NR_LTE-UEConTest Rel-16 R5-89-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-205782 Addition of test point analysis for DC_12A_n66A in Tx spurious emissions cases CR Huawei, HiSilicon 38.905 16.5.0 CR#320 catF 5GS_NR_LTE-UEConTest Rel-16 R5-89-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-205783 Addition of test point analysis for DC_30A_n5A in Tx spurious emissions cases CR Huawei, HiSilicon 38.905 16.5.0 CR#321 catF 5GS_NR_LTE-UEConTest Rel-16 R5-89-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-205885 Addition of test point analysis for A-MPR NS_46 CR Huawei, HiSilicon 38.905 16.5.0 CR#329 catF 5GS_NR_LTE-UEConTest Rel-16 R5-89-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-205992 Updated TP analysis for 7.3B Reference sensitivity for EN-DC in FR1 CR

revised to R5-206917

 Ericsson 38.905 16.5.0 CR#330 catF 5GS_NR_LTE-UEConTest Rel-16 R5-89-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-206010 Update of TPA for in-band emission and carrier leakage TCs CR

revised to R5-206875

 ROHDE & SCHWARZ 38.905 16.5.0 CR#331 catF 5GS_NR_LTE-UEConTest Rel-16 R5-89-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-206207 Update of test point analysis for occupied bandwidth in FR2 CR

revised to R5-206876

 ROHDE & SCHWARZ 38.905 16.5.0 CR#336 catF 5GS_NR_LTE-UEConTest Rel-16 R5-89-e

AI: 5.3.2.16

 revised [WTS] [JSN]
R5-206873 Restructuring of TR 38.905. CR

revision of R5-205570

 Ericsson 38.905 16.5.0 CR#3101 catF 5GS_NR_LTE-UEConTest Rel-16 R5-89-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-206874 Combined TP analysis for FR2 test cases MPR, ACLR and SEM CR

revision of R5-205572

 Ericsson 38.905 16.5.0 CR#3111 catF 5GS_NR_LTE-UEConTest Rel-16 R5-89-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-206875 Update of TPA for in-band emission and carrier leakage TCs CR

revision of R5-206010

 ROHDE & SCHWARZ 38.905 16.5.0 CR#3311 catF 5GS_NR_LTE-UEConTest Rel-16 R5-89-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-206876 Update of test point analysis for occupied bandwidth in FR2 CR

revision of R5-206207

 ROHDE & SCHWARZ 38.905 16.5.0 CR#3361 catF 5GS_NR_LTE-UEConTest Rel-16 R5-89-e

AI: 5.3.2.16

 agreed [WTS] [JSN]
R5-206917 Updated TP analysis for 7.3B Reference sensitivity for EN-DC in FR1 CR

revision of R5-205992

 Ericsson 38.905 16.5.0 CR#3301 catF 5GS_NR_LTE-UEConTest Rel-16 R5-89-e

AI: 5.3.2.16

 agreed [WTS] [JSN]

17 documents (0.33634400367737 seconds)