Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
Download results in JSON format
| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-201606 | MU contributors for RRM FR2 TC 7.7.1.1 |
CR revised to R5-202915 |
ROHDE & SCHWARZ | 38.903 16.3.0 CR#117 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.15 |
revised | [WTS] [JSN] |
| R5-201662 | FR1 Test tolerance analysis for interruptions deactivated E-UTRAN SCC | CR | Huawei, HiSilicon | 38.903 16.3.0 CR#118 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-201663 | FR1 Test tolerance analysis for SCell activation |
CR revised to R5-203094 |
Huawei, HiSilicon | 38.903 16.3.0 CR#119 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.15 |
revised | [WTS] [JSN] |
| R5-201664 | FR1 Test tolerance analysis for SSB based BFR | CR | Huawei, HiSilicon | 38.903 16.3.0 CR#120 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.15 |
withdrawn | [WTS] [JSN] |
| R5-201665 | FR1 Test tolerance analysis for CSI-RS based BFR | CR | Huawei, HiSilicon | 38.903 16.3.0 CR#121 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.15 |
withdrawn | [WTS] [JSN] |
| R5-201713 | FR2 TT analysis for 38.533 5.7.1.1+7.7.1.1 Intra-freq SS-RSRP | discussion | ANRITSU LTD | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-38102 AI: 5.3.2.15 |
noted | [WTS] [JSN] | |
| R5-201714 | FR2 TT analysis for 38.533 5.7.1.2+7.7.1.2 Inter-freq SS-RSRP | discussion | ANRITSU LTD | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-38102 AI: 5.3.2.15 |
noted | [WTS] [JSN] | |
| R5-201716 | Addition of Test Tolerance analysis for FR2 Tx Timing Test cases |
CR revised to R5-202876 |
ANRITSU LTD | 38.903 16.3.0 CR#122 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.15 |
revised | [WTS] [JSN] |
| R5-202085 | Addition of Quiet Zone size above 30cm to TR 38.903 | CR | ROHDE & SCHWARZ | 38.903 16.3.0 CR#123 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.15 |
not pursued | [WTS] [JSN] |
| R5-202104 | Test tolerance correction for event triggered measurement test cases | CR | Ericsson | 38.903 16.3.0 CR#124 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-202105 | Test tolerance correction for CSI-RS-based L1-RSRP measurement test cases | CR | Ericsson | 38.903 16.3.0 CR#125 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-202125 | CR to 38.903 to introduce PC1 MU Tables |
CR revised to R5-202916 |
Keysight Technologies UK Ltd | 38.903 16.3.0 CR#126 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.15 |
revised | [WTS] [JSN] |
| R5-202128 | CR to 38.903 to introduce baseline Demod MU tables |
CR revised to R5-202769 |
Keysight Technologies UK Ltd | 38.903 16.3.0 CR#127 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.15 |
revised | [WTS] [JSN] |
| R5-202279 | Update to FR2 Measurement Uncertainties |
CR revised to R5-202917 |
Anritsu | 38.903 16.3.0 CR#128 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.15 |
revised | [WTS] [JSN] |
| R5-202384 | Addition of EIRP to Transmit OFF power MU analysis |
CR revised to R5-202938 |
Samsung R&D Institute UK | 38.903 16.3.0 CR#129 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.15 |
revised | [WTS] [JSN] |
| R5-202391 | Test Tolerance analysis TC 4.5.4 and 6.5.4 RRC reconfiguration delay |
CR revised to R5-202702 |
Samsung R&D Institute UK | 38.903 16.3.0 CR#130 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.15 |
revised | [WTS] [JSN] |
| R5-202702 | Test Tolerance analysis TC 4.5.4 and 6.5.4 RRC reconfiguration delay |
CR revision of R5-202391 |
Samsung R&D Institute UK | 38.903 16.3.0 CR#1301 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-202769 | CR to 38.903 to introduce baseline Demod MU tables |
CR revision of R5-202128 |
Keysight Technologies UK Ltd | 38.903 16.3.0 CR#1271 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-202876 | Addition of Test Tolerance analysis for FR2 Tx Timing Test cases |
CR revision of R5-201716 |
ANRITSU LTD | 38.903 16.3.0 CR#1221 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.15 |
withdrawn | [WTS] [JSN] |
| R5-202915 | MU contributors for RRM FR2 TC 7.7.1.1 |
CR revision of R5-201606 |
ROHDE & SCHWARZ | 38.903 16.3.0 CR#1171 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-202916 | CR to 38.903 to introduce PC1 MU Tables |
CR revision of R5-202125 |
Keysight Technologies UK Ltd | 38.903 16.3.0 CR#1261 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-202917 | Update to FR2 Measurement Uncertainties |
CR revision of R5-202279 |
Anritsu | 38.903 16.3.0 CR#1281 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-202938 | Addition of EIRP to Transmit OFF power MU analysis |
CR revision of R5-202384 |
Samsung R&D Institute UK | 38.903 16.3.0 CR#1291 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-203094 | FR1 Test tolerance analysis for SCell activation |
CR revision of R5-201663 |
Huawei, HiSilicon | 38.903 16.3.0 CR#1191 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-38102 AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
24 documents (0.3412880897522 seconds)