Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
Download results in JSON format
| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-200163 | Add Annex A.2 handling of common Test Tolerance Topics for FR2 | CR | ANRITSU LTD | 38.903 16.2.0 CR#107 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-200272 | Test tolerance analysis inter-frequency SS-RSRP and intra-frequency SS-SINR |
CR revised to R5-201037 |
ROHDE & SCHWARZ | 38.903 16.2.0 CR#108 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.15 |
revised | [WTS] [JSN] |
| R5-200273 | Test tolerance analysis SS-RSRQ and inter-frequency SS-SINR |
CR revised to R5-201038 |
ROHDE & SCHWARZ | 38.903 16.2.0 CR#109 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.15 |
revised | [WTS] [JSN] |
| R5-200303 | Test Tolerance analysis for CSI-RS-Based L1-RSRP measurement test cases |
CR revised to R5-201042 |
Ericsson | 38.903 16.2.0 CR#110 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.15 |
revised | [WTS] [JSN] |
| R5-200304 | Test Tolerance analysis for SSB-Based L1-RSRP measurement test cases |
CR revised to R5-201043 |
Ericsson | 38.903 16.2.0 CR#111 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.15 |
revised | [WTS] [JSN] |
| R5-200329 | CR to 38.903 on XPD Verification | CR | Keysight Technologies UK Ltd | 38.903 16.2.0 CR#112 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-200335 | Addition of MU table for FR2 Demod test cases | CR | Qualcomm Technologies Int | 38.903 16.2.0 CR#113 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.15 |
withdrawn | [WTS] [JSN] |
| R5-200470 | FR1 Test tolerance analysis for interruptions deactivated NR SCC | CR | Huawei, HiSilicon | 38.903 16.2.0 CR#114 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-200471 | FR1 Test tolerance analysis for interruptions deactivated E-UTRAN SCC | CR | Huawei, HiSilicon | 38.903 16.2.0 CR#115 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.15 |
withdrawn | [WTS] [JSN] |
| R5-200744 | Update to FR2 TRx Measurement Uncertainties |
CR revised to R5-200918 |
Anritsu | 38.903 16.2.0 CR#116 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.15 |
revised | [WTS] [JSN] |
| R5-200918 | Update to FR2 TRx Measurement Uncertainties |
CR revision of R5-200744 |
Anritsu | 38.903 16.2.0 CR#1161 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-201037 | Test tolerance analysis inter-frequency SS-RSRP and intra-frequency SS-SINR |
CR revision of R5-200272 |
ROHDE & SCHWARZ | 38.903 16.2.0 CR#1081 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-201038 | Test tolerance analysis SS-RSRQ and inter-frequency SS-SINR |
CR revision of R5-200273 |
ROHDE & SCHWARZ | 38.903 16.2.0 CR#1091 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-201042 | Test Tolerance analysis for CSI-RS-Based L1-RSRP measurement test cases |
CR revision of R5-200303 |
Ericsson | 38.903 16.2.0 CR#1101 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-201043 | Test Tolerance analysis for SSB-Based L1-RSRP measurement test cases |
CR revision of R5-200304 |
Ericsson | 38.903 16.2.0 CR#1111 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-ah-34837 AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
15 documents (0.34623789787292 seconds)