Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".

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tdoc Title Type / Revs Source Spec / CR S/WID Release Meeting Status Links
R5-214189 TT analysis for RRM test cases 5.7.2.2 and 7.7.2.2 CR ROHDE & SCHWARZ 38.903 16.8.0 CR#240 catF 5GS_NR_LTE-UEConTest Rel-16 R5-92-e

AI: 5.3.2.15

agreed [WTS] [JSN]
R5-214190 TT analysis for RRM test cases 5.7.3.2 and 7.7.3.2 CR ROHDE & SCHWARZ 38.903 16.8.0 CR#241 catF 5GS_NR_LTE-UEConTest Rel-16 R5-92-e

AI: 5.3.2.15

agreed [WTS] [JSN]
R5-214204 Update of demod SNR testability CR

revised to R5-216102

ROHDE & SCHWARZ, Anritsu 38.903 16.8.0 CR#242 catF 5GS_NR_LTE-UEConTest Rel-16 R5-92-e

AI: 5.3.2.15

revised [WTS] [JSN]
R5-214713 Add Test Tolerance analyses for EN-DC FR2 interruptions at transitions between active and non-active during DRX Test cases CR

revised to R5-216103

Anritsu 38.903 16.8.0 CR#243 catF 5GS_NR_LTE-UEConTest Rel-16 R5-92-e

AI: 5.3.2.15

revised [WTS] [JSN]
R5-214848 Introducing EIRP UL Absolute Power MU for FR2 RRM CR

revised to R5-216104

Anritsu 38.903 16.8.0 CR#244 catF 5GS_NR_LTE-UEConTest Rel-16 R5-92-e

AI: 5.3.2.15

revised [WTS] [JSN]
R5-214849 Correction to MU for spurious emission band UE co-existence CR Anritsu 38.903 16.8.0 CR#245 catF 5GS_NR_LTE-UEConTest Rel-16 R5-92-e

AI: 5.3.2.15

withdrawn [WTS] [JSN]
R5-214854 Update of FR2 demod SNR range calculator CR Anritsu 38.903 16.8.0 CR#246 catF 5GS_NR_LTE-UEConTest Rel-16 R5-92-e

AI: 5.3.2.15

withdrawn [WTS] [JSN]
R5-214919 Update TT analysis for RRM test cases 5.7.1.2 and 7.7.1.2 CR ROHDE & SCHWARZ 38.903 16.8.0 CR#247 catF 5GS_NR_LTE-UEConTest Rel-16 R5-92-e

AI: 5.3.2.15

agreed [WTS] [JSN]
R5-215002 TT analysis for LTE SA TC 8.5.1.1-SFTD accuracy CR Huawei,Hisilicon 38.903 16.8.0 CR#248 catF 5GS_NR_LTE-UEConTest Rel-16 R5-92-e

AI: 5.3.2.15

agreed [WTS] [JSN]
R5-215320 Correction of power control in 38.903 CR

revised to R5-216105

Anritsu 38.903 16.8.0 CR#249 catF 5GS_NR_LTE-UEConTest Rel-16 R5-92-e

AI: 5.3.2.15

revised [WTS] [JSN]
R5-215330 Correction to MU for spurious emission band UE co-existence CR Anritsu 38.903 16.8.0 CR#250 catF 5GS_NR_LTE-UEConTest Rel-16 R5-92-e

AI: 5.3.2.15

agreed [WTS] [JSN]
R5-215432 Correction of Test Tolerance analysis for FR2 event triggered reporting in non-DRX test cases CR

revised to R5-216362

Ericsson 38.903 16.8.0 CR#251 catF 5GS_NR_LTE-UEConTest Rel-16 R5-92-e

AI: 5.3.2.15

revised [WTS] [JSN]
R5-215433 Correction of Test Tolerance analysis for FR2 event triggered reporting in DRX test cases CR Ericsson 38.903 16.8.0 CR#252 catF 5GS_NR_LTE-UEConTest Rel-16 R5-92-e

AI: 5.3.2.15

agreed [WTS] [JSN]
R5-215434 Test Tolerance analysis for FR2 SSB-based L1-RSRP measurement for beam reporting test cases CR

revised to R5-216363

Ericsson 38.903 16.8.0 CR#253 catF 5GS_NR_LTE-UEConTest Rel-16 R5-92-e

AI: 5.3.2.15

revised [WTS] [JSN]
R5-215478 MU for Tx modulation quality test cases CR

revised to R5-215815

ROHDE & SCHWARZ 38.903 16.8.0 CR#254 catF 5GS_NR_LTE-UEConTest Rel-16 R5-92-e

AI: 5.3.2.15

revised [WTS] [JSN]
R5-215582 Introduction of MTSU mapping related to Max Device Size CR

revised to R5-215834

Keysight Technologies UK Ltd 38.903 16.8.0 CR#255 catF 5GS_NR_LTE-UEConTest Rel-16 R5-92-e

AI: 5.3.2.15

revised [WTS] [JSN]
R5-215630 38.903 CR FR2 ETC MU updates for new ETC test cases CR

revised to R5-216117

Keysight technologies UK Ltd 38.903 16.8.0 CR#256 catF 5GS_NR_LTE-UEConTest Rel-16 R5-92-e

AI: 5.3.2.15

revised [WTS] [JSN]
R5-215815 MU for Tx modulation quality test cases CR

revision of R5-215478

ROHDE & SCHWARZ 38.903 16.8.0 CR#2541 catF 5GS_NR_LTE-UEConTest Rel-16 R5-92-e

AI: 5.3.2.15

withdrawn [WTS] [JSN]
R5-215834 Introduction of MTSU mapping related to Max Device Size CR

revision of R5-215582

Keysight Technologies UK Ltd 38.903 16.8.0 CR#2551 catF 5GS_NR_LTE-UEConTest Rel-16 R5-92-e

AI: 5.3.2.15

agreed [WTS] [JSN]
R5-216102 Update of demod SNR testability CR

revision of R5-214204

ROHDE & SCHWARZ, Anritsu 38.903 16.8.0 CR#2421 catF 5GS_NR_LTE-UEConTest Rel-16 R5-92-e

AI: 5.3.2.15

agreed [WTS] [JSN]
R5-216103 Add Test Tolerance analyses for EN-DC FR2 interruptions at transitions between active and non-active during DRX Test cases CR

revision of R5-214713

Anritsu 38.903 16.8.0 CR#2431 catF 5GS_NR_LTE-UEConTest Rel-16 R5-92-e

AI: 5.3.2.15

agreed [WTS] [JSN]
R5-216104 Introducing EIRP UL Absolute Power MU for FR2 RRM CR

revision of R5-214848

Anritsu 38.903 16.8.0 CR#2441 catF 5GS_NR_LTE-UEConTest Rel-16 R5-92-e

AI: 5.3.2.15

agreed [WTS] [JSN]
R5-216105 Correction of power control in 38.903 CR

revision of R5-215320

Anritsu 38.903 16.8.0 CR#2491 catF 5GS_NR_LTE-UEConTest Rel-16 R5-92-e

AI: 5.3.2.15

agreed [WTS] [JSN]
R5-216117 38.903 CR FR2 ETC MU updates for new ETC test cases CR

revision of R5-215630

Keysight technologies UK Ltd 38.903 16.8.0 CR#2561 catF 5GS_NR_LTE-UEConTest Rel-16 R5-92-e

AI: 5.3.2.15

agreed [WTS] [JSN]
R5-216362 Correction of Test Tolerance analysis for FR2 event triggered reporting in non-DRX test cases CR

revision of R5-215432

Ericsson 38.903 16.8.0 CR#2511 catF 5GS_NR_LTE-UEConTest Rel-16 R5-92-e

AI: 5.3.2.15

agreed [WTS] [JSN]
R5-216363 Test Tolerance analysis for FR2 SSB-based L1-RSRP measurement for beam reporting test cases CR

revision of R5-215434

Ericsson 38.903 16.8.0 CR#2531 catF 5GS_NR_LTE-UEConTest Rel-16 R5-92-e

AI: 5.3.2.15

agreed [WTS] [JSN]

26 documents (0.33356094360352 seconds)