Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-203231 | TT analysis for RRM TC 8.5.2.1.1.1 | CR | ROHDE & SCHWARZ | 38.903 16.4.0 CR#131 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-203232 | TT analysis for RRM TC 8.5.2.2.1 | CR | ROHDE & SCHWARZ | 38.903 16.4.0 CR#132 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-203233 | TT analysis for RRM TC 8.5.2.3.1 | CR | ROHDE & SCHWARZ | 38.903 16.4.0 CR#133 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-203237 | TT analysis for RRM TC 4.7.4.1.1 | CR | ROHDE & SCHWARZ | 38.903 16.4.0 CR#134 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-203238 | TT analysis for RRM TC 4.7.4.1.2 | CR | ROHDE & SCHWARZ | 38.903 16.4.0 CR#135 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-203239 | TT analysis for RRM TC 4.7.4.2.1 | CR | ROHDE & SCHWARZ | 38.903 16.4.0 CR#136 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
withdrawn | [WTS] [JSN] |
| R5-203240 | TT analysis for RRM TC 4.7.4.2.2 | CR | ROHDE & SCHWARZ | 38.903 16.4.0 CR#137 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
withdrawn | [WTS] [JSN] |
| R5-203305 | Correction to the extreme conditions in TT analysis of 4.7.1.2.1 |
CR revised to R5-204788 |
ROHDE & SCHWARZ | 38.903 16.4.0 CR#138 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
revised | [WTS] [JSN] |
| R5-203313 | CR to update the DL AWGN absolute power for RRM test cases |
CR revised to R5-204887 |
ROHDE & SCHWARZ | 38.903 16.4.0 CR#139 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
revised | [WTS] [JSN] |
| R5-203323 | Add Draft Test Tolerance analysis for FR2 Tx Timing Test cases | CR | ANRITSU LTD | 38.903 16.4.0 CR#140 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-203324 | Add Draft Test Tolerance analysis for FR2 Inter-freq Event-trig Test cases | CR | ANRITSU LTD | 38.903 16.4.0 CR#141 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-203325 | Add Draft Test Tolerance analysis for FR2 Intra-freq SS-RSRP Test case | CR | ANRITSU LTD | 38.903 16.4.0 CR#142 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-203486 | Adjacent Channel Selectivity FR2 MU definition in 38.903 |
CR revised to R5-204888 |
Keysight Technologies UK Ltd | 38.903 16.4.0 CR#143 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
revised | [WTS] [JSN] |
| R5-203490 | In-band Blocking FR2 MU definition in 38.903 |
CR revised to R5-204889 |
Keysight Technologies UK Ltd | 38.903 16.4.0 CR#144 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
revised | [WTS] [JSN] |
| R5-203821 | Addition of FR1 Test tolerance analysis for DCI based BWP switch |
CR revised to R5-205001 |
Huawei, HiSilicon | 38.903 16.4.0 CR#145 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
revised | [WTS] [JSN] |
| R5-203822 | Addition of FR1 Test tolerance analysis for RRC based BWP switch |
CR revised to R5-205002 |
Huawei, HiSilicon | 38.903 16.4.0 CR#146 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
revised | [WTS] [JSN] |
| R5-203823 | Addition of FR1 Test tolerance analysis for SSB based BFR |
CR revised to R5-205003 |
Huawei, HiSilicon | 38.903 16.4.0 CR#147 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
revised | [WTS] [JSN] |
| R5-203824 | Addition of FR1 Test tolerance analysis for CSI-RS based BFR |
CR revised to R5-205004 |
Huawei, HiSilicon | 38.903 16.4.0 CR#148 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
revised | [WTS] [JSN] |
| R5-203825 | Addition of FR1 Test tolerance analysis for 6.3.2.1.3 RRC Re-establishment | CR | Huawei, HiSilicon | 38.903 16.4.0 CR#149 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-203826 | Update of grouping of test cases in clause 8 | CR | Huawei, HiSilicon | 38.903 16.4.0 CR#150 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-204028 | CR to 38.903 on some of the Transmit OFF power MU parameters |
CR revised to R5-204945 |
Samsung R&D Institute UK | 38.903 16.4.0 CR#152 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
revised | [WTS] [JSN] |
| R5-204080 | CR to update MU in 38.903 |
CR revised to R5-204890 |
Anritsu, Keysight Technologies | 38.903 16.4.0 CR#153 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
revised | [WTS] [JSN] |
| R5-204190 | On Standard Deviation Definition in 38.903 | CR | Keysight Technologies UK Ltd | 38.903 16.4.0 CR#154 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-204257 | FR2 Minimum output power measurement uncertainty |
CR revised to R5-204891 |
Keysight Technologies UK Ltd | 38.903 16.4.0 CR#155 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
revised | [WTS] [JSN] |
| R5-204272 | Update of AWGN flatness in TR 38.903 |
CR revised to R5-204946 |
ROHDE & SCHWARZ | 38.903 16.4.0 CR#156 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
revised | [WTS] [JSN] |
| R5-204281 | FR2 EIRP OFF power measurement uncertainty |
CR revised to R5-204947 |
Keysight Technologies UK Ltd | 38.903 16.4.0 CR#157 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
revised | [WTS] [JSN] |
| R5-204788 | Correction to the extreme conditions in TT analysis of 4.7.1.2.1 |
CR revision of R5-203305 |
ROHDE & SCHWARZ | 38.903 16.4.0 CR#1381 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-204887 | CR to update the DL AWGN absolute power for RRM test cases |
CR revision of R5-203313 |
ROHDE & SCHWARZ | 38.903 16.4.0 CR#1391 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-204888 | Adjacent Channel Selectivity FR2 MU definition in 38.903 |
CR revision of R5-203486 |
Keysight Technologies UK Ltd | 38.903 16.4.0 CR#1431 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-204889 | In-band Blocking FR2 MU definition in 38.903 |
CR revision of R5-203490 |
Keysight Technologies UK Ltd | 38.903 16.4.0 CR#1441 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-204890 | CR to update MU in 38.903 |
CR revision of R5-204080 |
Anritsu, Keysight Technologies | 38.903 16.4.0 CR#1531 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-204891 | FR2 Minimum output power measurement uncertainty |
CR revision of R5-204257 |
Keysight Technologies UK Ltd | 38.903 16.4.0 CR#1551 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-204945 | CR to 38.903 on some of the Transmit OFF power MU parameters |
CR revision of R5-204028 |
Samsung R&D Institute UK | 38.903 16.4.0 CR#1521 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-204946 | Update of AWGN flatness in TR 38.903 |
CR revision of R5-204272 |
ROHDE & SCHWARZ | 38.903 16.4.0 CR#1561 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-204947 | FR2 EIRP OFF power measurement uncertainty |
CR revision of R5-204281 |
Keysight Technologies UK Ltd | 38.903 16.4.0 CR#1571 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-205001 | Addition of FR1 Test tolerance analysis for DCI based BWP switch |
CR revision of R5-203821 |
Huawei, HiSilicon | 38.903 16.4.0 CR#1451 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-205002 | Addition of FR1 Test tolerance analysis for RRC based BWP switch |
CR revision of R5-203822 |
Huawei, HiSilicon | 38.903 16.4.0 CR#1461 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-205003 | Addition of FR1 Test tolerance analysis for SSB based BFR |
CR revision of R5-203823 |
Huawei, HiSilicon | 38.903 16.4.0 CR#1471 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
| R5-205004 | Addition of FR1 Test tolerance analysis for CSI-RS based BFR |
CR revision of R5-203824 |
Huawei, HiSilicon | 38.903 16.4.0 CR#1481 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-88-e AI: 5.3.2.15 |
agreed | [WTS] [JSN] |
39 documents (0.34170389175415 seconds)