Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".

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tdoc	Title	Type / Revs	Source	Spec / CR	S/WID	Release	Meeting	Status	Links
R5-205072	SSB bitmap correction for RRM test cases	CR revised to R5-206860	ROHDE & SCHWARZ	38.508-1 16.5.1 CR#1506 catF	5GS_NR_LTE-UEConTest	Rel-16	R5-89-e AI: 5.3.2.1.3	revised	[WTS] [JSN]
R5-205972	Addition of aperiodic CSI-RS reference configuration for RRM test	CR revised to R5-206630	Huawei, HiSilicon	38.508-1 16.5.1 CR#1619 catF	5GS_NR_LTE-UEConTest	Rel-16	R5-89-e AI: 5.3.2.1.3	revised	[WTS] [JSN]
R5-205997	Correction of test frequencies for NR band n1	CR	Ericsson, Rohde & Schwarz	38.508-1 16.5.1 CR#1621 catF	5GS_NR_LTE-UEConTest	Rel-16	R5-89-e AI: 5.3.2.1.3	agreed	[WTS] [JSN]
R5-205998	Editorial correction to NR-DC test frequency clause 4.3.1	CR	Ericsson	38.508-1 16.5.1 CR#1622 catF	5GS_NR_LTE-UEConTest	Rel-16	R5-89-e AI: 5.3.2.1.3	agreed	[WTS] [JSN]
R5-205999	Introduction of test frequencies for SCS=60 kHz and EN-DC configurations DC_41X_n41A	CR revised to R5-206631	Ericsson	38.508-1 16.5.1 CR#1623 catF	5GS_NR_LTE-UEConTest	Rel-16	R5-89-e AI: 5.3.2.1.3	revised	[WTS] [JSN]
R5-206000	Introducing test frequencies for CA_n261(2A)	CR revised to R5-206861	Ericsson	38.508-1 16.5.1 CR#1624 catF	5GS_NR_LTE-UEConTest	Rel-16	R5-89-e AI: 5.3.2.1.3	revised	[WTS] [JSN]
R5-206087	Correction to Default RRM TRS qcl-info and PDCCH TCI State	CR	Anritsu	38.508-1 16.5.1 CR#1656 catF	5GS_NR_LTE-UEConTest	Rel-16	R5-89-e AI: 5.3.2.1.3	agreed	[WTS] [JSN]
R5-206113	Update requirements of test equipment for RRM tests	CR	Ericsson	38.508-1 16.5.1 CR#1658 catF	5GS_NR_LTE-UEConTest	Rel-16	R5-89-e AI: 5.3.2.1.3	agreed	[WTS] [JSN]
R5-206115	Update requirements of reference test conditions for RRM tests	CR	Ericsson	38.508-1 16.5.1 CR#1659 catF	5GS_NR_LTE-UEConTest	Rel-16	R5-89-e AI: 5.3.2.1.3	agreed	[WTS] [JSN]
R5-206157	CSI-measConfig applicable for RRM testing	CR	Keysight Technologies UK Ltd	38.508-1 16.5.1 CR#1663 catF	5GS_NR_LTE-UEConTest	Rel-16	R5-89-e AI: 5.3.2.1.3	agreed	[WTS] [JSN]
R5-206170	Update to quality of quiet zone validation rule for IFF DFF hybrid setup	CR revised to R5-206820	Anritsu	38.508-1 16.5.1 CR#1667 catF	5GS_NR_LTE-UEConTest	Rel-16	R5-89-e AI: 5.3.2.1.3	revised	[WTS] [JSN]
R5-206630	Addition of aperiodic CSI-RS reference configuration for RRM test	CR revision of R5-205972	Huawei, HiSilicon	38.508-1 16.5.1 CR#16191 catF	5GS_NR_LTE-UEConTest	Rel-16	R5-89-e AI: 5.3.2.1.3	agreed	[WTS] [JSN]
R5-206631	Introduction of test frequencies for SCS=60 kHz and EN-DC configurations DC_41X_n41A	CR revision of R5-205999	Ericsson	38.508-1 16.5.1 CR#16231 catF	5GS_NR_LTE-UEConTest	Rel-16	R5-89-e AI: 5.3.2.1.3	agreed	[WTS] [JSN]
R5-206820	Update to quality of quiet zone validation rule for IFF DFF hybrid setup	CR revision of R5-206170	Anritsu	38.508-1 16.5.1 CR#16671 catF	5GS_NR_LTE-UEConTest	Rel-16	R5-89-e AI: 5.3.2.1.3	agreed	[WTS] [JSN]
R5-206860	SSB bitmap correction for RRM test cases	CR revision of R5-205072	ROHDE & SCHWARZ	38.508-1 16.5.1 CR#15061 catF	5GS_NR_LTE-UEConTest	Rel-16	R5-89-e AI: 5.3.2.1.3	agreed	[WTS] [JSN]
R5-206861	Introducing test frequencies for CA_n261(2A)	CR revision of R5-206000	Ericsson	38.508-1 16.5.1 CR#16241 catF	5GS_NR_LTE-UEConTest	Rel-16	R5-89-e AI: 5.3.2.1.3	agreed	[WTS] [JSN]

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