Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-216916 | TT analysis for HST RRM TC 4.6.1.7+6.6.1.7 |
CR revised to R5-218397 |
Huawei, Hisilicon | 38.903 16.9.0 CR#267 catF | NR_HST-UEConTest | Rel-16 |
R5-93-e AI: 5.3.18.7 |
revised | [WTS] [JSN] |
| R5-216917 | TT analysis for HST RRM TC 4.6.4.5+6.6.4.5 |
CR revised to R5-218398 |
Huawei, Hisilicon | 38.903 16.9.0 CR#268 catF | NR_HST-UEConTest | Rel-16 |
R5-93-e AI: 5.3.18.7 |
revised | [WTS] [JSN] |
| R5-216918 | TT analysis for HST RRM TC 6.1.2.5 |
CR revised to R5-218353 |
Huawei, Hisilicon | 38.903 16.9.0 CR#269 catF | NR_HST-UEConTest | Rel-16 |
R5-93-e AI: 5.3.18.7 |
revised | [WTS] [JSN] |
| R5-217582 | Test Tolerance analysis for SA FR1 - E-UTRAN event-triggered reporting in DRX for HST |
CR revised to R5-218354 |
Ericsson | 38.903 16.9.0 CR#276 catF | NR_HST-UEConTest | Rel-16 |
R5-93-e AI: 5.3.18.7 |
revised | [WTS] [JSN] |
| R5-217583 | Test Tolerance analysis for E-UTRA - NR FR1 Cell reselection tests for HST |
CR revised to R5-218355 |
Ericsson | 38.903 16.9.0 CR#277 catF | NR_HST-UEConTest | Rel-16 |
R5-93-e AI: 5.3.18.7 |
revised | [WTS] [JSN] |
| R5-217584 | Test Tolerance analysis for SA FR1 - E-UTRAN event-triggered reporting in DRX for HST |
CR revised to R5-218356 |
Ericsson | 38.903 16.9.0 CR#278 catF | NR_HST-UEConTest | Rel-16 |
R5-93-e AI: 5.3.18.7 |
revised | [WTS] [JSN] |
| R5-218353 | TT analysis for HST RRM TC 6.1.2.5 |
CR revision of R5-216918 |
Huawei, Hisilicon | 38.903 16.9.0 CR#2691 catF | NR_HST-UEConTest | Rel-16 |
R5-93-e AI: 5.3.18.7 |
agreed | [WTS] [JSN] |
| R5-218354 | Test Tolerance analysis for SA FR1 - E-UTRAN event-triggered reporting in DRX for HST |
CR revision of R5-217582 |
Ericsson | 38.903 16.9.0 CR#2761 catF | NR_HST-UEConTest | Rel-16 |
R5-93-e AI: 5.3.18.7 |
agreed | [WTS] [JSN] |
| R5-218355 | Test Tolerance analysis for E-UTRA - NR FR1 Cell reselection tests for HST |
CR revision of R5-217583 |
Ericsson | 38.903 16.9.0 CR#2771 catF | NR_HST-UEConTest | Rel-16 |
R5-93-e AI: 5.3.18.7 |
agreed | [WTS] [JSN] |
| R5-218356 | Test Tolerance analysis for SA FR1 - E-UTRAN event-triggered reporting in DRX for HST |
CR revision of R5-217584 |
Ericsson | 38.903 16.9.0 CR#2781 catF | NR_HST-UEConTest | Rel-16 |
R5-93-e AI: 5.3.18.7 |
agreed | [WTS] [JSN] |
| R5-218397 | TT analysis for HST RRM TC 4.6.1.7+6.6.1.7 |
CR revision of R5-216916 |
Huawei, Hisilicon | 38.903 16.9.0 CR#2671 catF | NR_HST-UEConTest | Rel-16 |
R5-93-e AI: 5.3.18.7 |
agreed | [WTS] [JSN] |
| R5-218398 | TT analysis for HST RRM TC 4.6.4.5+6.6.4.5 |
CR revision of R5-216917 |
Huawei, Hisilicon | 38.903 16.9.0 CR#2681 catF | NR_HST-UEConTest | Rel-16 |
R5-93-e AI: 5.3.18.7 |
agreed | [WTS] [JSN] |
12 documents (0.35077881813049 seconds)