Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-182285 | TP for updating test case 6.2B.2.1, UE Maximum Output Power reduction for Intra-Band Contiguous EN-DC |
pCR revised to R5-183707 |
Ericsson | 38.521-3 0.4.1 | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-79 AI: 5.3.14.6 |
revised | [WTS] [JSN] |
| R5-182401 | 5G_FR1_EN_DC_RF_sensitivity_for_DC |
pCR revised to R5-183929 |
Qualcomm Inc. | 38.521-3 0.4.1 | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-79 AI: 5.3.14.6 |
revised | [WTS] [JSN] |
| R5-182770 | Updated clause 5.5B Configuration for DC to 38.521-3 |
pCR revised to R5-183708 |
Bureau Veritas | 38.521-3 0.4.1 | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-79 AI: 5.3.14.6 |
revised | [WTS] [JSN] |
| R5-182788 | Introduction of TC 6.2B.1.3 for EN-DC |
pCR revised to R5-183930 |
Huawei, Hisilicon | 38.521-3 0.3.1 | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-79 AI: 5.3.14.6 |
revised | [WTS] [JSN] |
| R5-182795 | TP for FR2 spurious test procedure (38.521-3) | pCR | Anritsu | 38.521-3 0.4.1 | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-79 AI: 5.3.14.6 |
withdrawn | [WTS] [JSN] |
| R5-182837 | Introduction of TC 6.2B.1.3 for EN-DC | pCR | Huawei, Hisilicon | 38.521-3 0.3.1 | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-79 AI: 5.3.14.6 |
withdrawn | [WTS] [JSN] |
| R5-182976 | pCR: Update to RMC | pCR | Qualcomm Wireless GmbH | 38.521-3 0.4.1 | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-79 AI: 5.3.14.6 |
withdrawn | [WTS] [JSN] |
| R5-182978 | pCR: Update to reference sensitivity | pCR | Qualcomm Wireless GmbH | 38.521-3 0.4.1 | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-79 AI: 5.3.14.6 |
withdrawn | [WTS] [JSN] |
| R5-182995 | Corrections annex for EIRP and TRP metric definition in TS 38.521-3 | pCR | Keysight Technologies UK Ltd | 38.521-3 0.4.1 | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-79 AI: 5.3.14.6 |
approved | [WTS] [JSN] |
| R5-183022 | TP to add Occupied BW EN-DC test case |
pCR revised to R5-183709 |
Keysight Technologies UK Ltd | 38.521-3 0.4.1 | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-79 AI: 5.3.14.6 |
revised | [WTS] [JSN] |
| R5-183023 | TP to add SEM EN-DC test case |
pCR revised to R5-183710 |
Keysight Technologies UK Ltd | 38.521-3 0.4.1 | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-79 AI: 5.3.14.6 |
revised | [WTS] [JSN] |
| R5-183024 | TP to add ACLR EN-DC test case |
pCR revised to R5-183711 |
Keysight Technologies UK Ltd | 38.521-3 0.4.1 | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-79 AI: 5.3.14.6 |
revised | [WTS] [JSN] |
| R5-183707 | TP for updating test case 6.2B.2.1, UE Maximum Output Power reduction for Intra-Band Contiguous EN-DC |
pCR revision of R5-182285 |
Ericsson | 38.521-3 0.4.1 | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-79 AI: 5.3.14.6 |
approved | [WTS] [JSN] |
| R5-183708 | Updated clause 5.5B Configuration for DC to 38.521-3 |
pCR revision of R5-182770 |
Bureau Veritas | 38.521-3 0.4.1 | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-79 AI: 5.3.14.6 |
approved | [WTS] [JSN] |
| R5-183709 | TP to add Occupied BW EN-DC test case |
pCR revision of R5-183022 |
Keysight Technologies UK Ltd | 38.521-3 0.4.1 | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-79 AI: 5.3.14.6 |
approved | [WTS] [JSN] |
| R5-183710 | TP to add SEM EN-DC test case |
pCR revision of R5-183023 |
Keysight Technologies UK Ltd | 38.521-3 0.4.1 | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-79 AI: 5.3.14.6 |
approved | [WTS] [JSN] |
| R5-183711 | TP to add ACLR EN-DC test case |
pCR revision of R5-183024 |
Keysight Technologies UK Ltd | 38.521-3 0.4.1 | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-79 AI: 5.3.14.6 |
approved | [WTS] [JSN] |
| R5-183929 | 5G_FR1_EN_DC_RF_sensitivity_for_DC |
pCR revision of R5-182401 revised to R5-183961 |
Qualcomm Inc. | 38.521-3 0.4.1 | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-79 AI: 5.3.14.6 |
revised | [WTS] [JSN] |
| R5-183930 | Introduction of TC 6.2B.1.3 for EN-DC |
pCR revision of R5-182788 revised to R5-183962 |
Huawei, Hisilicon | 38.521-3 0.3.1 | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-79 AI: 5.3.14.6 |
revised | [WTS] [JSN] |
| R5-183938 | Statistical Testing Annex for 38.521-3 |
pCR revised to R5-183949 |
Qualcomm Inc | 38.521-3 0.4.1 | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-79 AI: 5.3.14.6 |
revised | [WTS] [JSN] |
| R5-183949 | Statistical Testing Annex for 38.521-3 |
pCR revision of R5-183938 |
Qualcomm Inc | 38.521-3 0.4.1 | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-79 AI: 5.3.14.6 |
approved | [WTS] [JSN] |
| R5-183961 | 5G_FR1_EN_DC_RF_sensitivity_for_DC |
pCR revision of R5-183929 |
Qualcomm Inc. | 38.521-3 0.4.1 | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-79 AI: 5.3.14.6 |
approved | [WTS] [JSN] |
| R5-183962 | Introduction of TC 6.2B.1.3 for EN-DC |
pCR revision of R5-183930 |
Huawei, Hisilicon | 38.521-3 0.3.1 | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-79 AI: 5.3.14.6 |
approved | [WTS] [JSN] |
23 documents (0.33984708786011 seconds)