Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-237106 | Corrections to UE position provision for NR-NTN |
CR revised to R5-237470 |
Rohde & Schwarz | 38.533 18.0.0 CR#2827 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-101 AI: 5.3.14.6 |
revised | [WTS] [JSN] |
| R5-237121 | Satllite access configuration update |
CR revised to R5-237865 |
Keysight Technologies UK Ltd | 38.533 18.0.0 CR#2828 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-101 AI: 5.3.14.6 |
revised | [WTS] [JSN] |
| R5-237122 | Updates to High level test procedure for SAN RRM tests |
CR revised to R5-237866 |
Keysight Technologies UK Ltd | 38.533 18.0.0 CR#2829 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-101 AI: 5.3.14.6 |
revised | [WTS] [JSN] |
| R5-237154 | Addition of NTN inter-frequency measurement test cases |
CR revised to R5-237688 |
Qualcomm Technologies Ireland | 38.533 17.8.0 CR#2830 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-17 |
R5-101 AI: 5.3.14.6 |
revised | [WTS] [JSN] |
| R5-237155 | Addition of NTN parallel measurement gap-based inter-frequency test cases |
CR revised to R5-237689 |
Qualcomm Technologies Ireland | 38.533 17.8.0 CR#2831 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-17 |
R5-101 AI: 5.3.14.6 |
revised | [WTS] [JSN] |
| R5-237156 | Addition of NTN intra-frequency gap-based measurement test cases |
CR revised to R5-237833 |
Qualcomm Technologies Ireland | 38.533 17.8.0 CR#2832 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-17 |
R5-101 AI: 5.3.14.6 |
revised | [WTS] [JSN] |
| R5-237470 | Corrections to UE position provision for NR-NTN |
CR revision of R5-237106 |
Rohde & Schwarz | 38.533 18.0.0 CR#28271 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-101 AI: 5.3.14.6 |
agreed | [WTS] [JSN] |
| R5-237688 | Addition of NTN inter-frequency measurement test cases |
CR revision of R5-237154 |
Qualcomm Technologies Ireland | 38.533 18.0.0 CR#28301 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-101 AI: 5.3.14.6 |
agreed | [WTS] [JSN] |
| R5-237689 | Addition of NTN parallel measurement gap-based inter-frequency test cases |
CR revision of R5-237155 |
Qualcomm Technologies Ireland | 38.533 18.0.0 CR#28311 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-101 AI: 5.3.14.6 |
agreed | [WTS] [JSN] |
| R5-237833 | Addition of NTN intra-frequency gap-based measurement test cases |
CR revision of R5-237156 |
Qualcomm Technologies Ireland | 38.533 18.0.0 CR#28321 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-101 AI: 5.3.14.6 |
agreed | [WTS] [JSN] |
| R5-237865 | Satllite access configuration update |
CR revision of R5-237121 |
Keysight Technologies UK Ltd | 38.533 18.0.0 CR#28281 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-101 AI: 5.3.14.6 |
agreed | [WTS] [JSN] |
| R5-237866 | Updates to High level test procedure for SAN RRM tests |
CR revision of R5-237122 |
Keysight Technologies UK Ltd | 38.533 18.0.0 CR#28291 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-101 AI: 5.3.14.6 |
agreed | [WTS] [JSN] |
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