Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".

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tdoc Title Type / Revs Source Spec / CR S/WID Release Meeting Status Links
R5-184068 FR1 TT Way Forward update discussion

revised to R5-185564

 Telecom Italia S.p.A. 5GS_NR_LTE-UEConTest Rel-15 R5-80

AI: 5.3.13.17

 revised [WTS] [JSN]
R5-184124 Discussion on the way to write Clause 7.4 Maximum Input Level and Clause 7.5 Adjacent Channel Selectivity in TS 38.521-3 discussion

revised to R5-185328

 CMCC, HUAWEI Rel-15 R5-80

AI: 5.3.13.17

 revised [WTS] [JSN]
R5-184133 Discussion on RRM 5G progress discussion ROHDE & SCHWARZ 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-184295 Discussion on test frequency definition in FR1 discussion Huawei,HiSilicon 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-184361 Discussion_38.521-3_ApplicabilityRules discussion

revised to R5-185558

 Qualcomm Europe Inc. (Spain) Rel-15 R5-80

AI: 5.3.13.17

 revised [WTS] [JSN]
R5-184364 Discussion_FR2_EVM_UBF_usage discussion Qualcomm Europe Inc. (Spain) Rel-15 R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-184365 Discussion_FR2_RefSens_RSRP_vs_EIS discussion Qualcomm Europe Inc. (Spain) Rel-15 R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-184366 Discussion_FR2_RefSens_TestPointAnalysis discussion Qualcomm Europe Inc. (Spain) Rel-15 R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-184394 Proposal on Test Tolerance table format in TS 38.521-1 Annex F discussion NTT DOCOMO, INC. 5GS_NR_LTE-UEConTest Rel-15 R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-184397 Proposal on MU and TT table format in TS 38.521-2 discussion

revised to R5-185518

 NTT DOCOMO, INC. 5GS_NR_LTE-UEConTest Rel-15 R5-80

AI: 5.3.13.17

 revised [WTS] [JSN]
R5-184400 MU and TT of EN-DC test cases in TS 38.521-3 discussion

revised to R5-185531

 NTT DOCOMO, INC. 5GS_NR_LTE-UEConTest Rel-15 R5-80

AI: 5.3.13.17

 revised [WTS] [JSN]
R5-184407 Discussion on the structure of Clause 7.3A Reference sensitivity for CA in TS 38.521-1 discussion CMCC, Huawei 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-184408 Discussion on the structure of Clause 7.7A Spurious response for CA in TS 38.521-1 discussion CMCC, Huawei 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-184422 Treatment of power supply cable for FR2 UE tests discussion

revised to R5-185525

 Anritsu 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 revised [WTS] [JSN]
R5-184423 Meeting notes of offline call on FR2 UE common test setup other Anritsu 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-184424 Common test setup for FR2 measurement uncertainty estimation discussion Anritsu 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-184425 Testability issue of maximum input level and ACS (case 2) in FR2 discussion Anritsu 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-184426 Estimation of measurement uncertainty for FR2 TRx test cases discussion

revised to R5-185335

 Anritsu 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 revised [WTS] [JSN]
R5-184427 Removing brackets from MU values in FR2 discussion

revised to R5-185336

 Anritsu 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 revised [WTS] [JSN]
R5-184429 Offset in quality of quiet zone evaluation discussion

revised to R5-185526

 Anritsu 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 revised [WTS] [JSN]
R5-184431 Testability issue of low PSD test cases in FR2 discussion

revised to R5-185527

 Anritsu 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 revised [WTS] [JSN]
R5-184484 Proposal for remaining Maximum Test System Uncertainty for NR FR1 TRx tests discussion Anritsu, ROHDE & SCHWARZ 5GS_NR_LTE-UEConTest Rel-15 R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-184485 Test approach of EN-DC Rx tests with multiple LTE/NR CCs discussion

revised to R5-185529

 Anritsu 5GS_NR_LTE-UEConTest Rel-15 R5-80

AI: 5.3.13.17

 revised [WTS] [JSN]
R5-184487 Discussion on FR2 TRx spurious test procedure discussion

revised to R5-185347

 Anritsu 5GS_NR_LTE-UEConTest Rel-15 R5-80

AI: 5.3.13.17

 revised [WTS] [JSN]
R5-184488 Discussion on UL RMC for FR2 spurious test discussion

revised to R5-185533

 Anritsu 5GS_NR_LTE-UEConTest Rel-15 R5-80

AI: 5.3.13.17

 revised [WTS] [JSN]
R5-184489 Discussion on test point selection for NR Out-of-band in FR1 discussion

revised to R5-185301

 CAICT 5GS_NR_LTE-UEConTest Rel-15 R5-80

AI: 5.3.13.17

 revised [WTS] [JSN]
R5-184497 Discussion on Uplink configuration for NR Transmit Intermodulation in FR1 discussion

revised to R5-185423

 KTL 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 revised [WTS] [JSN]
R5-184509 Handling on TT defining from MU in FR2 discussion NTT DOCOMO, INC. 5GS_NR_LTE-UEConTest Rel-15 R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-184741 Discussion on starting point of 200ms in FR1 RF test procedures discussion

revised to R5-185306

 Huawei,HiSilicon, Keysight 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 revised [WTS] [JSN]
R5-184752 Discussion on test point selection for NS_35 A-MPR in FR1 discussion Ericsson LM R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-184801 Discussion on UE device size for FR2 discussion Rohde & Schwarz 5GS_NR_LTE-UEConTest Rel-15 R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-184802 Discussion on treatment of multi-panel UEs discussion Rohde & Schwarz 5GS_NR_LTE-UEConTest Rel-15 R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-184803 Discussion on Test Tolerance for FR2 discussion

revised to R5-185534

 Intel Corporation (UK) Ltd, Apple Inc. 5GS_NR_LTE-UEConTest Rel-15 R5-80

AI: 5.3.13.17

 revised [WTS] [JSN]
R5-184804 Discussion on TT for Max Output Power TC Requirements for FR2 discussion

revised to R5-185566

 Intel Corporation (UK) Ltd, Apple Inc. 5GS_NR_LTE-UEConTest Rel-15 R5-80

AI: 5.3.13.17

 revised [WTS] [JSN]
R5-184834 Discussion on the test applicability for the modulation of Pi/2-BPSK discussion

revised to R5-185308

 Huawei, Hisilicon 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 revised [WTS] [JSN]
R5-184835 Discussion on test point selection for Configured transmitted power for SUL test case in FR1 discussion Huawei, Hisilicon 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-184852 Discussion on OBW, SEM and ACLR for EN-DC interband FR1 discussion

revised to R5-185478

 Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest Rel-15 R5-80

AI: 5.3.13.17

 revised [WTS] [JSN]
R5-184858 Quality of Quiet Zone Results for IFF other

revised to R5-185492

 Keysight Technologies UK Ltd R5-80

AI: 5.3.13.17

 revised [WTS] [JSN]
R5-184883 Proposal for 5G NR EVM Test Tolerance discussion

revised to R5-185532

 Qualcomm Incorporated R5-80

AI: 5.3.13.17

 revised [WTS] [JSN]
R5-184887 On the relation between MU and TT for RF and RRM conformance testing discussion Ericsson 5GS_NR_LTE-UEConTest Rel-15 R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-184910 Discussion of test frequencies discussion Sprint Corporation LTE_CA_C_B41_PC2-UEConTest R5-80

AI: 5.3.13.17

 withdrawn [WTS] [JSN]
R5-184914 Discussion on MU factor for IFF discussion Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 withdrawn [WTS] [JSN]
R5-184915 Discussion on low-PSD scenarios discussion Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 withdrawn [WTS] [JSN]
R5-184916 Discussion on Dwell time discussion Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-184922 Test Point Analysis for Reference sensitivity level for EN-DC discussion

revised to R5-185429

 Qualcomm Incorporated R5-80

AI: 5.3.13.17

 revised [WTS] [JSN]
R5-184944 Discussion on test point selection for Carrier Leakage in FR1 discussion

revised to R5-185310

 ROHDE & SCHWARZ 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 revised [WTS] [JSN]
R5-184949 Discussion on test point selection for EVM equalizer spectrum flatness in FR1 discussion

revised to R5-185313

 ROHDE & SCHWARZ 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 revised [WTS] [JSN]
R5-184952 Discussion on test point selection for Frequency Error test case in FR1 discussion ROHDE & SCHWARZ 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-184957 Discussion on test point selection for In-band Emissions test case in FR1 discussion

revised to R5-185318

 ROHDE & SCHWARZ 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 revised [WTS] [JSN]
R5-184962 Discussion on test point selection for Frequency Error in FR2 discussion

revised to R5-185349

 ROHDE & SCHWARZ 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 revised [WTS] [JSN]
R5-184965 Discussion on test point selection for EVM in FR2 discussion ROHDE & SCHWARZ 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 withdrawn [WTS] [JSN]
R5-184968 Discussion on test point selection for Carrier Leakage in FR2 discussion ROHDE & SCHWARZ 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 withdrawn [WTS] [JSN]
R5-184971 Discussion on test point selection for In-band Emissions in FR2 discussion ROHDE & SCHWARZ 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 withdrawn [WTS] [JSN]
R5-184974 Discussion on test point selection for EVM equalizer spectral flatness in FR2 discussion ROHDE & SCHWARZ 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 withdrawn [WTS] [JSN]
R5-184975 Discussion on Measurement Uncertainty in FR2 discussion ROHDE & SCHWARZ 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 withdrawn [WTS] [JSN]
R5-184978 Discussion on TT for EN-DC test cases discussion Huawei,HiSilicon 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 withdrawn [WTS] [JSN]
R5-184979 Discussion on Test configuraion table for EN-DC test cases discussion Huawei,HiSilicon 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 withdrawn [WTS] [JSN]
R5-185301 Discussion on test point selection for NR Out-of-band in FR1 discussion

revision of R5-184489

 CAICT 5GS_NR_LTE-UEConTest Rel-15 R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-185306 Discussion on starting point of 200ms in FR1 RF test procedures discussion

revision of R5-184741

 Huawei,HiSilicon, Keysight 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-185308 Discussion on the test applicability for the modulation of Pi/2-BPSK discussion

revision of R5-184834

 Huawei, Hisilicon 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-185310 Discussion on test point selection for Carrier Leakage in FR1 discussion

revision of R5-184944

 ROHDE & SCHWARZ 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-185313 Discussion on test point selection for EVM equalizer spectrum flatness in FR1 discussion

revision of R5-184949

 ROHDE & SCHWARZ 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-185318 Discussion on test point selection for In-band Emissions test case in FR1 discussion

revision of R5-184957

 ROHDE & SCHWARZ 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-185328 Discussion on the way to write Clause 7.4 Maximum Input Level and Clause 7.5 Adjacent Channel Selectivity in TS 38.521-3 discussion

revision of R5-184124

 CMCC, HUAWEI Rel-15 R5-80

AI: 5.3.13.17

 approved [WTS] [JSN]
R5-185334 Discussion of LTE Test point selection for EN-DC with FR1 Tx Spurious emission Test discussion Qualcomm Inc. 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 not concluded [WTS] [JSN]
R5-185335 Estimation of measurement uncertainty for FR2 TRx test cases discussion

revision of R5-184426

 Anritsu 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-185336 Removing brackets from MU values in FR2 discussion

revision of R5-184427

 Anritsu 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-185347 Discussion on FR2 TRx spurious test procedure discussion

revision of R5-184487

 Anritsu 5GS_NR_LTE-UEConTest Rel-15 R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-185349 Discussion on test point selection for Frequency Error in FR2 discussion

revision of R5-184962

 ROHDE & SCHWARZ 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-185410 Discussion on approach for defining EN-DC tests in TS 38.521-3 discussion

revised to R5-185468

 Qualcomm Wireless GmbH 5GS_NR_LTE-UEConTest Rel-15 R5-80

AI: 5.3.13.17

 revised [WTS] [JSN]
R5-185423 Discussion on Uplink configuration for NR Transmit Intermodulation in FR1 discussion

revision of R5-184497

 KTL 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-185429 Test Point Analysis for Reference sensitivity level for EN-DC discussion

revision of R5-184922

 Qualcomm Incorporated R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-185468 Discussion on approach for defining EN-DC tests in TS 38.521-3 discussion

revision of R5-185410

 Qualcomm Wireless GmbH 5GS_NR_LTE-UEConTest Rel-15 R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-185478 Discussion on OBW, SEM and ACLR for EN-DC interband FR1 discussion

revision of R5-184852

 Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest Rel-15 R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-185490 FR2_TxSpurious_TestConfig_38.521-2 pCR

revision of R5-184372

 Qualcomm Europe Inc. (Spain) 38.521-2 0.5.0 5GS_NR_LTE-UEConTest Rel-15 R5-80

AI: 5.3.13.17

 approved [WTS] [JSN]
R5-185492 Quality of Quiet Zone Results for IFF other

revision of R5-184858

 Keysight Technologies UK Ltd R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-185518 Proposal on MU and TT table format in TS 38.521-2 discussion

revision of R5-184397

 NTT DOCOMO, INC. 5GS_NR_LTE-UEConTest Rel-15 R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-185525 Treatment of power supply cable for FR2 UE tests discussion

revision of R5-184422

 Anritsu 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-185526 Offset in quality of quiet zone evaluation discussion

revision of R5-184429

 Anritsu 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-185527 Testability issue of low PSD test cases in FR2 discussion

revision of R5-184431

 Anritsu 5GS_NR_LTE-UEConTest R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-185529 Test approach of EN-DC Rx tests with multiple LTE/NR CCs discussion

revision of R5-184485

 Anritsu 5GS_NR_LTE-UEConTest Rel-15 R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-185531 MU and TT of EN-DC test cases in TS 38.521-3 discussion

revision of R5-184400

 NTT DOCOMO, INC. 5GS_NR_LTE-UEConTest Rel-15 R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-185532 Proposal for 5G NR EVM Test Tolerance discussion

revision of R5-184883

 Qualcomm Incorporated R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-185533 Discussion on UL RMC for FR2 spurious test discussion

revision of R5-184488

 Anritsu 5GS_NR_LTE-UEConTest Rel-15 R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-185534 Discussion on Test Tolerance for FR2 discussion

revision of R5-184803

 Intel Corporation (UK) Ltd, Apple Inc. 5GS_NR_LTE-UEConTest Rel-15 R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-185558 Discussion_38.521-3_ApplicabilityRules discussion

revision of R5-184361

 Qualcomm Europe Inc. (Spain) Rel-15 R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-185564 FR1 TT Way Forward update discussion

revision of R5-184068

 Telecom Italia S.p.A. 5GS_NR_LTE-UEConTest Rel-15 R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]
R5-185566 Discussion on TT for Max Output Power TC Requirements for FR2 discussion

revision of R5-184804

 Intel Corporation (UK) Ltd, Apple Inc. 5GS_NR_LTE-UEConTest Rel-15 R5-80

AI: 5.3.13.17

 noted [WTS] [JSN]

88 documents (0.28850603103638 seconds)