Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".

Download results in JSON format

tdoc Title Type / Revs Source Spec / CR S/WID Release Meeting Status Links
R5-184147 Test Tolerance Analysis for RRM TC 9.1.1.1_2 and 9.1.2.1_2 CR

revised to R5-185395

Qualcomm Europe Inc. (Spain) 36.903 14.1.0 CR#383 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

revised [WTS] [JSN]
R5-184155 Test Tolerance Analysis for RRM TC 9.1.1.2_2 and 9.1.2.2_2 CR

revised to R5-185396

Qualcomm Europe Inc. (Spain) 36.903 14.1.0 CR#386 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

revised [WTS] [JSN]
R5-184156 Test Tolerance Analysis for RRM TC 9.1.3.1_2 and 9.1.4.1_2 CR

revised to R5-185397

Qualcomm Europe Inc. (Spain) 36.903 14.1.0 CR#387 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

revised [WTS] [JSN]
R5-184157 Test Tolerance Analysis for RRM TC 9.1.3.2_2 and 9.1.4.2_2 CR

revised to R5-185398

Qualcomm Europe Inc. (Spain) 36.903 14.1.0 CR#388 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

revised [WTS] [JSN]
R5-184158 Test Tolerance Analysis for RRM TC 9.1.5.1_2 CR

revised to R5-185399

Qualcomm Europe Inc. (Spain) 36.903 14.1.0 CR#389 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

revised [WTS] [JSN]
R5-184159 Test Tolerance Analysis for RRM TC 9.1.5.2_2 CR

revised to R5-185400

Qualcomm Europe Inc. (Spain) 36.903 14.1.0 CR#390 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

revised [WTS] [JSN]
R5-184160 Test Tolerance Analysis for RRM TC 9.2.1.1_2 and 9.2.2.1_2 CR Qualcomm Europe Inc. (Spain) 36.903 14.1.0 CR#391 catF LTE_UE_cat_1RX-UEConTest Rel-15 R5-80

AI: 5.3.11.8

withdrawn [WTS] [JSN]
R5-184161 Test Tolerance Analysis for RRM TC 9.2.3.1_2 and 9.2.4.1_2 CR

revised to R5-185401

Qualcomm Europe Inc. (Spain) 36.903 14.1.0 CR#392 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

revised [WTS] [JSN]
R5-184162 Test Tolerance Analysis for RRM TC 9.2.3.2_2 and 9.2.4.2_2 CR

revised to R5-185402

Qualcomm Europe Inc. (Spain) 36.903 14.1.0 CR#393 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

revised [WTS] [JSN]
R5-184163 Test Tolerance Analysis for RRM TC 9.2.4A.1_2 CR

revised to R5-185403

Qualcomm Europe Inc. (Spain) 36.903 14.1.0 CR#394 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

revised [WTS] [JSN]
R5-184164 Test Tolerance Analysis for RRM TC 9.2.4A.2_2 CR

revised to R5-185404

Qualcomm Europe Inc. (Spain) 36.903 14.1.0 CR#395 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

revised [WTS] [JSN]
R5-184185 Test Tolerance Analysis for RRM TC 9.2.1.1_2 and 9.2.2.1_2 CR

revised to R5-185405

Qualcomm Europe Inc. (Spain) 36.903 14.1.0 CR#400 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

revised [WTS] [JSN]
R5-184204 Test Tolerances analysis for E-UTRAN FDD-FDD and TDD-TDD inter-frequency TC 8.3.1_2, 8.3.2_2, 8.4.1_2, 8.4.2_2 and 8.4.6_2 for UE category 1bis CR Qualcomm UK Ltd 36.903 14.1.0 CR#401 catF LTE_UE_cat_1RX-UEConTest Rel-15 R5-80

AI: 5.3.11.8

withdrawn [WTS] [JSN]
R5-184206 Test Tolerances analysis for E-UTRAN FDD-FDD and TDD-TDD inter-frequency TC 8.3.3_2 and 8.4.3_2 for UE category 1bis when L3 filtering is used CR Qualcomm UK Ltd 36.903 14.1.0 CR#402 catF LTE_UE_cat_1RX-UEConTest Rel-15 R5-80

AI: 5.3.11.8

withdrawn [WTS] [JSN]
R5-184208 Test Tolerances analysis for E-UTRAN FDD-FDD intra-frequency event triggered reporting under fading propagation conditions in asynchronous cells for UE category 1bis CR Qualcomm UK Ltd 36.903 14.1.0 CR#403 catF LTE_UE_cat_1RX-UEConTest Rel-15 R5-80

AI: 5.3.11.8

withdrawn [WTS] [JSN]
R5-184210 Test Tolerances analysis for E-UTRAN FDD-FDD and TDD-TDD intra-frequency TC 8.1.12_2, 8.1.13_2, 8.1.17_2, 8.1.18_2 for UE category 1bis CR Qualcomm UK Ltd 36.903 14.1.0 CR#404 catF LTE_UE_cat_1RX-UEConTest Rel-15 R5-80

AI: 5.3.11.8

withdrawn [WTS] [JSN]
R5-184212 Test Tolerances analysis for E-UTRAN FDD and TDD Intra-frequency CGI TC 8.1.19_2, 8.1.20_2, 8.2.7_2, 8.2.8_2 for UE category 1bis CR Qualcomm UK Ltd 36.903 14.1.0 CR#405 catF LTE_UE_cat_1RX-UEConTest Rel-15 R5-80

AI: 5.3.11.8

withdrawn [WTS] [JSN]
R5-184926 Test Tolerances analysis for E-UTRAN FDD-FDD and TDD-TDD inter-frequency TC 8.3.1_2, 8.3.2_2, 8.4.1_2, 8.4.2_2 and 8.4.6_2 for UE category 1bis CR

revised to R5-185338

Qualcomm UK Ltd 36.903 14.1.0 CR#412 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

revised [WTS] [JSN]
R5-184928 Test Tolerances analysis for E-UTRAN FDD-FDD and TDD-TDD inter-frequency TC 8.3.3_2 and 8.4.3_2 for UE category 1bis when L3 filtering is used CR

revised to R5-185339

Qualcomm UK Ltd 36.903 14.1.0 CR#413 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

revised [WTS] [JSN]
R5-184930 Test Tolerances analysis for E-UTRAN FDD-FDD intra-frequency event triggered reporting under fading propagation conditions in asynchronous cells for UE category 1bis CR

revised to R5-185340

Qualcomm UK Ltd 36.903 14.1.0 CR#414 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

revised [WTS] [JSN]
R5-184932 Test Tolerances analysis for E-UTRAN FDD-FDD and TDD-TDD intra-frequency TC 8.1.12_2, 8.1.13_2, 8.1.17_2, 8.1.18_2 for UE category 1bis CR

revised to R5-185341

Qualcomm UK Ltd 36.903 14.1.0 CR#415 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

revised [WTS] [JSN]
R5-184934 Test Tolerances analysis for E-UTRAN FDD and TDD Intra-frequency CGI TC 8.1.19_2, 8.1.20_2, 8.2.7_2, 8.2.8_2 for UE category 1bis CR Qualcomm UK Ltd 36.903 14.1.0 CR#416 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

withdrawn [WTS] [JSN]
R5-185338 Test Tolerances analysis for E-UTRAN FDD-FDD and TDD-TDD inter-frequency TC 8.3.1_2, 8.3.2_2, 8.4.1_2, 8.4.2_2 and 8.4.6_2 for UE category 1bis CR

revision of R5-184926

Qualcomm UK Ltd 36.903 14.1.0 CR#4121 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

agreed [WTS] [JSN]
R5-185339 Test Tolerances analysis for E-UTRAN FDD-FDD and TDD-TDD inter-frequency TC 8.3.3_2 and 8.4.3_2 for UE category 1bis when L3 filtering is used CR

revision of R5-184928

Qualcomm UK Ltd 36.903 14.1.0 CR#4131 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

agreed [WTS] [JSN]
R5-185340 Test Tolerances analysis for E-UTRAN FDD-FDD intra-frequency event triggered reporting under fading propagation conditions in asynchronous cells for UE category 1bis CR

revision of R5-184930

Qualcomm UK Ltd 36.903 14.1.0 CR#4141 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

agreed [WTS] [JSN]
R5-185341 Test Tolerances analysis for E-UTRAN FDD-FDD and TDD-TDD intra-frequency TC 8.1.12_2, 8.1.13_2, 8.1.17_2, 8.1.18_2 for UE category 1bis CR

revision of R5-184932

Qualcomm UK Ltd 36.903 14.1.0 CR#4151 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

agreed [WTS] [JSN]
R5-185395 Test Tolerance Analysis for RRM TC 9.1.1.1_2 and 9.1.2.1_2 CR

revision of R5-184147

Qualcomm Europe Inc. (Spain) 36.903 14.1.0 CR#3831 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

agreed [WTS] [JSN]
R5-185396 Test Tolerance Analysis for RRM TC 9.1.1.2_2 and 9.1.2.2_2 CR

revision of R5-184155

Qualcomm Europe Inc. (Spain) 36.903 14.1.0 CR#3861 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

agreed [WTS] [JSN]
R5-185397 Test Tolerance Analysis for RRM TC 9.1.3.1_2 and 9.1.4.1_2 CR

revision of R5-184156

Qualcomm Europe Inc. (Spain) 36.903 14.1.0 CR#3871 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

agreed [WTS] [JSN]
R5-185398 Test Tolerance Analysis for RRM TC 9.1.3.2_2 and 9.1.4.2_2 CR

revision of R5-184157

Qualcomm Europe Inc. (Spain) 36.903 14.1.0 CR#3881 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

agreed [WTS] [JSN]
R5-185399 Test Tolerance Analysis for RRM TC 9.1.5.1_2 CR

revision of R5-184158

Qualcomm Europe Inc. (Spain) 36.903 14.1.0 CR#3891 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

agreed [WTS] [JSN]
R5-185400 Test Tolerance Analysis for RRM TC 9.1.5.2_2 CR

revision of R5-184159

Qualcomm Europe Inc. (Spain) 36.903 14.1.0 CR#3901 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

agreed [WTS] [JSN]
R5-185401 Test Tolerance Analysis for RRM TC 9.2.3.1_2 and 9.2.4.1_2 CR

revision of R5-184161

Qualcomm Europe Inc. (Spain) 36.903 14.1.0 CR#3921 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

agreed [WTS] [JSN]
R5-185402 Test Tolerance Analysis for RRM TC 9.2.3.2_2 and 9.2.4.2_2 CR

revision of R5-184162

Qualcomm Europe Inc. (Spain) 36.903 14.1.0 CR#3931 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

agreed [WTS] [JSN]
R5-185403 Test Tolerance Analysis for RRM TC 9.2.4A.1_2 CR

revision of R5-184163

Qualcomm Europe Inc. (Spain) 36.903 14.1.0 CR#3941 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

agreed [WTS] [JSN]
R5-185404 Test Tolerance Analysis for RRM TC 9.2.4A.2_2 CR

revision of R5-184164

Qualcomm Europe Inc. (Spain) 36.903 14.1.0 CR#3951 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

agreed [WTS] [JSN]
R5-185405 Test Tolerance Analysis for RRM TC 9.2.1.1_2 and 9.2.2.1_2 CR

revision of R5-184185

Qualcomm Europe Inc. (Spain) 36.903 14.1.0 CR#4001 catF LTE_UE_cat_1RX-UEConTest Rel-14 R5-80

AI: 5.3.11.8

agreed [WTS] [JSN]

37 documents (0.29344391822815 seconds)