Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-255647 | TT analysis for ATG RRM test cases 19.2.3.2.1 and 19.2.3.2.2 |
CR revised to R5-256901 |
ZTE Corporation | 38.903 19.0.0 CR#1096 catF | NR_ATG-UEConTest | Rel-19 |
R5-109 AI: 5.3.11.7 |
revised | [WTS] [JSN] |
| R5-256141 | TT analysis for ATG L1-RSRP reporting test cases 19.5.3.x |
CR revised to R5-256902 |
Huawei, HiSilicon | 38.903 19.0.0 CR#1106 catF | NR_ATG-UEConTest | Rel-19 |
R5-109 AI: 5.3.11.7 |
revised | [WTS] [JSN] |
| R5-256142 | TT analysis for ATG L1-SINR reporting test cases 19.5.4.x | CR | Huawei, HiSilicon | 38.903 19.0.0 CR#1107 catF | NR_ATG-UEConTest | Rel-19 |
R5-109 AI: 5.3.11.7 |
agreed | [WTS] [JSN] |
| R5-256143 | TT analysis for ATG CGI reporting test cases 19.5.5.1 | CR | Huawei, HiSilicon | 38.903 19.0.0 CR#1108 catF | NR_ATG-UEConTest | Rel-19 |
R5-109 AI: 5.3.11.7 |
agreed | [WTS] [JSN] |
| R5-256144 | TT analysis for ATG intra-frequency CSI-RSRP accuracy test cases 19.6.6.1.x |
CR revised to R5-256903 |
Huawei, HiSilicon | 38.903 19.0.0 CR#1109 catF | NR_ATG-UEConTest | Rel-19 |
R5-109 AI: 5.3.11.7 |
revised | [WTS] [JSN] |
| R5-256145 | TT analysis for ATG intra-frequency CSI-RSRQ accuracy test cases 19.6.7.1 |
CR revised to R5-256904 |
Huawei, HiSilicon | 38.903 19.0.0 CR#1110 catF | NR_ATG-UEConTest | Rel-19 |
R5-109 AI: 5.3.11.7 |
revised | [WTS] [JSN] |
| R5-256146 | TT analysis for ATG intra-frequency CSI-SINR accuracy test cases 19.6.8.1 |
CR revised to R5-256905 |
Huawei, HiSilicon | 38.903 19.0.0 CR#1111 catF | NR_ATG-UEConTest | Rel-19 |
R5-109 AI: 5.3.11.7 |
revised | [WTS] [JSN] |
| R5-256436 | Test tolerance analysis for RLM OOS test cases 19.4.1.x |
CR revised to R5-256906 |
Ericsson | 38.903 19.0.0 CR#1116 catF | NR_ATG-UEConTest | Rel-19 |
R5-109 AI: 5.3.11.7 |
revised | [WTS] [JSN] |
| R5-256437 | Test tolerance analysis for RLM IS test cases 19.4.1.x |
CR revised to R5-256907 |
Ericsson | 38.903 19.0.0 CR#1117 catF | NR_ATG-UEConTest | Rel-19 |
R5-109 AI: 5.3.11.7 |
revised | [WTS] [JSN] |
| R5-256489 | Test Tolerance analysis for DCI based DL active BWP switch in non DRX for ATG test 19.4.3.1.1. | CR | Qualcomm Wireless Communication Tech | 38.903 19.0.0 CR#1120 catF | NR_ATG-UEConTest | Rel-19 |
R5-109 AI: 5.3.11.7 |
agreed | [WTS] [JSN] |
| R5-256490 | Test Tolerance analysis for RRC based DL active BWP switch in non DRX for ATG test 19.4.3.2.1. | CR | Qualcomm Wireless Communication Tech | 38.903 19.0.0 CR#1121 catF | NR_ATG-UEConTest | Rel-19 |
R5-109 AI: 5.3.11.7 |
agreed | [WTS] [JSN] |
| R5-256491 | Test Tolerance analysis for UE specific CBW change on PCell in non DRX for ATG test 19.4.4.1. | CR | Qualcomm Wireless Communication Tech | 38.903 19.0.0 CR#1122 catF | NR_ATG-UEConTest | Rel-19 |
R5-109 AI: 5.3.11.7 |
agreed | [WTS] [JSN] |
| R5-256492 | Test Tolerance analysis for MAC CE based pathloss reference signal switch delay for ATG test 19.4.5.1. | CR | Qualcomm Wireless Communication Tech | 38.903 19.0.0 CR#1123 catF | NR_ATG-UEConTest | Rel-19 |
R5-109 AI: 5.3.11.7 |
agreed | [WTS] [JSN] |
| R5-256493 | Test Tolerance analysis for MAC CE based pathloss reference signal switch delay for ATG test 19.4.5.1. | CR | Qualcomm Wireless Communication Tech | 38.903 19.0.0 CR#1124 catF | NR_ATG-UEConTest | Rel-19 |
R5-109 AI: 5.3.11.7 |
withdrawn | [WTS] [JSN] |
| R5-256901 | TT analysis for ATG RRM test cases 19.2.3.2.1 and 19.2.3.2.2 |
CR revision of R5-255647 |
ZTE Corporation | 38.903 19.0.0 CR#10961 catF | NR_ATG-UEConTest | Rel-19 |
R5-109 AI: 5.3.11.7 |
agreed | [WTS] [JSN] |
| R5-256902 | TT analysis for ATG L1-RSRP reporting test cases 19.5.3.x |
CR revision of R5-256141 |
Huawei, HiSilicon | 38.903 19.0.0 CR#11061 catF | NR_ATG-UEConTest | Rel-19 |
R5-109 AI: 5.3.11.7 |
agreed | [WTS] [JSN] |
| R5-256903 | TT analysis for ATG intra-frequency CSI-RSRP accuracy test cases 19.6.6.1.x |
CR revision of R5-256144 |
Huawei, HiSilicon | 38.903 19.0.0 CR#11091 catF | NR_ATG-UEConTest | Rel-19 |
R5-109 AI: 5.3.11.7 |
agreed | [WTS] [JSN] |
| R5-256904 | TT analysis for ATG intra-frequency CSI-RSRQ accuracy test cases 19.6.7.1 |
CR revision of R5-256145 |
Huawei, HiSilicon | 38.903 19.0.0 CR#11101 catF | NR_ATG-UEConTest | Rel-19 |
R5-109 AI: 5.3.11.7 |
agreed | [WTS] [JSN] |
| R5-256905 | TT analysis for ATG intra-frequency CSI-SINR accuracy test cases 19.6.8.1 |
CR revision of R5-256146 |
Huawei, HiSilicon | 38.903 19.0.0 CR#11111 catF | NR_ATG-UEConTest | Rel-19 |
R5-109 AI: 5.3.11.7 |
agreed | [WTS] [JSN] |
| R5-256906 | Test tolerance analysis for RLM OOS test cases 19.4.1.x |
CR revision of R5-256436 |
Ericsson | 38.903 19.0.0 CR#11161 catF | NR_ATG-UEConTest | Rel-19 |
R5-109 AI: 5.3.11.7 |
agreed | [WTS] [JSN] |
| R5-256907 | Test tolerance analysis for RLM IS test cases 19.4.1.x |
CR revision of R5-256437 |
Ericsson | 38.903 19.0.0 CR#11171 catF | NR_ATG-UEConTest | Rel-19 |
R5-109 AI: 5.3.11.7 |
agreed | [WTS] [JSN] |
21 documents (0.38712286949158 seconds)