Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-184106 | RMC correction 8.1.12_1 (core spec alignment) | CR | ROHDE & SCHWARZ | 36.521-3 15.2.1 CR#2220 catF | LTE_UE_cat_1RX-UEConTest | Rel-15 |
R5-80 AI: 5.3.11.4 |
agreed | [WTS] [JSN] |
| R5-184165 | Test Tolerance: Updates to Cat1bis inter frequency RSRP accuracy tests and Annex F |
CR revised to R5-185391 |
Qualcomm Europe Inc. (Spain) | 36.521-3 15.2.1 CR#2227 catF | LTE_UE_cat_1RX-UEConTest | Rel-15 |
R5-80 AI: 5.3.11.4 |
revised | [WTS] [JSN] |
| R5-184166 | Test Tolerance: Updates to Cat1bis inter frequency RSRQ accuracy tests and Annex F |
CR revised to R5-185392 |
Qualcomm Europe Inc. (Spain) | 36.521-3 15.2.1 CR#2228 catF | LTE_UE_cat_1RX-UEConTest | Rel-15 |
R5-80 AI: 5.3.11.4 |
revised | [WTS] [JSN] |
| R5-184167 | Test Tolerance: Updates to Cat1bis intra frequency RSRP accuracy tests and Annex F |
CR revised to R5-185393 |
Qualcomm Europe Inc. (Spain) | 36.521-3 15.2.1 CR#2229 catF | LTE_UE_cat_1RX-UEConTest | Rel-15 |
R5-80 AI: 5.3.11.4 |
revised | [WTS] [JSN] |
| R5-184168 | Test Tolerance: Updates to Cat1bis intra frequency RSRQ accuracy tests and Annex F |
CR revised to R5-185394 |
Qualcomm Europe Inc. (Spain) | 36.521-3 15.2.1 CR#2230 catF | LTE_UE_cat_1RX-UEConTest | Rel-15 |
R5-80 AI: 5.3.11.4 |
revised | [WTS] [JSN] |
| R5-184202 | Completion of Chapter 7 RRM cat 1bis test cases |
CR revised to R5-185386 |
Qualcomm UK Ltd | 36.521-3 15.2.1 CR#2232 catF | LTE_UE_cat_1RX-UEConTest | Rel-15 |
R5-80 AI: 5.3.11.4 |
revised | [WTS] [JSN] |
| R5-184203 | Test Tolerance: Updates to Cat1bis chapter 8 inter-frequency event triggered reporting tests | CR | Qualcomm UK Ltd | 36.521-3 15.2.1 CR#2233 catF | LTE_UE_cat_1RX-UEConTest | Rel-15 |
R5-80 AI: 5.3.11.4 |
agreed | [WTS] [JSN] |
| R5-184205 | Test Tolerance: Updates to Cat1bis Event triggered reporting tests under AWGN propagation conditions in asynchronous cells with DRX when L3 filtering is used | CR | Qualcomm UK Ltd | 36.521-3 15.2.1 CR#2234 catF | LTE_UE_cat_1RX-UEConTest | Rel-15 |
R5-80 AI: 5.3.11.4 |
agreed | [WTS] [JSN] |
| R5-184207 | Test Tolerance: Updates to Cat1bis Event triggered reporting tests with fading, Annex E and Annex F | CR | Qualcomm UK Ltd | 36.521-3 15.2.1 CR#2235 catF | LTE_UE_cat_1RX-UEConTest | Rel-15 |
R5-80 AI: 5.3.11.4 |
agreed | [WTS] [JSN] |
| R5-184209 | Test Tolerance: Updates to Cat1bis intra-frequency Event triggered reporting tests, Annex E and Annex F | CR | Qualcomm UK Ltd | 36.521-3 15.2.1 CR#2236 catF | LTE_UE_cat_1RX-UEConTest | Rel-15 |
R5-80 AI: 5.3.11.4 |
agreed | [WTS] [JSN] |
| R5-184211 | Test Tolerance: Updates to Cat1bis intra-frequency CGI Event triggered reporting tests, Annex E and Annex F |
CR revised to R5-185337 |
Qualcomm UK Ltd | 36.521-3 15.2.1 CR#2237 catF | LTE_UE_cat_1RX-UEConTest | Rel-15 |
R5-80 AI: 5.3.11.4 |
revised | [WTS] [JSN] |
| R5-184375 | Introduction of TC 6.1.1_2 E-UTRAN FDD Intra-frequency RRC Re-establishment for UE Category 1bis | CR | CAICT | 36.521-3 15.2.1 CR#2259 catF | LTE_UE_cat_1RX-UEConTest | Rel-15 |
R5-80 AI: 5.3.11.4 |
agreed | [WTS] [JSN] |
| R5-184376 | Introduction of TC 6.1.2_2 E-UTRAN FDD Inter-frequency RRC Re-establishment for UE Category 1bis | CR | CAICT | 36.521-3 15.2.1 CR#2260 catF | LTE_UE_cat_1RX-UEConTest | Rel-15 |
R5-80 AI: 5.3.11.4 |
agreed | [WTS] [JSN] |
| R5-184377 | Introduction of TC 6.1.3_2 E-UTRAN TDD Intra-frequency RRC Re-establishment for UE Category 1bis | CR | CAICT | 36.521-3 15.2.1 CR#2261 catF | LTE_UE_cat_1RX-UEConTest | Rel-15 |
R5-80 AI: 5.3.11.4 |
agreed | [WTS] [JSN] |
| R5-184378 | Introduction of TC 6.1.4_2 E-UTRAN TDD Inter-frequency RRC Re-establishment for UE Category 1bis | CR | CAICT | 36.521-3 15.2.1 CR#2262 catF | LTE_UE_cat_1RX-UEConTest | Rel-15 |
R5-80 AI: 5.3.11.4 |
agreed | [WTS] [JSN] |
| R5-184379 | Annex E,F RRM Cat1bis 6.1.x tests | CR | CAICT | 36.521-3 15.2.1 CR#2263 catF | LTE_UE_cat_1RX-UEConTest | Rel-15 |
R5-80 AI: 5.3.11.4 |
agreed | [WTS] [JSN] |
| R5-184925 | Test Tolerance: Updates to Cat1bis chapter 8 inter-frequency event triggered reporting tests | CR | Qualcomm UK Ltd | 36.521-3 15.2.1 CR#2285 catF | LTE_UE_cat_1RX-UEConTest | Rel-15 |
R5-80 AI: 5.3.11.4 |
withdrawn | [WTS] [JSN] |
| R5-184927 | Test Tolerance: Updates to Cat1bis Event triggered reporting tests under AWGN propagation conditions in asynchronous cells with DRX when L3 filtering is used | CR | Qualcomm UK Ltd | 36.521-3 15.2.1 CR#2286 catF | LTE_UE_cat_1RX-UEConTest | Rel-15 |
R5-80 AI: 5.3.11.4 |
withdrawn | [WTS] [JSN] |
| R5-184929 | Test Tolerance: Updates to Cat1bis Event triggered reporting tests with fading, Annex E and Annex F | CR | Qualcomm UK Ltd | 36.521-3 15.2.1 CR#2287 catF | LTE_UE_cat_1RX-UEConTest | Rel-15 |
R5-80 AI: 5.3.11.4 |
withdrawn | [WTS] [JSN] |
| R5-184931 | Test Tolerance: Updates to Cat1bis intra-frequency Event triggered reporting tests, Annex E and Annex F | CR | Qualcomm UK Ltd | 36.521-3 15.2.1 CR#2288 catF | LTE_UE_cat_1RX-UEConTest | Rel-15 |
R5-80 AI: 5.3.11.4 |
withdrawn | [WTS] [JSN] |
| R5-184933 | Test Tolerance: Updates to Cat1bis intra-frequency CGI Event triggered reporting tests, Annex E and Annex F | CR | Qualcomm UK Ltd | 36.521-3 15.2.1 CR#2289 catF | LTE_UE_cat_1RX-UEConTest | Rel-15 |
R5-80 AI: 5.3.11.4 |
withdrawn | [WTS] [JSN] |
| R5-185337 | Test Tolerance: Updates to Cat1bis intra-frequency CGI Event triggered reporting tests, Annex E and Annex F |
CR revision of R5-184211 |
Qualcomm UK Ltd | 36.521-3 15.2.1 CR#22371 catF | LTE_UE_cat_1RX-UEConTest | Rel-15 |
R5-80 AI: 5.3.11.4 |
agreed | [WTS] [JSN] |
| R5-185386 | Completion of Chapter 7 RRM cat 1bis test cases |
CR revision of R5-184202 |
Qualcomm UK Ltd | 36.521-3 15.2.1 CR#22321 catF | LTE_UE_cat_1RX-UEConTest | Rel-15 |
R5-80 AI: 5.3.11.4 |
agreed | [WTS] [JSN] |
| R5-185391 | Test Tolerance: Updates to Cat1bis inter frequency RSRP accuracy tests and Annex F |
CR revision of R5-184165 |
Qualcomm Europe Inc. (Spain) | 36.521-3 15.2.1 CR#22271 catF | LTE_UE_cat_1RX-UEConTest | Rel-15 |
R5-80 AI: 5.3.11.4 |
agreed | [WTS] [JSN] |
| R5-185392 | Test Tolerance: Updates to Cat1bis inter frequency RSRQ accuracy tests and Annex F |
CR revision of R5-184166 |
Qualcomm Europe Inc. (Spain) | 36.521-3 15.2.1 CR#22281 catF | LTE_UE_cat_1RX-UEConTest | Rel-15 |
R5-80 AI: 5.3.11.4 |
agreed | [WTS] [JSN] |
| R5-185393 | Test Tolerance: Updates to Cat1bis intra frequency RSRP accuracy tests and Annex F |
CR revision of R5-184167 |
Qualcomm Europe Inc. (Spain) | 36.521-3 15.2.1 CR#22291 catF | LTE_UE_cat_1RX-UEConTest | Rel-15 |
R5-80 AI: 5.3.11.4 |
agreed | [WTS] [JSN] |
| R5-185394 | Test Tolerance: Updates to Cat1bis intra frequency RSRQ accuracy tests and Annex F |
CR revision of R5-184168 |
Qualcomm Europe Inc. (Spain) | 36.521-3 15.2.1 CR#22301 catF | LTE_UE_cat_1RX-UEConTest | Rel-15 |
R5-80 AI: 5.3.11.4 |
agreed | [WTS] [JSN] |
27 documents (0.34162187576294 seconds)