Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".

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tdoc Title Type / Revs Source Spec / CR S/WID Release Meeting Status Links
R5-220063 Correction of Test applicability of 6.2B.2.3 CR CAICT 38.521-3 17.3.0 CR#1251 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

agreed [WTS] [JSN]
R5-220065 Correction of Test applicability of 6.2B.3.3 CR

revised to R5-221693

CAICT 38.521-3 17.3.0 CR#1252 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

revised [WTS] [JSN]
R5-220066 Correction of 6.5B.2.3.3 to include 6.5.2.4.2 of 38.521-1 CR

revised to R5-221694

CAICT 38.521-3 17.3.0 CR#1253 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

revised [WTS] [JSN]
R5-220068 Correction of test config table for 6.3B.3_1.1 CR CAICT 38.521-3 17.3.0 CR#1254 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

agreed [WTS] [JSN]
R5-220069 Correction of reference section numbers in 6.4B.2.4.5.4.1 CR CAICT 38.521-3 17.3.0 CR#1255 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

agreed [WTS] [JSN]
R5-220070 Correction of Editor Note and reference section numbers in 6.5B.3.4.2_1 CR CAICT 38.521-3 17.3.0 CR#1256 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

agreed [WTS] [JSN]
R5-220260 FR1 NSA IBC - ACLR clean up to leverage MPR test definition CR Keysight Technologies UK Ltd 38.521-3 17.3.0 CR#1260 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

agreed [WTS] [JSN]
R5-220275 Clarifications on 5G NR connectivity options for RF FR1 and FR2 CR CMCC 38.521-3 17.3.0 CR#1261 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

agreed [WTS] [JSN]
R5-220279 Update MOP for inter-band NE-DC within FR1 CR

revised to R5-221695

CMCC 38.521-3 17.3.0 CR#1262 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

revised [WTS] [JSN]
R5-220355 FR2 NSA EVM test case editor notes update CR

revised to R5-221696

Keysight Technologies UK Ltd 38.521-3 17.3.0 CR#1269 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

revised [WTS] [JSN]
R5-220538 Correction on test requirements for TC 6.5B.3.3.2 CR TTA 38.521-3 17.3.0 CR#1282 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

agreed [WTS] [JSN]
R5-220656 Clarification on clause number of NE-DC for Tx test cases CR

revised to R5-221697

CMCC 38.521-3 17.3.0 CR#1287 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

revised [WTS] [JSN]
R5-220754 Updating on 6.5B.3.3.2 Spurious emission for UE co-existence for inter-band within FR1 including n1 CR

revised to R5-221698

NTT DOCOMO INC. 38.521-3 17.3.0 CR#1289 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

revised [WTS] [JSN]
R5-220886 Correction of ON OFF time mask for inter-band EN-DC including FR2 CR

revised to R5-221699

Anritsu 38.521-3 17.3.0 CR#1293 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

revised [WTS] [JSN]
R5-220894 Definition of MTSU and TT for Intra-band EN-DC additional spurious emissions test cases CR

revised to R5-221700

Anritsu, DOCOMO Communications Lab. 38.521-3 17.3.0 CR#1294 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

revised [WTS] [JSN]
R5-220895 Correction to test procedure of FR1 EN-DC Spurious test for EN-DC only capable UE CR

revised to R5-221701

Anritsu 38.521-3 17.3.0 CR#1295 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

revised [WTS] [JSN]
R5-220902 Correction to measurement timing for EN-DC combination with FDD and TDD CR Anritsu 38.521-3 17.3.0 CR#1298 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

agreed [WTS] [JSN]
R5-220967 Update of 6.2B.1.3 Maximum Output Power for Inter-Band EN-DC CR Huawei, HiSilicon 38.521-3 17.3.0 CR#1305 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

agreed [WTS] [JSN]
R5-220968 Update of 6.2B.4.1.3 Configured Output Power for Inter-Band EN-DC CR Huawei, HiSilicon 38.521-3 17.3.0 CR#1306 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

agreed [WTS] [JSN]
R5-221053 Correction of 6.2B.1.1 for intra-band contiguous EN-DC maximum output power CR ZTE Corporation 38.521-3 17.3.0 CR#1314 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

agreed [WTS] [JSN]
R5-221170 Addition of 6.2B.2.3a MPR for inter-band NE-DC within FR1 CR CMCC 38.521-3 17.3.0 CR#1316 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

agreed [WTS] [JSN]
R5-221171 Addition of 6.4B.2.3a.4 EVM Equalizer Flatness for inter-band NE-DC within FR1 CR CMCC 38.521-3 17.3.0 CR#1317 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

agreed [WTS] [JSN]
R5-221172 Addition of 6.2B.4.2.3a TIB,c for Inter-band NE-DC within FR1 CR CMCC 38.521-3 17.3.0 CR#1318 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

agreed [WTS] [JSN]
R5-221315 Editorial correction for 6.5B.3.3 Spurious emission CR

revised to R5-221702

Qualcomm Korea 38.521-3 17.3.0 CR#1324 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

revised [WTS] [JSN]
R5-221317 Update for 6.5B.4.2 Additional Spurious Emissions for Intra-band non-contiguous EN-DC CR Qualcomm Korea 38.521-3 17.3.0 CR#1326 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

agreed [WTS] [JSN]
R5-221325 Editorial Update for 6.2B.4.2.3.1 CR Qualcomm Korea 38.521-3 17.3.0 CR#1328 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

agreed [WTS] [JSN]
R5-221693 Correction of Test applicability of 6.2B.3.3 CR

revision of R5-220065

CAICT 38.521-3 17.3.0 CR#12521 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

agreed [WTS] [JSN]
R5-221694 Correction of 6.5B.2.3.3 to include 6.5.2.4.2 of 38.521-1 CR

revision of R5-220066

CAICT 38.521-3 17.3.0 CR#12531 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

agreed [WTS] [JSN]
R5-221695 Update MOP for inter-band NE-DC within FR1 CR

revision of R5-220279

CMCC 38.521-3 17.3.0 CR#12621 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

agreed [WTS] [JSN]
R5-221696 FR2 NSA EVM test case editor notes update CR

revision of R5-220355

Keysight Technologies UK Ltd 38.521-3 17.3.0 CR#12691 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

agreed [WTS] [JSN]
R5-221697 Clarification on clause number of NE-DC for Tx test cases CR

revision of R5-220656

CMCC 38.521-3 17.3.0 CR#12871 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

agreed [WTS] [JSN]
R5-221698 Updating on 6.5B.3.3.2 Spurious emission for UE co-existence for inter-band within FR1 including n1 CR

revision of R5-220754

NTT DOCOMO INC. 38.521-3 17.3.0 CR#12891 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

agreed [WTS] [JSN]
R5-221699 Correction of ON OFF time mask for inter-band EN-DC including FR2 CR

revision of R5-220886

Anritsu 38.521-3 17.3.0 CR#12931 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

agreed [WTS] [JSN]
R5-221700 Definition of MTSU and TT for Intra-band EN-DC additional spurious emissions test cases CR

revision of R5-220894

Anritsu, DOCOMO Communications Lab. 38.521-3 17.3.0 CR#12941 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

agreed [WTS] [JSN]
R5-221701 Correction to test procedure of FR1 EN-DC Spurious test for EN-DC only capable UE CR

revision of R5-220895

Anritsu 38.521-3 17.3.0 CR#12951 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

agreed [WTS] [JSN]
R5-221702 Editorial correction for 6.5B.3.3 Spurious emission CR

revision of R5-221315

Qualcomm Korea 38.521-3 17.3.0 CR#13241 catF 5GS_NR_LTE-UEConTest Rel-17 R5-94-e

AI: 5.3.1.6.1

agreed [WTS] [JSN]

36 documents (0.33658194541931 seconds)