Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-253813 | Addition of reference sensitivity for new R16 EN-DC combos within FR1 |
CR revised to R5-255278 |
KDDI Corporation | 38.521-3 19.0.0 CR#1966 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-19 |
R5-108 AI: 5.3.1.5.2 |
revised | [WTS] [JSN] |
| R5-254319 | Corrections on UL Fc frequency for R16 EN-DC configurations for MSD test points |
CR revised to R5-255279 |
ZTE Corporation, Tejet, SRTC | 38.521-3 19.0.0 CR#1976 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-19 |
R5-108 AI: 5.3.1.5.2 |
revised | [WTS] [JSN] |
| R5-254320 | Removal of R16 pending configurations for MSD test points for intermodulation interference | CR | ZTE Corporation | 38.521-3 19.0.0 CR#1977 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-19 |
R5-108 AI: 5.3.1.5.2 |
agreed | [WTS] [JSN] |
| R5-254477 | Addition of reference sensitivity for Rel-16 DC_1A-3A_n71A | CR | Huawei, HiSilicon | 38.521-3 19.0.0 CR#1987 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-19 |
R5-108 AI: 5.3.1.5.2 |
agreed | [WTS] [JSN] |
| R5-254754 | Cleanup of Reference sensitivity for 2CC FR1 EN-DC |
CR revised to R5-255396 |
Anritsu, Keysight Technologies UK Ltd, KDDI Corporation, ZTE | 38.521-3 19.0.0 CR#1992 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-19 |
R5-108 AI: 5.3.1.5.2 |
revised | [WTS] [JSN] |
| R5-254756 | Addition of reference sensitivity requirements for Rel-16 FR1 2CC EN-DC |
CR revised to R5-255280 |
Anritsu, Huawei, HiSilicon | 38.521-3 19.0.0 CR#1994 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-19 |
R5-108 AI: 5.3.1.5.2 |
revised | [WTS] [JSN] |
| R5-254760 | Addition of reference sensitivity requirements for Rel-16 FR1 3CC EN-DC | CR | Anritsu, KDDI Corporation | 38.521-3 19.0.0 CR#1998 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-19 |
R5-108 AI: 5.3.1.5.2 |
withdrawn | [WTS] [JSN] |
| R5-255278 | Addition of reference sensitivity for new R16 EN-DC combos within FR1 |
CR revision of R5-253813 |
KDDI Corporation | 38.521-3 19.0.0 CR#19661 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-19 |
R5-108 AI: 5.3.1.5.2 |
agreed | [WTS] [JSN] |
| R5-255279 | Corrections on UL Fc frequency for R16 EN-DC configurations for MSD test points |
CR revision of R5-254319 |
ZTE Corporation, Tejet, SRTC | 38.521-3 19.0.0 CR#19761 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-19 |
R5-108 AI: 5.3.1.5.2 |
agreed | [WTS] [JSN] |
| R5-255280 | Addition of reference sensitivity requirements for Rel-16 FR1 2CC EN-DC |
CR revision of R5-254756 |
Anritsu, Huawei, HiSilicon | 38.521-3 19.0.0 CR#19941 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-19 |
R5-108 AI: 5.3.1.5.2 |
agreed | [WTS] [JSN] |
| R5-255396 | Cleanup of Reference sensitivity for 2CC FR1 EN-DC |
CR revision of R5-254754 |
Anritsu, Keysight Technologies UK Ltd, KDDI Corporation, ZTE | 38.521-3 19.0.0 CR#19921 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-19 |
R5-108 AI: 5.3.1.5.2 |
agreed | [WTS] [JSN] |
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