Please enter the search related information in the fields below. Partial information works, e.g. "SP-21
" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501
" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP
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tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
---|---|---|---|---|---|---|---|---|---|
R5-220061 | Discussion of Additional Information for 6.2.2 and 6.2.3 of 38.521-1 and 6.2B.2.3 and 6.2B.3.3 of 38.521-3 |
discussion revised to R5-221661 |
CAICT | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-94-e AI: 5.3.1.17 |
revised | [WTS] [JSN] | |
R5-220079 | Discussion of adding additional tolerance deltaTIB,c to test requirement of Transmitter power test cases in 38.521-1 | discussion | CAICT | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-94-e AI: 5.3.1.17 |
noted | [WTS] [JSN] | |
R5-220353 | Discussion on MU and TT proposal for FR2 EVM |
discussion revised to R5-221625 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-94-e AI: 5.3.1.17 |
revised | [WTS] [JSN] | |
R5-220780 | Discussion on statistical testing |
discussion revised to R5-221639 |
Huawei, HiSilicon | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-94-e AI: 5.3.1.17 |
revised | [WTS] [JSN] | |
R5-220883 | MU and TT proposal for FR2 EVM |
discussion revised to R5-221626 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-94-e AI: 5.3.1.17 |
revised | [WTS] [JSN] | ||
R5-220884 | Discussion on the dynamic range issue for FR2 ON OFF time mask |
discussion revised to R5-221610 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-94-e AI: 5.3.1.17 |
revised | [WTS] [JSN] | ||
R5-220887 | Introduction of DL MU for FR2 absolute power tolerance |
discussion revised to R5-221627 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-94-e AI: 5.3.1.17 |
revised | [WTS] [JSN] | ||
R5-220889 | Discussion on test procedure for SCell drop issue | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-94-e AI: 5.3.1.17 |
noted | [WTS] [JSN] | ||
R5-221135 | Discussion on Additional RF requirements for NS_03U, NS_05U and NS_43U | discussion | Huawei, Hisilicon | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-94-e AI: 5.3.1.17 |
noted | [WTS] [JSN] | |
R5-221164 | Discussion on fading crest factor |
discussion revised to R5-221628 |
Qualcomm CDMA Technologies | 5GS_NR_LTE-UEConTest |
R5-94-e AI: 5.3.1.17 |
revised | [WTS] [JSN] | ||
R5-221192 | Update on RRM issue #8 | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-94-e AI: 5.3.1.17 |
noted | [WTS] [JSN] | |
R5-221249 | Discussion on acceptable clipping and testable SNR for FR2 demod |
discussion revised to R5-221614 |
Ericsson | 5GS_NR_LTE-UEConTest |
R5-94-e AI: 5.3.1.17 |
revised | [WTS] [JSN] | ||
R5-221250 | Solutions for preventing SCell drop in RAN5 FR2 UL CA test cases | discussion | Ericsson | 5GS_NR_LTE-UEConTest |
R5-94-e AI: 5.3.1.17 |
noted | [WTS] [JSN] | ||
R5-221253 | Discussion on Beam Peak Search procedure in case of intra-band DL CA |
discussion revised to R5-221643 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-94-e AI: 5.3.1.17 |
revised | [WTS] [JSN] | |
R5-221270 | On FR2 ON/OFF Time Mask |
discussion revised to R5-221612 |
ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-94-e AI: 5.3.1.17 |
revised | [WTS] [JSN] | ||
R5-221275 | Beam correspondence Measurement Uncertainties and test tolerances derivation | discussion | Keysight technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-94-e AI: 5.3.1.17 |
noted | [WTS] [JSN] | ||
R5-221284 | FR2 RRM test cases: Known Issue List | discussion | Ericsson | 5GS_NR_LTE-UEConTest |
R5-94-e AI: 5.3.1.17 |
noted | [WTS] [JSN] | ||
R5-221285 | FR2 RRM test cases: Known Issue List - after RAN5_94e | discussion | Ericsson | 5GS_NR_LTE-UEConTest |
R5-94-e AI: 5.3.1.17 |
noted | [WTS] [JSN] | ||
R5-221318 | Discussion on handling ETC for FR2 UE RF test scenarios | discussion | Apple Hungary Kft. | Rel-16 |
R5-94-e AI: 5.3.1.17 |
noted | [WTS] [JSN] | ||
R5-221319 | Discussion on applicability of FR2 single carrier Tx beam peak for UL MIMO Tx test cases | discussion | Qualcomm Finland RFFE Oy | 5GS_NR_LTE-UEConTest |
R5-94-e AI: 5.3.1.17 |
noted | [WTS] [JSN] | ||
R5-221610 | Discussion on the dynamic range issue for FR2 ON OFF time mask |
discussion revision of R5-220884 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-94-e AI: 5.3.1.17 |
noted | [WTS] [JSN] | ||
R5-221612 | On FR2 ON/OFF Time Mask |
discussion revision of R5-221270 |
ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-94-e AI: 5.3.1.17 |
noted | [WTS] [JSN] | ||
R5-221614 | Discussion on acceptable clipping and testable SNR for FR2 demod |
discussion revision of R5-221249 |
Ericsson | 5GS_NR_LTE-UEConTest |
R5-94-e AI: 5.3.1.17 |
noted | [WTS] [JSN] | ||
R5-221625 | Discussion on MU and TT proposal for FR2 EVM |
discussion revision of R5-220353 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-94-e AI: 5.3.1.17 |
noted | [WTS] [JSN] | |
R5-221626 | MU and TT proposal for FR2 EVM |
discussion revision of R5-220883 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-94-e AI: 5.3.1.17 |
noted | [WTS] [JSN] | ||
R5-221627 | Introduction of DL MU for FR2 absolute power tolerance |
discussion revision of R5-220887 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-94-e AI: 5.3.1.17 |
noted | [WTS] [JSN] | ||
R5-221628 | Discussion on fading crest factor |
discussion revision of R5-221164 |
Qualcomm CDMA Technologies | 5GS_NR_LTE-UEConTest |
R5-94-e AI: 5.3.1.17 |
noted | [WTS] [JSN] | ||
R5-221639 | Discussion on statistical testing |
discussion revision of R5-220780 |
Huawei, HiSilicon | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-94-e AI: 5.3.1.17 |
noted | [WTS] [JSN] | |
R5-221643 | Discussion on Beam Peak Search procedure in case of intra-band DL CA |
discussion revision of R5-221253 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-94-e AI: 5.3.1.17 |
noted | [WTS] [JSN] | |
R5-221661 | Discussion of Additional Information for 6.2.2 and 6.2.3 of 38.521-1 and 6.2B.2.3 and 6.2B.3.3 of 38.521-3 |
discussion revision of R5-220061 |
CAICT | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-94-e AI: 5.3.1.17 |
noted | [WTS] [JSN] |
30 documents (0.34912610054016 seconds)