Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-216513 | TP analysis update for FR1 6.2.3 AMPR NS_27 | CR | Keysight Technologies UK Ltd, Ericsson, Apple | 38.905 17.2.0 CR#508 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-93-e AI: 5.3.1.16 |
agreed | [WTS] [JSN] |
| R5-216516 | TP analysis update for IBNC EN-DC 6.2B.2.2_MPR 6.5B.2.2.1_SEM 6.5B.2.2.3_ACLR | CR | Keysight Technologies UK Ltd, Ericsson, Huawei | 38.905 17.2.0 CR#509 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-93-e AI: 5.3.1.16 |
agreed | [WTS] [JSN] |
| R5-217165 | TP analysis for ref sensitivity for DC_66A_n78A | CR | QUALCOMM Europe Inc. - Spain | 38.905 17.2.0 CR#516 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-93-e AI: 5.3.1.16 |
agreed | [WTS] [JSN] |
| R5-217166 | TP analysis for ref sensitivity for DC_66A_n71A | CR | QUALCOMM Europe Inc. - Spain | 38.905 17.2.0 CR#517 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-93-e AI: 5.3.1.16 |
agreed | [WTS] [JSN] |
| R5-217167 | TP analysis for ref sensitivity for DC_2A_n71A |
CR revised to R5-218445 |
QUALCOMM Europe Inc. - Spain | 38.905 17.2.0 CR#518 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-93-e AI: 5.3.1.16 |
revised | [WTS] [JSN] |
| R5-217168 | TP analysis for ref sensitivity for DC_5A_n66A |
CR revised to R5-218446 |
QUALCOMM Europe Inc. - Spain | 38.905 17.2.0 CR#519 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-93-e AI: 5.3.1.16 |
revised | [WTS] [JSN] |
| R5-217190 | Test Point analysis for FR2 Tx spur emission coex CA test case | CR | QUALCOMM Europe Inc. - Spain | 38.905 17.2.0 CR#520 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-93-e AI: 5.3.1.16 |
agreed | [WTS] [JSN] |
| R5-217301 | Addition of reference sensitivity TP analysis for DC_1A-20A_n28A | CR | Huawei, HiSilicon | 38.905 17.2.0 CR#521 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-93-e AI: 5.3.1.16 |
agreed | [WTS] [JSN] |
| R5-217302 | Addition of reference sensitivity TP analysis for DC_3A_n78C | CR | Huawei, HiSilicon | 38.905 17.2.0 CR#522 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-93-e AI: 5.3.1.16 |
agreed | [WTS] [JSN] |
| R5-217303 | Addition of reference sensitivity TP analysis for DC_20A_n28A-n78A | CR | Huawei, HiSilicon | 38.905 17.2.0 CR#523 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-93-e AI: 5.3.1.16 |
agreed | [WTS] [JSN] |
| R5-217306 | Editorial correction to Annex 2.10.3 test point selection EN-DC reference sensitivity | CR | Huawei, HiSilicon | 38.905 17.2.0 CR#524 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-93-e AI: 5.3.1.16 |
agreed | [WTS] [JSN] |
| R5-217307 | Update of TP analysis for general spurious emissions for DC_8A_n78A | CR | Huawei, HiSilicon | 38.905 17.2.0 CR#525 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-93-e AI: 5.3.1.16 |
agreed | [WTS] [JSN] |
| R5-217561 | Update of test point analysis for carrier leakage in FR2 | CR | ROHDE & SCHWARZ | 38.905 17.2.0 CR#526 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-93-e AI: 5.3.1.16 |
agreed | [WTS] [JSN] |
| R5-217626 | Update of TR 38.905 with EN DC A MPR test point analyses, NS_04 |
CR revised to R5-218487 |
Ericsson | 38.905 17.2.0 CR#529 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-93-e AI: 5.3.1.16 |
revised | [WTS] [JSN] |
| R5-217656 | TP analysis update for A-MPR and A-Spurious test cases |
CR revised to R5-218447 |
Ericsson | 38.905 17.2.0 CR#530 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-93-e AI: 5.3.1.16 |
revised | [WTS] [JSN] |
| R5-217693 | Update of test point analysis for relative power tolerance in FR2 |
CR revised to R5-218409 |
ROHDE & SCHWARZ | 38.905 17.2.0 CR#531 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-93-e AI: 5.3.1.16 |
revised | [WTS] [JSN] |
| R5-218200 | TP analysis for ref sensitivity for DC_41A_n77A and DC_41A_n78A | CR | QUALCOMM Europe Inc - Spain | 38.905 17.2.0 CR#532 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-93-e AI: 5.3.1.16 |
agreed | [WTS] [JSN] |
| R5-218409 | Update of test point analysis for relative power tolerance in FR2 |
CR revision of R5-217693 |
ROHDE & SCHWARZ | 38.905 17.2.0 CR#5311 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-93-e AI: 5.3.1.16 |
agreed | [WTS] [JSN] |
| R5-218445 | TP analysis for ref sensitivity for DC_2A_n71A |
CR revision of R5-217167 |
QUALCOMM Europe Inc. - Spain | 38.905 17.2.0 CR#5181 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-93-e AI: 5.3.1.16 |
agreed | [WTS] [JSN] |
| R5-218446 | TP analysis for ref sensitivity for DC_5A_n66A |
CR revision of R5-217168 |
QUALCOMM Europe Inc. - Spain | 38.905 17.2.0 CR#5191 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-93-e AI: 5.3.1.16 |
agreed | [WTS] [JSN] |
| R5-218447 | TP analysis update for A-MPR and A-Spurious test cases |
CR revision of R5-217656 |
Ericsson | 38.905 17.2.0 CR#5301 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-93-e AI: 5.3.1.16 |
agreed | [WTS] [JSN] |
| R5-218487 | Update of TR 38.905 with EN DC A MPR test point analyses, NS_04 |
CR revision of R5-217626 |
Ericsson | 38.905 17.2.0 CR#5291 catF | 5GS_NR_LTE-UEConTest | Rel-17 |
R5-93-e AI: 5.3.1.16 |
agreed | [WTS] [JSN] |
22 documents (0.34065198898315 seconds)