Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-230197 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_8A_n94A_ULSUP-TDM | CR | Nokia, Nokia Shanghai Bell | 38.905 17.7.0 CR#721 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-98 AI: 5.3.1. |
withdrawn | [WTS] [JSN] |
| R5-230198 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_20A_n92A_ULSUP-TDM | CR | Nokia, Nokia Shanghai Bell | 38.905 17.7.0 CR#722 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-98 AI: 5.3.1. |
withdrawn | [WTS] [JSN] |
| R5-230199 | Introduction of reference sensitivity test point analysis for DC_8A_n94A and DC_20A_n92A | CR | Nokia, Nokia Shanghai Bell | 38.905 17.7.0 CR#723 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-98 AI: 5.3.1. |
withdrawn | [WTS] [JSN] |
| R5-230320 | Addition of reference sensitivity test point analysis for new EN-DC comb within FR1 | CR | KDDI Corporation | 38.905 17.7.0 CR#728 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-98 AI: 5.3.1. |
agreed | [WTS] [JSN] |
| R5-230662 | Addition of spurious emissions TP analysis for 1A_n41A and 41A_n28A |
CR revised to R5-231879 |
KDDI Corporation | 38.905 17.7.0 CR#729 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-98 AI: 5.3.1. |
revised | [WTS] [JSN] |
| R5-230896 | Ref sensitivity TP selection for DC_71A_n66A DC_14A_n2A and DC_12A_n2A |
CR revised to R5-231609 |
Qualcomm France | 38.905 17.7.0 CR#738 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-98 AI: 5.3.1. |
revised | [WTS] [JSN] |
| R5-230913 | Adding Spurious emission TP for DC_71A_n66A |
CR revised to R5-231610 |
Qualcomm France | 38.905 17.7.0 CR#742 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-98 AI: 5.3.1. |
revised | [WTS] [JSN] |
| R5-230914 | Adding Spurious emission TP for DC_12A_n2A |
CR revised to R5-231611 |
Qualcomm France | 38.905 17.7.0 CR#743 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-98 AI: 5.3.1. |
revised | [WTS] [JSN] |
| R5-230945 | Addition of reference sensitivity test point analysis for DC_8A_n41A | CR | Huawei, HiSilicon | 38.905 17.7.0 CR#745 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-98 AI: 5.3.1. |
agreed | [WTS] [JSN] |
| R5-230946 | Addition of reference sensitivity test point analysis for DC_12A_n78A | CR | Huawei, HiSilicon | 38.905 17.7.0 CR#746 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-98 AI: 5.3.1. |
agreed | [WTS] [JSN] |
| R5-230947 | Addition of reference sensitivity test point analysis for DC_2A-66A_n5A | CR | Huawei, HiSilicon | 38.905 17.7.0 CR#747 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-98 AI: 5.3.1. |
agreed | [WTS] [JSN] |
| R5-231212 | Update of spurious emission TP analysis for CA_n1A-n8A |
CR revised to R5-231615 |
China Unicom | 38.905 17.7.0 CR#748 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-98 AI: 5.3.1. |
revised | [WTS] [JSN] |
| R5-231225 | Addition of CA_n41A-n71A. |
CR revised to R5-231633 |
Ericsson | 38.905 17.7.0 CR#749 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-98 AI: 5.3.1. |
revised | [WTS] [JSN] |
| R5-231284 | Reference sensitivity TP analysis for DC_66A_n41A |
CR revised to R5-231616 |
ZTE Corporation | 38.905 17.7.0 CR#752 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-98 AI: 5.3.1. |
revised | [WTS] [JSN] |
| R5-231609 | Ref sensitivity TP selection for DC_71A_n66A DC_14A_n2A and DC_12A_n2A |
CR revision of R5-230896 |
Qualcomm France | 38.905 17.7.0 CR#7381 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-98 AI: 5.3.1. |
agreed | [WTS] [JSN] |
| R5-231610 | Adding Spurious emission TP for DC_71A_n66A |
CR revision of R5-230913 |
Qualcomm France | 38.905 17.7.0 CR#7421 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-98 AI: 5.3.1. |
agreed | [WTS] [JSN] |
| R5-231611 | Adding Spurious emission TP for DC_12A_n2A |
CR revision of R5-230914 |
Qualcomm France | 38.905 17.7.0 CR#7431 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-98 AI: 5.3.1. |
agreed | [WTS] [JSN] |
| R5-231615 | Update of spurious emission TP analysis for CA_n1A-n8A |
CR revision of R5-231212 |
China Unicom | 38.905 17.7.0 CR#7481 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-98 AI: 5.3.1. |
agreed | [WTS] [JSN] |
| R5-231616 | Reference sensitivity TP analysis for DC_66A_n41A |
CR revision of R5-231284 |
ZTE Corporation | 38.905 17.7.0 CR#7521 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-98 AI: 5.3.1. |
agreed | [WTS] [JSN] |
| R5-231633 | Addition of CA_n41A-n71A. |
CR revision of R5-231225 |
Ericsson | 38.905 17.7.0 CR#7491 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-98 AI: 5.3.1. |
agreed | [WTS] [JSN] |
| R5-231879 | Addition of spurious emissions TP analysis for 1A_n41A and 41A_n28A |
CR revision of R5-230662 |
KDDI Corporation | 38.905 17.7.0 CR#7291 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-98 AI: 5.3.1. |
agreed | [WTS] [JSN] |
21 documents (0.31998085975647 seconds)