Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-185611 | Discussion on the writing style of TS 38.522 | discussion | CMCC, Bureau Veritas | 5GS_NR_LTE-UEConTest |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | ||
| R5-185641 | Discussion on TRx MU for EN-DC within FR1 | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | ||
| R5-185643 | LTE anchor link power level for TRx OTA tests |
discussion revised to R5-186315 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-33362 AI: 5.1.14 |
revised | [WTS] [JSN] | ||
| R5-185645 | Discussion on the FR2 default downlink level for TRx test |
discussion revised to R5-186328 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-33362 AI: 5.1.14 |
revised | [WTS] [JSN] | ||
| R5-185654 | WF on Measurement Uncertainty and Test Tolerance for FR2 | discussion | NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
withdrawn | [WTS] [JSN] | |
| R5-185656 | Proposal on TS 38.521-3 Annex F structure among EN-DC types | discussion | NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | |
| R5-185657 | Proposal on TT for TS 38.521-3 | discussion | NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | |
| R5-185659 | NR TT Way Forward update |
discussion revised to R5-186341 |
Telecom Italia | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
revised | [WTS] [JSN] | |
| R5-185666 | Test approach of EN-DC TRx tests | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-33362 AI: 5.1.14 |
withdrawn | [WTS] [JSN] | ||
| R5-185667 | Discussion on test configuration considering UE capability |
discussion revised to R5-186203 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-33362 AI: 5.1.14 |
revised | [WTS] [JSN] | ||
| R5-185673 | Discussion on testing Edge allocation in MPR of FR1 | discussion | Huawei, HiSilicon,CAICT | 5GS_NR_LTE-UEConTest |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | ||
| R5-185675 | Discussion on UL-DL configuration and P-max for MOP and General ON/OFF time mask of FR1 | discussion | Huawei, HiSilicon | 5GS_NR_LTE-UEConTest |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | ||
| R5-185803 | Estimation of MU for FR2 TRx test cases (Priority 1 & 2) |
discussion revised to R5-186325 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-33362 AI: 5.1.14 |
revised | [WTS] [JSN] | ||
| R5-185804 | Estimation basis of MU contributions for FR2 TRx test cases |
discussion revised to R5-186326 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-33362 AI: 5.1.14 |
revised | [WTS] [JSN] | ||
| R5-185805 | Testability issue of maximum input level and ACS (case 2) in FR2 (2) | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | ||
| R5-185806 | Testability issue of low PSD test cases in FR2 (2) | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | ||
| R5-185808 | Discussion on connection diagrams for UL MIMO testing | discussion | Huawei, Hisilicon | 5GS_NR_LTE-UEConTest |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | ||
| R5-185809 | Discussion on the effects of SUL on FR1 RF testing | discussion | Huawei, Hisilicon | 5GS_NR_LTE-UEConTest |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | ||
| R5-185844 | Proposal on TT for Occupied Bandwidth |
discussion revised to R5-186335 |
NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
revised | [WTS] [JSN] | |
| R5-185882 | Discussion on test point selection for MPR in FR1 | discussion | CAICT | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | |
| R5-185896 | Discussion on applicability rules and test coverage for 38.521-3 test cases |
discussion revised to R5-186228 |
Qualcomm Finland RFFE Oy | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
revised | [WTS] [JSN] | |
| R5-185897 | Discussion on FR2 Freq Error Test DL Power Setting | discussion | Qualcomm Finland RFFE Oy | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | |
| R5-185898 | Update text on FR2 Tx/Rx beam peak coordinates store and reuse |
discussion revised to R5-186292 |
Qualcomm Finland RFFE Oy | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
revised | [WTS] [JSN] | |
| R5-185903 | Demod spec update and test case phases | discussion | Qualcomm Europe Inc.(Italy) | 5GS_NR_LTE-UEConTest |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | ||
| R5-185916 | Discussion on LTE Anchor for ENDC FR1 tests in TS 38.521-3 |
discussion revised to R5-186227 |
Qualcomm Tech. Netherlands B.V | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
revised | [WTS] [JSN] | |
| R5-185922 | Discussion on system critical requirements | discussion | Ericsson | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | |
| R5-185945 | MU improvement proposal by promoting the white or similar box approach | discussion | Ericsson, Sony | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | |
| R5-185952 | On Frequency Error MU | discussion | Keysight Technologies UK Ltd |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | |||
| R5-185953 | On Quality of Quiet Zone Evaluation for Spurious Emissions Test Cases | discussion | Keysight Technologies UK Ltd |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | |||
| R5-185954 | On the MU Element “Uncertainty of an absolute gain of the calibration antenna” | discussion | Keysight Technologies UK Ltd |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | |||
| R5-185955 | Quality of Quiet Zone Results for IFF and 15cm Quiet Zone | discussion | Keysight Technologies UK Ltd |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | |||
| R5-185956 | Quality of Quiet Zone Results for IFF and 30cm Quiet Zone | discussion | Keysight Technologies UK Ltd |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | |||
| R5-185976 | Discussion on OBW EN-DC intra-band contiguous | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | |
| R5-185981 | Discussion on RRC-CONNECTED state for RF testing | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | |
| R5-185983 | Discussion on MU factor for IFF | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
withdrawn | [WTS] [JSN] | |
| R5-185986 | Assumptions for MU calculation | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | |
| R5-185989 | Consideration of MU study in different frequency ranges |
discussion revised to R5-186247 |
Apple Inc., Intel Corporation, OPPO, vivo, Xiaomi, Huawei | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
revised | [WTS] [JSN] | |
| R5-185990 | Views on the test tolerance framework for FR2 |
discussion revised to R5-186250 |
Apple Inc., Intel Corporation, OPPO, vivo, Xiaomi, Huawei | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
revised | [WTS] [JSN] | |
| R5-185993 | Discussion on SEM EN-DC intra-band contiguous |
discussion revised to R5-186229 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
revised | [WTS] [JSN] | |
| R5-185994 | Discussion on ACLR EN-DC intra-band contiguous |
discussion revised to R5-186231 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
revised | [WTS] [JSN] | |
| R5-185998 | Discussion on simultaneous UL transmission in EN-DC configuration | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | |
| R5-185999 | Characterization of the quality of quiet zone for IFF |
discussion revised to R5-186248 |
ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-ah-33362 AI: 5.1.14 |
revised | [WTS] [JSN] | ||
| R5-186011 | Discussion on Measurement Uncertainty in FR2 |
discussion revised to R5-186249 |
ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-ah-33362 AI: 5.1.14 |
revised | [WTS] [JSN] | ||
| R5-186203 | Discussion on test configuration considering UE capability |
discussion revision of R5-185667 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | ||
| R5-186227 | Discussion on LTE Anchor for ENDC FR1 tests in TS 38.521-3 |
discussion revision of R5-185916 |
Qualcomm Tech. Netherlands B.V | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | |
| R5-186228 | Discussion on applicability rules and test coverage for 38.521-3 test cases |
discussion revision of R5-185896 |
Qualcomm Finland RFFE Oy | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | |
| R5-186229 | Discussion on SEM EN-DC intra-band contiguous |
discussion revision of R5-185993 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | |
| R5-186231 | Discussion on ACLR EN-DC intra-band contiguous |
discussion revision of R5-185994 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | |
| R5-186247 | Consideration of MU study in different frequency ranges |
discussion revision of R5-185989 |
Apple Inc., Intel Corporation, OPPO, vivo, Xiaomi, Huawei | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | |
| R5-186248 | Characterization of the quality of quiet zone for IFF |
discussion revision of R5-185999 |
ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | ||
| R5-186249 | Discussion on Measurement Uncertainty in FR2 |
discussion revision of R5-186011 |
ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | ||
| R5-186250 | Views on the test tolerance framework for FR2 |
discussion revision of R5-185990 |
Apple Inc., Intel Corporation, OPPO, vivo, Xiaomi, Huawei | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | |
| R5-186292 | Update text on FR2 Tx/Rx beam peak coordinates store and reuse |
discussion revision of R5-185898 |
Qualcomm Finland RFFE Oy | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | |
| R5-186315 | LTE anchor link power level for TRx OTA tests |
discussion revision of R5-185643 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | ||
| R5-186325 | Estimation of MU for FR2 TRx test cases (Priority 1 & 2) |
discussion revision of R5-185803 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | ||
| R5-186326 | Estimation basis of MU contributions for FR2 TRx test cases |
discussion revision of R5-185804 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | ||
| R5-186328 | Discussion on the FR2 default downlink level for TRx test |
discussion revision of R5-185645 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | ||
| R5-186335 | Proposal on TT for Occupied Bandwidth |
discussion revision of R5-185844 |
NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] | |
| R5-186341 | NR TT Way Forward update |
discussion revision of R5-185659 |
Telecom Italia | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.14 |
noted | [WTS] [JSN] |
59 documents (0.34029006958008 seconds)