Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-185727 | TP analysis for EN-DC test case 6.2B.2.3 |
CR revised to R5-186294 |
Ericsson | 38.905 15.0.0 CR#1 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.13 |
revised | [WTS] [JSN] |
| R5-185730 | Test point analysis for AMPR Intra-band contiguous EN-DC in FR1 for NS_35 |
CR revised to R5-186235 |
Ericsson LM | 38.905 15.0.0 CR#2 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.13 |
revised | [WTS] [JSN] |
| R5-185862 | TP analysis for test case 6.5.2.4.2 | CR | Ericsson | 38.905 15.0.0 CR#3 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.13 |
agreed | [WTS] [JSN] |
| R5-185881 | Test Point analysis for FR1 MPR test case |
CR revised to R5-186309 |
CAICT | 38.905 15.0.0 CR#4 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.13 |
revised | [WTS] [JSN] |
| R5-185901 | TP analysis for Reference sensitivity for Inter-band EN-DC with FR1 |
CR revised to R5-186310 |
Qualcomm Incorporated | 38.905 15.0.0 CR#5 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.13 |
revised | [WTS] [JSN] |
| R5-185902 | TP analysis for Reference sensitivity for Intra-band Contiguous EN-DC with FR1 |
CR revised to R5-186311 |
Qualcomm Incorporated | 38.905 15.0.0 CR#6 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.13 |
revised | [WTS] [JSN] |
| R5-185985 | TP_analysis for TX spurious emission UE co-existence for intra-band contiguous EN-DC with FR1 |
CR revised to R5-186298 |
Qualcomm Incorporated | 38.905 15.0.0 CR#7 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.13 |
revised | [WTS] [JSN] |
| R5-186002 | Discussion on test point selection for EVM in FR2 |
CR revised to R5-186244 |
ROHDE & SCHWARZ | 38.905 15.0.0 CR#8 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.13 |
revised | [WTS] [JSN] |
| R5-186003 | Discussion on test point selection for Carrier Leakage in FR2 |
CR revised to R5-186245 |
ROHDE & SCHWARZ | 38.905 15.0.0 CR#9 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.13 |
revised | [WTS] [JSN] |
| R5-186004 | Update of test point selection for EVM equalizer spectrum flatness in FR1 | CR | ROHDE & SCHWARZ | 38.905 15.0.0 CR#10 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.13 |
agreed | [WTS] [JSN] |
| R5-186007 | Discussion on test point selection for In-band Emissions in FR2 |
CR revised to R5-186242 |
ROHDE & SCHWARZ | 38.905 15.0.0 CR#11 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.13 |
revised | [WTS] [JSN] |
| R5-186009 | Discussion on test point selection for EVM equalizer spectrum flatness in FR2 |
CR revised to R5-186243 |
ROHDE & SCHWARZ | 38.905 15.0.0 CR#12 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.13 |
revised | [WTS] [JSN] |
| R5-186235 | Test point analysis for AMPR Intra-band contiguous EN-DC in FR1 for NS_35 |
CR revision of R5-185730 |
Ericsson LM | 38.905 15.0.0 CR#21 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.13 |
agreed | [WTS] [JSN] |
| R5-186240 | TP analysis OBW intraband contiguous EN-DC |
CR revised to R5-186253 |
Keysight | 38.905 15.0.0 CR#13 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.13 |
revised | [WTS] [JSN] |
| R5-186241 | TP analysus SEM intraband contiguous EN-DC |
CR revised to R5-186254 |
Keysight | 38.905 15.0.0 CR#14 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.13 |
revised | [WTS] [JSN] |
| R5-186242 | Discussion on test point selection for In-band Emissions in FR2 |
CR revision of R5-186007 |
ROHDE & SCHWARZ | 38.905 15.0.0 CR#111 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.13 |
agreed | [WTS] [JSN] |
| R5-186243 | Discussion on test point selection for EVM equalizer spectrum flatness in FR2 |
CR revision of R5-186009 |
ROHDE & SCHWARZ | 38.905 15.0.0 CR#121 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.13 |
agreed | [WTS] [JSN] |
| R5-186244 | Discussion on test point selection for EVM in FR2 |
CR revision of R5-186002 |
ROHDE & SCHWARZ | 38.905 15.0.0 CR#81 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.13 |
agreed | [WTS] [JSN] |
| R5-186245 | Discussion on test point selection for Carrier Leakage in FR2 |
CR revision of R5-186003 |
ROHDE & SCHWARZ | 38.905 15.0.0 CR#91 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.13 |
agreed | [WTS] [JSN] |
| R5-186253 | TP analysis OBW intraband contiguous EN-DC |
CR revision of R5-186240 |
Keysight | 38.905 15.0.0 CR#131 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.13 |
agreed | [WTS] [JSN] |
| R5-186254 | TP analysus SEM intraband contiguous EN-DC |
CR revision of R5-186241 |
Keysight | 38.905 15.0.0 CR#141 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.13 |
agreed | [WTS] [JSN] |
| R5-186256 | Update test points analysis for multiple FR1 test cases | CR | Huawei, HiSilicon, Keysight, CAICT | 38.905 15.0.0 CR#15 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.13 |
agreed | [WTS] [JSN] |
| R5-186294 | TP analysis for EN-DC test case 6.2B.2.3 |
CR revision of R5-185727 |
Ericsson | 38.905 15.0.0 CR#11 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.13 |
agreed | [WTS] [JSN] |
| R5-186298 | TP_analysis for TX spurious emission UE co-existence for intra-band contiguous EN-DC with FR1 |
CR revision of R5-185985 |
Qualcomm Incorporated | 38.905 15.0.0 CR#71 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.13 |
agreed | [WTS] [JSN] |
| R5-186309 | Test Point analysis for FR1 MPR test case |
CR revision of R5-185881 |
CAICT | 38.905 15.0.0 CR#41 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.13 |
agreed | [WTS] [JSN] |
| R5-186310 | TP analysis for Reference sensitivity for Inter-band EN-DC with FR1 |
CR revision of R5-185901 |
Qualcomm Incorporated | 38.905 15.0.0 CR#51 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.13 |
agreed | [WTS] [JSN] |
| R5-186311 | TP analysis for Reference sensitivity for Intra-band Contiguous EN-DC with FR1 |
CR revision of R5-185902 |
Qualcomm Incorporated | 38.905 15.0.0 CR#61 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-33362 AI: 5.1.13 |
agreed | [WTS] [JSN] |
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