Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".

Download results in JSON format

tdoc Title Type / Revs Source Spec / CR S/WID Release Meeting Status Links
R4-163315 Corrections to 9.6.1.3 and 9.6.1.4 TDD FDD CQI Reporting test CR Anritsu 36.101 12.11.0 CR#3558 catF LTE_CA_B1_B42_B42-Perf Rel-12 R4-79

AI: 4.2.4

agreed [WTS] [JSN]
R4-163345 Corrections to 9.6.1.3 and 9.6.1.4 TDD FDD CQI Reporting test CR Anritsu 36.101 13.3.0 CR#3559 catF LTE_CA_B1_B42_B42-Perf Rel-13 R4-79

AI: 4.2.4

agreed [WTS] [JSN]
R4-163347 Corrections to 9.5.5.1 FDD CoMP RI Test CR ANRITSU LTD 36.101 11.16.0 CR#3561 catF COMP_LTE_DL-Perf Rel-11 R4-79

AI: 4.2.4

withdrawn [WTS] [JSN]
R4-163348 Corrections to 9.5.5.1 FDD CoMP RI Test CR ANRITSU LTD 36.101 12.11.0 CR#3562 catA COMP_LTE_DL-Perf Rel-12 R4-79

AI: 4.2.4

withdrawn [WTS] [JSN]
R4-163349 Corrections to 9.5.5.1 FDD CoMP RI Test CR ANRITSU LTD 36.101 13.3.0 CR#3563 catA COMP_LTE_DL-Perf Rel-13 R4-79

AI: 4.2.4

withdrawn [WTS] [JSN]
R4-163445 Correction of power allocation for PDSCH demodulation requirements with DMRS (Rel-11) CR Huawei, HiSilicon 36.101 13.3.0 CR#3570 catF TEI11 Rel-13 R4-79

AI: 4.2.4

noted [WTS] [JSN]
R4-163446 Discussion for additional tests to verify the new UE behavior on PDSCH collision with PSS/SSS/PBCH for 4Rx discussion Huawei, HiSilicon R4-79

AI: 4.2.4

available [WTS] [JSN]
R4-163447 CR: New test to verify the new UE behavior on PDSCH collision with PSS/SSS/PBCH for 2Rx CR Huawei, HiSilicon 36.101 13.3.0 CR#3571 catF TEI13 Rel-13 R4-79

AI: 4.2.4

noted [WTS] [JSN]
R4-163448 CR: New test to verify the new UE behavior on PDSCH collision with PSS/SSS/PBCH for 4Rx CR Huawei, HiSilicon 36.101 13.3.0 CR#3572 catF TEI13 Rel-13 R4-79

AI: 4.2.4

noted [WTS] [JSN]
R4-164044 CR: Maintenance CR for demodulation performance requirements (Rel-11) CR Huawei, HiSilicon 36.101 11.16.0 CR#3612 catF TEI11 Rel-11 R4-79

AI: 4.2.4

agreed [WTS] [JSN]
R4-164045 CR: Maintenance CR for demodulation performance requirements (Rel-12) CR Huawei, HiSilicon 36.101 12.11.0 CR#3613 catF TEI12 Rel-12 R4-79

AI: 4.2.4

agreed [WTS] [JSN]
R4-164046 CR: Maintenance CR for demodulation performance requirements (Rel-13) CR Huawei, HiSilicon 36.101 13.3.0 CR#3614 catF TEI13 Rel-13 R4-79

AI: 4.2.4

agreed [WTS] [JSN]
R4-164141 Correction to RSTD Test Cases for 1.4 MHz CR Qualcomm Incorporated 36.133 9.22.0 CR#3635 catF LCS_LTE Rel-9 R4-79

AI: 4.2.4

noted [WTS] [JSN]
R4-164239 Editorial correction for TM4 MMSE-IRC PDSCH demodulation test CR

revised to R4-164768

Qualcomm Incorporated 36.101 11.16.0 CR#3621 catD TEI12 Rel-11 R4-79

AI: 4.2.4

revised [WTS] [JSN]
R4-164240 Editorial correction for TM4 MMSE-IRC PDSCH demodulation test CR Qualcomm Inc. 36.101 12.11.0 CR#3622 catA TEI12 Rel-12 R4-79

AI: 4.2.4

agreed [WTS] [JSN]
R4-164241 Editorial correction for TM4 MMSE-IRC PDSCH demodulation test CR Qualcomm Inc. 36.101 13.3.0 CR#3623 catA TEI12 Rel-13 R4-79

AI: 4.2.4

agreed [WTS] [JSN]
R4-164354 CR for fixing power level for TM9 dual layer test in Rel-11 CR Ericsson 36.101 11.16.0 CR#3624 catF TEI11 Rel-11 R4-79

AI: 4.2.4

noted [WTS] [JSN]
R4-164355 CR for fixing power level for TM9 dual layer test in Rel-12 CR Ericsson 36.101 12.11.0 CR#3625 catA TEI11 Rel-12 R4-79

AI: 4.2.4

noted [WTS] [JSN]
R4-164356 CR for fixing power level for TM9 dual layer test in Rel-13 CR Ericsson 36.101 13.3.0 CR#3626 catA TEI11 Rel-13 R4-79

AI: 4.2.4

noted [WTS] [JSN]
R4-164357 CR of editorial change for UE demodulation tests in Rel-9 CR Ericsson 36.101 9.24.0 CR#3627 catD TEI9 Rel-9 R4-79

AI: 4.2.4

noted [WTS] [JSN]
R4-164358 CR of editorial change for UE demodulation tests in Rel-10 CR Ericsson 36.101 10.22.0 CR#3628 catD TEI10 Rel-10 R4-79

AI: 4.2.4

noted [WTS] [JSN]
R4-164359 CR of editorial change for UE demodulation tests in Rel-11 CR Ericsson 36.101 11.16.0 CR#3629 catD TEI11 Rel-11 R4-79

AI: 4.2.4

noted [WTS] [JSN]
R4-164360 CR of editorial change for UE demodulation tests in Rel-12 CR Ericsson 36.101 12.11.0 CR#3630 catD TEI12 Rel-12 R4-79

AI: 4.2.4

noted [WTS] [JSN]
R4-164361 CR of editorial change for UE demodulation tests in Rel-13 CR Ericsson 36.101 13.3.0 CR#3631 catD TEI13 Rel-13 R4-79

AI: 4.2.4

noted [WTS] [JSN]
R4-164768 Editorial correction for TM4 MMSE-IRC PDSCH demodulation test CR

revision of R4-164239

revised to R4-164773

Qualcomm Incorporated 36.101 11.16.0 CR#36211 catD TEI12 Rel-11 R4-79

AI: 4.2.4

revised [WTS] [JSN]
R4-164773 Editorial correction for TM4 MMSE-IRC PDSCH demodulation test CR

revision of R4-164768

Qualcomm Inc. 36.101 11.16.0 CR#36212 catD TEI12 Rel-11 R4-79

AI: 4.2.4

agreed [WTS] [JSN]

26 documents (0.2941300868988 seconds)