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" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501
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tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
---|---|---|---|---|---|---|---|---|---|
R5-192916 | Handling of FR2 UL CA test cases |
discussion revised to R5-193318 |
NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-35450 AI: 4.1.16 |
revised | [WTS] [JSN] | |
R5-192917 | Handling of Low PSD test cases in RAN5 |
discussion revised to R5-193429 |
NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-35450 AI: 4.1.16 |
revised | [WTS] [JSN] | |
R5-192930 | TP Analysis for FR2 Tx Spurious emissions UE band co-existence test case | discussion | Qualcomm Finland RFFE Oy | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-35450 AI: 4.1.16 |
withdrawn | [WTS] [JSN] | |
R5-192982 | On testability of Rx spurious emission test case | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-ah-35450 AI: 4.1.16 |
withdrawn | [WTS] [JSN] | ||
R5-192983 | On the MU contributor gNB uncertainty on absolute level | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | ||
R5-192984 | On the SNR for FR2 TRx test cases | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | ||
R5-192985 | Discussion on testability of ACS and IBB | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | ||
R5-192995 | Discussion on TT of UL-MIMO test cases | discussion | Huawei, Hisilicon | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | |
R5-193057 | FR1 TT for UL-MIMO (transmit power) |
discussion revised to R5-193482 |
NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-35450 AI: 4.1.16 |
revised | [WTS] [JSN] | |
R5-193058 | Review on RAN4 LS about Multi-band relaxation | discussion | NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | |
R5-193060 | Review on RAN4 pending issues after RAN4#90 |
discussion revised to R5-193319 |
NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-35450 AI: 4.1.16 |
revised | [WTS] [JSN] | |
R5-193062 | Test configuration table for EN-DC TRx tests with CCs > 2 |
discussion revised to R5-193472 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-35450 AI: 4.1.16 |
revised | [WTS] [JSN] | ||
R5-193063 | Consideration on MU contributions of Tx/Rx spurious emission | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | ||
R5-193064 | Influence of the XPD for IFF below 23.45 GHz | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | ||
R5-193065 | Influence of the calibration antenna feed cable MU at spurious region | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | ||
R5-193066 | QoQZ MU at spurious region | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-35450 AI: 4.1.16 |
withdrawn | [WTS] [JSN] | ||
R5-193067 | Mismatch MU at spurious region | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | ||
R5-193068 | Network analyzer MU at spurious region | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | ||
R5-193097 | TRP Integration with Offset Feed Antennas for IFF System | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | ||
R5-193098 | On DUT Re-Positioning for TRP measurements of the 2nd harmonic | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | ||
R5-193100 | Technical Analysis of FR2 Test Tolerance values for Spherical Coverage |
discussion revised to R5-193484 |
Apple Inc., Intel, Oppo, Xiaomi, MediaTek Inc., vivo | Rel-15 |
R5-ah-35450 AI: 4.1.16 |
revised | [WTS] [JSN] | ||
R5-193101 | On measurement grid and its MU for FR2 spurious emissions | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | ||
R5-193104 | SNR estimation update for FR2 priority 1 and 2 TRx TCs | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | ||
R5-193105 | On the impact from noise for EIRP spherical coverage | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-35450 AI: 4.1.16 |
not treated | [WTS] [JSN] | ||
R5-193106 | On the noise impact to FR2 OBW | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-35450 AI: 4.1.16 |
not treated | [WTS] [JSN] | ||
R5-193108 | On the FR2 ACLR MU | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-35450 AI: 4.1.16 |
withdrawn | [WTS] [JSN] | ||
R5-193109 | On the treatment of FR2 MU depending on UL power level | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-35450 AI: 4.1.16 |
withdrawn | [WTS] [JSN] | ||
R5-193131 | Discussion on minimum test time for PDSCH and PDCCH with more simulation results | discussion | Qualcomm Korea | 5GS_NR_LTE-UEConTest |
R5-ah-35450 AI: 4.1.16 |
withdrawn | [WTS] [JSN] | ||
R5-193132 | Discussion on FR1 SDR test case structure |
discussion revised to R5-193486 |
Qualcomm Korea | 5GS_NR_LTE-UEConTest |
R5-ah-35450 AI: 4.1.16 |
revised | [WTS] [JSN] | ||
R5-193148 | Discussion on TPs for Asymmetric CH BWs in Reference Sensitivity Requirements in FR1 | discussion | Dish Network | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | |
R5-193167 | OTA TX spurious emission at FR2 – DUT repositioning | discussion | MVG Industries, Sony | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | |
R5-193184 | On ACLR measurement uncertainty | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-35450 AI: 4.1.16 |
withdrawn | [WTS] [JSN] | ||
R5-193185 | On gNB uncertainty on absolute level MU | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | ||
R5-193186 | On Refsens MU | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | ||
R5-193187 | On noise impact | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | ||
R5-193227 | On MU for FR1 UL CA | discussion | Anritsu |
R5-ah-35450 AI: 4.1.16 |
withdrawn | [WTS] [JSN] | |||
R5-193228 | Test points for Wideband Intermodulation for EN-DC including FR1 (3 CCs) |
discussion revised to R5-193473 |
Anritsu |
R5-ah-35450 AI: 4.1.16 |
revised | [WTS] [JSN] | |||
R5-193235 | Discussion on VNA uncertainty for spurious emission test | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-ah-35450 AI: 4.1.16 |
withdrawn | [WTS] [JSN] | ||
R5-193236 | On mismatch uncertainty for ACLR | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-ah-35450 AI: 4.1.16 |
not treated | [WTS] [JSN] | ||
R5-193262 | Discussion on TT and the impact on UE fail rate for EIRP CDF |
discussion revised to R5-193483 |
Ericsson, Telecom Italia, Orange | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-35450 AI: 4.1.16 |
revised | [WTS] [JSN] | |
R5-193318 | Handling of FR2 UL CA test cases |
discussion revision of R5-192916 |
NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | |
R5-193319 | Review on RAN4 pending issues after RAN4#90 |
discussion revision of R5-193060 |
NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | |
R5-193383 | WF on Low PSD issue | discussion | NTT DOCOMO |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | |||
R5-193384 | WF on MB relaxation | discussion | NTT DOCOMO |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | |||
R5-193385 | LS on RAN4-RAN5 5G-NR RF pending issues after RAN5#5-5G-NR Adhoc |
LS out LS is reply to R4-1902713 LS To: TSG WG RAN4 |
TSG WG RAN5 | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-35450 AI: 4.1.16 |
approved | [WTS] [JSN] | |
R5-193429 | Handling of Low PSD test cases in RAN5 |
discussion revision of R5-192917 |
NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | |
R5-193448 | Noc level for FR1 Demodulation tests | discussion | Qualcomm Incorporated | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | |
R5-193472 | Test configuration table for EN-DC TRx tests with CCs > 2 |
discussion revision of R5-193062 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | ||
R5-193473 | Test points for Wideband Intermodulation for EN-DC including FR1 (3 CCs) |
discussion revision of R5-193228 |
Anritsu |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | |||
R5-193482 | FR1 TT for UL-MIMO (transmit power) |
discussion revision of R5-193057 |
NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | |
R5-193483 | Discussion on TT and the impact on UE fail rate for EIRP CDF |
discussion revision of R5-193262 |
Ericsson, Telecom Italia, Orange | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | |
R5-193484 | Technical Analysis of FR2 Test Tolerance values for Spherical Coverage |
discussion revision of R5-193100 |
Apple Inc., Intel, Oppo, Xiaomi, MediaTek Inc., vivo | Rel-15 |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] | ||
R5-193486 | Discussion on FR1 SDR test case structure |
discussion revision of R5-193132 |
Qualcomm Korea | 5GS_NR_LTE-UEConTest |
R5-ah-35450 AI: 4.1.16 |
noted | [WTS] [JSN] |
53 documents (0.30939102172852 seconds)