Please enter the search related information in the fields below. Partial information works, e.g. "SP-21
" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501
" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP
" gives the same results as "3gpp
".
Download results in JSON format
tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
---|---|---|---|---|---|---|---|---|---|
R4-2014267 | Impact on beam management due to spherical wavefront in DL | other | Qualcomm Incorporated |
R4-97-e AI: 13.1.1 |
noted | [WTS] [JSN] | |||
R4-2014919 | TP to TR38.884 on High DL and Low UL power test cases |
other revised to R4-2017598 |
Apple Inc. | FS_FR2_enhTestMethods | Rel-17 |
R4-97-e AI: 13.1.1 |
revised | [WTS] [JSN] | |
R4-2015319 | Test methodology for high DL power and low UL power test cases | discussion | CAICT | FS_FR2_enhTestMethods | Rel-17 |
R4-97-e AI: 13.1.1 |
noted | [WTS] [JSN] | |
R4-2016213 | On Test methodology for high DL power and low UL power test cases | other | Keysight Technologies UK Ltd | FS_FR2_enhTestMethods |
R4-97-e AI: 13.1.1 |
noted | [WTS] [JSN] | ||
R4-2016377 | Impact of phase variation | other | MVG Industries, Sony | FS_FR2_enhTestMethods | Rel-17 |
R4-97-e AI: 13.1.1 |
noted | [WTS] [JSN] | |
R4-2016562 | Views on test methods for high DL power and low UL power TCs | discussion | ROHDE & SCHWARZ | FS_FR2_enhTestMethods | Rel-17 |
R4-97-e AI: 13.1.1 |
noted | [WTS] [JSN] | |
R4-2017598 | TP to TR38.884 on High DL and Low UL power test cases |
other revision of R4-2014919 |
Apple Inc., Keysight Technologies, Rohde & Schwarz, MVG Industries | FS_FR2_enhTestMethods | Rel-17 |
R4-97-e AI: 13.1.1 |
approved | [WTS] [JSN] |
7 documents (0.33040690422058 seconds)