Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
Download results in JSON format
| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R4-2009960 | Remaining issues with the test methodology for high DL power and low UL power test cases | discussion | Apple Inc. | FS_FR2_enhTestMethods | Rel-17 |
R4-96-e AI: 13.1.1 |
noted | [WTS] [JSN] | |
| R4-2010856 | Summary and Further Results on Impact of phase variation on beam pattern for NF test method | other | MVG Industries, Sony | FS_FR2_enhTestMethods | Rel-17 |
R4-96-e AI: 13.1.1 |
noted | [WTS] [JSN] | |
| R4-2011218 | On Test methodology for high DL power and low UL power test cases | other | Keysight Technologies UK Ltd |
R4-96-e AI: 13.1.1 |
noted | [WTS] [JSN] | |||
| R4-2011281 | Views on test methods for high DL power and low UL power TCs | discussion | ROHDE & SCHWARZ | FS_FR2_enhTestMethods | Rel-17 |
R4-96-e AI: 13.1.1 |
noted | [WTS] [JSN] | |
| R4-2011456 | FR2 testability enhancement for UE emissions | other | Qualcomm Incorporated | FS_FR2_enhTestMethods | Rel-16 |
R4-96-e AI: 13.1.1 |
noted | [WTS] [JSN] |
5 documents (0.33802103996277 seconds)