Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
Download results in JSON format
| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R4-2100525 | TP to TR38.884 on High DL and Low UL power test cases | other | Apple Inc. | FS_FR2_enhTestMethods | Rel-17 |
R4-98-e AI: 12.1.2 |
merged | [WTS] [JSN] | |
| R4-2100526 | TP to TR38.884 on polarization mismatch | other | Apple Inc. | FS_FR2_enhTestMethods | Rel-17 |
R4-98-e AI: 12.1.2 |
merged | [WTS] [JSN] | |
| R4-2100571 | Views on solutions to minimize the impact of polarization basis mismatch | other | Sony, Ericsson |
R4-98-e AI: 12.1.2 |
noted | [WTS] [JSN] | |||
| R4-2100664 | Discussion on enhanced test method for polarization basis mismatch | discussion | LG Electronics Inc. |
R4-98-e AI: 12.1.2 |
noted | [WTS] [JSN] | |||
| R4-2100699 | Practical TPMI and 2-port CSI-RS for FR2 SISO test enhancement | discussion | MediaTek Beijing Inc. |
R4-98-e AI: 12.1.2 |
noted | [WTS] [JSN] | |||
| R4-2100894 | Discussion on FR2 EIRP measurement enhancement | discussion | Samsung | FS_FR2_enhTestMethods | Rel-17 |
R4-98-e AI: 12.1.2 |
noted | [WTS] [JSN] | |
| R4-2101485 | Overview of the Impact of phase variation for Direct NF Method | other | MVG Industries, Sony | FS_FR2_enhTestMethods | Rel-17 |
R4-98-e AI: 12.1.2 |
noted | [WTS] [JSN] | |
| R4-2101759 | Solution to minimize the impact of polarization basis mismatch | discussion | OPPO | FS_FR2_enhTestMethods |
R4-98-e AI: 12.1.2 |
noted | [WTS] [JSN] | ||
| R4-2101830 | TP to TR38.884 v0.1.0 on polarization basis mismatch |
pCR revised to R4-2103967 |
vivo | 38.884 0.1.0 | FS_FR2_enhTestMethods | Rel-17 |
R4-98-e AI: 12.1.2 |
revised | [WTS] [JSN] |
| R4-2102090 | Discussion on FR2 UL demodulation measurements | discussion | Rohde & Schwarz |
R4-98-e AI: 12.1.2 |
noted | [WTS] [JSN] | |||
| R4-2102616 | On Test methodology for high DL power and low UL power test cases | other | Keysight Technologies UK Ltd | FS_FR2_enhTestMethods |
R4-98-e AI: 12.1.2 |
noted | [WTS] [JSN] | ||
| R4-2102620 | NF based solutions and Enhancement of permitted methods | discussion | ROHDE & SCHWARZ | FS_FR2_enhTestMethods | Rel-17 |
R4-98-e AI: 12.1.2 |
noted | [WTS] [JSN] | |
| R4-2102674 | FR2 testability enhancement for polarization mismatch | other | Qualcomm Incorporated | FS_FR2_enhTestMethods |
R4-98-e AI: 12.1.2 |
noted | [WTS] [JSN] | ||
| R4-2103966 | TP to TR38.884 on High DL and Low UL power test cases | other | Keysight, Rohde & Schwarz |
R4-98-e AI: 12.1.2 |
approved | [WTS] [JSN] | |||
| R4-2103967 | TP to TR38.884 v0.1.0 on polarization basis mismatch |
pCR revision of R4-2101830 |
vivo | 38.884 0.1.0 | FS_FR2_enhTestMethods | Rel-17 |
R4-98-e AI: 12.1.2 |
approved | [WTS] [JSN] |
15 documents (0.3483669757843 seconds)