[{"name":"RP-253815","title":"Status report for WI Perf. part: Enh. requirements and conductive test methodology for NR NTN and IoT NTN","source":"Samsung","contact":"Joern Krause","contact-id":12578,"tdoctype":"WI status report","for":"","abstract":"","secretary_remarks":"FLAG S","agenda_item_sort_order":99,"ainumber":"9.5.4.7","ainame":"Perf. part: Enh. requirements and conductive test methodology for NR NTN and IoT NTN [RAN4 WI: NR_IoT_NTN_req_test_enh-Perf]","tdoc_agenda_sort_order":1001,"status":"noted","reservation_date":"2025-12-10 14:49:13","uploaded":"2025-12-10 14:49:13","revisionof":"RP-253313","revisedto":"","release":"Rel-19","crspec":"","crspecversion":"","workitem":[{"winame":"NR_IoT_NTN_req_test_enh-Perf"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/tsg_ran\/TSG_RAN\/TSGR_110\/Docs\/RP-253815.zip","group":"RP","meeting":"RP-110","year":2025,"uicc_affected":"","me_affected":"","ran_affected":"","cn_affected":"","clauses_affected":"","crsinpack":null,"crsinpacknumber":0}]