[{"name":"RP-171455","title":"Draft Response LS to IEEE_802_LMSC_LS170322 = RP-170877 related to PD and ED issues (to: IEEE 802 LMSC; cc: RAN1, RAN4; contact: Qualcomm)","source":"Qualcomm Incorporated","contact":"Joern Krause","contact-id":12578,"tdoctype":"LS out","for":"Approval","abstract":"","secretary_remarks":"","agenda_item_sort_order":47,"ainumber":"10.2.1","ainame":"Study on multi-node testing for LAA [FS_LTE_LAA_multinode_test]","tdoc_agenda_sort_order":8931,"status":"revised","reservation_date":"2017-06-08 13:00:37","uploaded":"2017-06-08 13:00:37","revisionof":"RP-171029","revisedto":"RP-171482","release":"Rel-13","crspec":"","crspecversion":"","workitem":[{"winame":"FS_LTE_LAA_multinode_test"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"IEEE_802_LMSC_LS170322 = RP-170877","lsto":"IEEE 802 LMSC","Cc":"RAN1, RAN4","lsoriginalls":"IEEE LS to 3GPP RANRAN1RAN4 related to PD and ED issues","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/TSG_RAN\/TSGR_76\/Docs\/RP-171455.zip","group":"RP","meeting":"RP-76","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]