[{"name":"R5-190614","title":"WF of test tolerances and measurement uncertainty for User Equipment (UE) conformance test","source":"Verizon, Qualcomm","contact":"Ingbert Sigovich","contact-id":28887,"tdoctype":"discussion","for":"Endorsement","abstract":"RAN5 has discussed the MU threshold for EIRP and TRP measurements for UE maximum output power. However, there is still no consensus. In this paper, we provide our input toward reaching consensus on the mmWave test setups.\n2. Proposal for MU threshold\nFo","secretary_remarks":"","agenda_item_sort_order":85,"ainumber":"7.1","ainame":"\tRF group docs still requiring verdict\/confirmation - original A.I. retained","tdoc_agenda_sort_order":61400,"status":"revised","reservation_date":"2019-01-29 08:02:08","uploaded":"2019-01-29 14:18:13","revisionof":"","revisedto":"R5-190793","release":"","crspec":"","crspecversion":"","workitem":"","crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_AHs\/2019-01-21_5G-NR_Adhoc_4\/Docs\/R5-190614.zip","group":"R5","meeting":"R5-ah-18806","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]