[{"name":"R5-180007","title":"Discussion about mmW Test Tolerance for NR TRx TCs","source":"NTT DOCOMO, INC.","contact":"Takahiro Arai","contact-id":65225,"tdoctype":"discussion","for":"Endorsement","abstract":"In the last RAN5#77 meeting, discussion about Test Tolerance (TT) was kicked-off and how to define Sub-6GHz TT was endorsed. Additionally, in the last RAN4#85 meeting, Measurement Uncertainty (MU) for EIRP and TRP (D = 5 cm) were agreed. This document int","secretary_remarks":"","agenda_item_sort_order":15,"ainumber":"4.1.7","ainame":"General Papers \/ Work Plan \/ TC lists","tdoc_agenda_sort_order":70,"status":"revised","reservation_date":"2018-01-05 15:07:52","uploaded":"2018-01-09 06:48:46","revisionof":"","revisedto":"R5-180083","release":"Rel-15","crspec":"","crspecversion":"","workitem":[{"winame":"5GS_NR_LTE-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_AHs\/2018-01-16_5G-NR_Adhoc_1\/Docs\/R5-180007.zip","group":"R5","meeting":"R5-ah-33216","year":2018,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]