[{"name":"R5-167054","title":"Introduction of UE test functions for CIoT CP\/SMS data","source":"Ericsson","contact":"Leif Mattisson","contact-id":10602,"tdoctype":"draftCR","for":"Agreement","abstract":"AI 3.2, 5.2.2\nAt RAN5#72 22-26 August in Gothenburg the need for introduction of a test loop function for the control plane was endorsed in R5-165903. This CR propose the details for a new UE Test loop mode G enabling UL and DL of control plane data base","secretary_remarks":"","agenda_item_sort_order":50,"ainumber":"5.2.2","ainame":"\tTS 36.509","tdoc_agenda_sort_order":70540,"status":"revised","reservation_date":"2016-09-30 01:47:57","uploaded":"2016-10-03 15:53:56","revisionof":"","revisedto":"R5-167225","release":"Rel-13","crspec":"36.509","crspecversion":"13.1.0","workitem":[{"winame":"NB_IOT-UEConTest"}],"crnumber":"","crrevision":"","crcategory":"F","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG5_Test_ex-T1\/TSGR5_AHs\/2016-10-10_IoT_Adhoc_2\/Docs\/R5-167054.zip","group":"R5","meeting":"R5-ah-32163","year":2016,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]