[{"name":"R4-2110511","title":"Draft CR: Introduction of conducted conformance testing for PUSCH with interlace in TS 38.141-1","source":"Huawei, HiSilicon","contact":"Tricia Li","contact-id":56874,"tdoctype":"draftCR","for":"Endorsement","abstract":"","secretary_remarks":"[99-e][322] NR_unlic_Demod_BS","agenda_item_sort_order":231,"ainumber":"6.1.7.4.2","ainame":"PUSCH requirements","tdoc_agenda_sort_order":0,"status":"revised","reservation_date":"2021-05-11 12:26:08","uploaded":"2021-05-11 16:19:36","revisionof":"","revisedto":"","release":"Rel-16","crspec":"38.141-1","crspecversion":"16.7.0","workitem":[{"winame":"NR_unlic-Perf"}],"crnumber":"","crrevision":"","crcategory":"B","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_99-e\/Docs\/R4-2110511.zip","group":"R4","meeting":"R4-99-e","year":2021,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]