[{"name":"R4-1911502","title":"Views on the high DL power and low UL power objective","source":"Apple Inc.","contact":"Anatoliy Ioffe","contact-id":76818,"tdoctype":"discussion","for":"Discussion","abstract":"","secretary_remarks":"","agenda_item_sort_order":705,"ainumber":"10.5.1","ainame":"Test methodology for high DL power and low UL power test cases [FS_FR2_enhTestMethods]","tdoc_agenda_sort_order":150200,"status":"noted","reservation_date":"2019-10-04 06:49:56","uploaded":"2019-10-04 23:53:20","revisionof":"","revisedto":"","release":"Rel-17","crspec":"","crspecversion":"","workitem":[{"winame":"FS_FR2_enhTestMethods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"https:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_92Bis\/Docs\/R4-1911502.zip","group":"R4","meeting":"R4-92","year":2019,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]