[{"name":"R4-1709326","title":"Measurement Uncertainty values of EIRP\/EIS for mmWave","source":"Anritsu Corporation","contact":"Osamu Yamashita","contact-id":66204,"tdoctype":"discussion","for":"Agreement","abstract":"In this paper we update MU values of EIRP\/EIS for mmWave with comparison of using VNA and SG at the calibration stage.","secretary_remarks":"","agenda_item_sort_order":150,"ainumber":"3.6.2.2","ainame":"Measurement uncertainty and test tolerance [FS_NR_test_methods]","tdoc_agenda_sort_order":97540,"status":"noted","reservation_date":"2017-09-08 09:38:42","uploaded":"2017-09-11 16:37:22","revisionof":"","revisedto":"","release":"","crspec":"","crspecversion":"","workitem":[{"winame":"FS_NR_test_methods"}],"crnumber":"","crrevision":"","crcategory":"","tsg_crp":"","lsreplyto":"","lsto":"","Cc":"","lsoriginalls":"","lsreply":"","link":"http:\/\/www.3gpp.org\/ftp\/TSG_RAN\/WG4_Radio\/TSGR4_AHs\/TSGR4_NR_Sep2017\/Docs\/R4-1709326.zip","group":"R4","meeting":"R4-ah-19871","year":2017,"uicc_affected":null,"me_affected":null,"ran_affected":null,"cn_affected":null,"clauses_affected":null,"crsinpack":null,"crsinpacknumber":0}]